{"id":"https://openalex.org/W2787779756","doi":"https://doi.org/10.1109/jssc.2017.2784762","title":"A 69-dB SNDR 300-MS/s Two-Time Interleaved Pipelined SAR ADC in 16-nm CMOS FinFET With Capacitive Reference Stabilization","display_name":"A 69-dB SNDR 300-MS/s Two-Time Interleaved Pipelined SAR ADC in 16-nm CMOS FinFET With Capacitive Reference Stabilization","publication_year":2018,"publication_date":"2018-02-05","ids":{"openalex":"https://openalex.org/W2787779756","doi":"https://doi.org/10.1109/jssc.2017.2784762","mag":"2787779756"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2017.2784762","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2784762","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013611541","display_name":"Ewout Martens","orcid":"https://orcid.org/0000-0001-5485-1837"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Ewout Martens","raw_affiliation_strings":["Interuniversity Microelectronics Center, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Interuniversity Microelectronics Center, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067914792","display_name":"Benjamin Hershberg","orcid":"https://orcid.org/0000-0003-3688-2589"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Benjamin Hershberg","raw_affiliation_strings":["Interuniversity Microelectronics Center, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Interuniversity Microelectronics Center, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042750271","display_name":"Jan Craninckx","orcid":"https://orcid.org/0000-0002-3980-0203"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jan Craninckx","raw_affiliation_strings":["Interuniversity Microelectronics Center, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Interuniversity Microelectronics Center, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013611541"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":3.0508,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.91530472,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"53","issue":"4","first_page":"1161","last_page":"1171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.7397304177284241},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6899192333221436},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6076797246932983},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5913925766944885},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.5777154564857483},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.564633309841156},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.5560205578804016},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.5411149859428406},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4923771619796753},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.47060948610305786},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4683472514152527},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.4629787802696228},{"id":"https://openalex.org/keywords/shaping","display_name":"Shaping","score":0.4518364369869232},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3958357572555542},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35148757696151733},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2321239709854126},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22615814208984375},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.08240431547164917}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.7397304177284241},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6899192333221436},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6076797246932983},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5913925766944885},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.5777154564857483},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.564633309841156},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.5560205578804016},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.5411149859428406},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4923771619796753},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.47060948610305786},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4683472514152527},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.4629787802696228},{"id":"https://openalex.org/C142311740","wikidata":"https://www.wikidata.org/wiki/Q1066177","display_name":"Shaping","level":2,"score":0.4518364369869232},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3958357572555542},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35148757696151733},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2321239709854126},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22615814208984375},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.08240431547164917},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2017.2784762","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2784762","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1491617848","https://openalex.org/W1753784006","https://openalex.org/W1976807891","https://openalex.org/W2007564081","https://openalex.org/W2017580123","https://openalex.org/W2062972648","https://openalex.org/W2085251051","https://openalex.org/W2089663857","https://openalex.org/W2099432139","https://openalex.org/W2101004723","https://openalex.org/W2102696094","https://openalex.org/W2110880033","https://openalex.org/W2124838096","https://openalex.org/W2131585911","https://openalex.org/W2132406028","https://openalex.org/W2136908302","https://openalex.org/W2150090234","https://openalex.org/W2156679998","https://openalex.org/W2157973566","https://openalex.org/W2161982945","https://openalex.org/W2172010302","https://openalex.org/W2323444784","https://openalex.org/W2464663646","https://openalex.org/W2525429079","https://openalex.org/W2537504266","https://openalex.org/W2558984782","https://openalex.org/W2565240407","https://openalex.org/W2586339360","https://openalex.org/W2586959980","https://openalex.org/W2592081355","https://openalex.org/W2594167987","https://openalex.org/W2742466455","https://openalex.org/W2743796603","https://openalex.org/W2747166650","https://openalex.org/W2904824693","https://openalex.org/W4285719527","https://openalex.org/W6675798467","https://openalex.org/W6676599623","https://openalex.org/W6679454727","https://openalex.org/W6683103085","https://openalex.org/W6733334685","https://openalex.org/W6734196069","https://openalex.org/W6734567846","https://openalex.org/W6742418000","https://openalex.org/W7030223504"],"related_works":["https://openalex.org/W2896514336","https://openalex.org/W3216962587","https://openalex.org/W2003734039","https://openalex.org/W4292071990","https://openalex.org/W2548554782","https://openalex.org/W340251908","https://openalex.org/W2905521207","https://openalex.org/W1997284295","https://openalex.org/W2942784010","https://openalex.org/W2984632578"],"abstract_inverted_index":{"A":[0],"two-time":[1],"interleaved":[2],"pipelined":[3],"SAR":[4],"ADC":[5],"in":[6,81],"16-nm":[7],"CMOS":[8],"achieving":[9],"11.2-bit":[10],"ENOB":[11],"at":[12],"300":[13],"MS/s":[14],"is":[15,76],"presented.":[16],"To":[17],"cancel":[18],"the":[19,24,38,47,53,56,65],"signal-dependent":[20],"voltage":[21],"ripple":[22],"on":[23,37],"reference":[25,48,57],"node":[26],"due":[27],"to":[28,67],"DAC":[29],"switching,":[30],"it":[31],"employs":[32],"a":[33],"stabilization":[34],"scheme":[35],"based":[36],"use":[39],"of":[40,84],"auxiliary":[41],"DACs.":[42],"The":[43,62],"charge":[44],"drawn":[45],"from":[46],"becomes":[49],"signal-independent,":[50],"greatly":[51],"reducing":[52],"requirements":[54],"for":[55],"decoupling":[58],"capacitance":[59],"and/or":[60],"buffers.":[61],"technique":[63],"improves":[64],"linearity":[66],"levels":[68],"better":[69],"than":[70],"76-dB":[71],"harmonic":[72],"distortion.":[73],"Power":[74],"consumption":[75],"only":[77],"3.6":[78],"mW":[79],"resulting":[80],"peak":[82],"FoMs":[83],"175.5":[85],"dB":[86],"and":[87],"5.1":[88],"fJ/conv.step.":[89]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}