{"id":"https://openalex.org/W2769693554","doi":"https://doi.org/10.1109/jssc.2017.2767183","title":"Switched-Mode-Control Based Hybrid LDO for Fine-Grain Power Management of Digital Load Circuits","display_name":"Switched-Mode-Control Based Hybrid LDO for Fine-Grain Power Management of Digital Load Circuits","publication_year":2017,"publication_date":"2017-11-23","ids":{"openalex":"https://openalex.org/W2769693554","doi":"https://doi.org/10.1109/jssc.2017.2767183","mag":"2769693554"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2017.2767183","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2767183","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071566785","display_name":"Saad Bin Nasir","orcid":"https://orcid.org/0000-0003-1488-0021"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Saad Bin Nasir","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","<org_name>School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA</org_name>"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"<org_name>School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA</org_name>","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056832262","display_name":"Shreyas Sen","orcid":"https://orcid.org/0000-0001-5566-8946"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shreyas Sen","raw_affiliation_strings":["Purdue University, West Lafayette, IN, USA","Purdue Univ., West Lafayette, IN (USA)"],"affiliations":[{"raw_affiliation_string":"Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Purdue Univ., West Lafayette, IN (USA)","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091408102","display_name":"Arijit Raychowdhury","orcid":"https://orcid.org/0000-0001-8391-0576"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arijit Raychowdhury","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","<org_name>School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA</org_name>"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"<org_name>School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA</org_name>","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5071566785"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":3.4414,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.92987488,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"53","issue":"2","first_page":"569","last_page":"581"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.8783912062644958},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.593252420425415},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.516116738319397},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5095884799957275},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5038511157035828},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5018477439880371},{"id":"https://openalex.org/keywords/digital-control","display_name":"Digital control","score":0.49217358231544495},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4797312319278717},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4627670347690582},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.43287983536720276},{"id":"https://openalex.org/keywords/load-regulation","display_name":"Load regulation","score":0.42651474475860596},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4173769950866699},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4097744822502136},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.4030373990535736},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29547423124313354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2406337857246399},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.1523275375366211},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.078937828540802}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.8783912062644958},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.593252420425415},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.516116738319397},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5095884799957275},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5038511157035828},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5018477439880371},{"id":"https://openalex.org/C158411068","wikidata":"https://www.wikidata.org/wiki/Q2720568","display_name":"Digital control","level":2,"score":0.49217358231544495},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4797312319278717},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4627670347690582},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.43287983536720276},{"id":"https://openalex.org/C2776098794","wikidata":"https://www.wikidata.org/wiki/Q6663315","display_name":"Load regulation","level":3,"score":0.42651474475860596},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4173769950866699},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4097744822502136},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.4030373990535736},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29547423124313354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2406337857246399},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.1523275375366211},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.078937828540802},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2017.2767183","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2767183","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[{"id":"https://openalex.org/G4256479832","display_name":null,"funder_award_id":"1836.140","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"},{"id":"https://openalex.org/F4320308258","display_name":"Qualcomm","ror":"https://ror.org/002zrf773"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1593782789","https://openalex.org/W1976341316","https://openalex.org/W2015674476","https://openalex.org/W2053255221","https://openalex.org/W2054989520","https://openalex.org/W2057390572","https://openalex.org/W2073874574","https://openalex.org/W2086284897","https://openalex.org/W2117965437","https://openalex.org/W2134327452","https://openalex.org/W2146547052","https://openalex.org/W2291648313","https://openalex.org/W2294756903","https://openalex.org/W2344336685","https://openalex.org/W2537403501","https://openalex.org/W2573055209","https://openalex.org/W2591632264","https://openalex.org/W2591643806","https://openalex.org/W2591678100","https://openalex.org/W2593766759","https://openalex.org/W6667739745","https://openalex.org/W6734468446"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W4282007662","https://openalex.org/W2737475872","https://openalex.org/W4366165321","https://openalex.org/W1849967185","https://openalex.org/W3081147268","https://openalex.org/W3022411814","https://openalex.org/W2024816799","https://openalex.org/W2086789270","https://openalex.org/W1946066592"],"abstract_inverted_index":{"Switched-mode-control":[0],"(SMC)":[1],"is":[2,28],"a":[3,62,83],"control":[4,67],"methodology":[5],"that":[6],"allows":[7],"instantaneous":[8],"switching":[9,60],"between":[10,55,61],"controllers":[11],"to":[12],"extend":[13],"the":[14,71],"dynamic":[15],"range":[16],"of":[17,45,79,87],"feedback":[18],"circuits.":[19,48],"A":[20],"hybrid":[21],"low":[22],"dropout":[23],"voltage":[24,43],"regulator":[25],"utilizing":[26],"SMC":[27],"designed":[29],"in":[30],"130":[31],"nm":[32],"CMOS":[33],"for":[34],"fine-grain":[35],"power":[36],"management,":[37],"fast":[38],"droop":[39],"recovery,":[40],"and":[41,57,64,82],"accurate":[42],"regulation":[44],"digital":[46,63],"load":[47],"The":[49],"design":[50],"provides":[51],"an":[52,65],"optimal":[53],"tradeoff":[54],"performance":[56],"accuracy":[58],"by":[59],"analog":[66],"loop.":[68],"Measurements":[69],"from":[70],"test-chip":[72],"show":[73],"near-threshold-voltage":[74],"operation,":[75],"peak":[76,84],"transient":[77],"response":[78],"0.71":[80],"ns/mA,":[81],"current":[85],"efficiency":[86],"98.64%.":[88]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}