{"id":"https://openalex.org/W2761309853","doi":"https://doi.org/10.1109/jssc.2017.2753234","title":"A 1.4-m $\\Omega$ -Sensitivity 94-dB Dynamic-Range Electrical Impedance Tomography SoC and 48-Channel Hub-SoC for 3-D Lung Ventilation Monitoring System","display_name":"A 1.4-m $\\Omega$ -Sensitivity 94-dB Dynamic-Range Electrical Impedance Tomography SoC and 48-Channel Hub-SoC for 3-D Lung Ventilation Monitoring System","publication_year":2017,"publication_date":"2017-10-03","ids":{"openalex":"https://openalex.org/W2761309853","doi":"https://doi.org/10.1109/jssc.2017.2753234","mag":"2761309853"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2017.2753234","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2753234","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100671475","display_name":"Minseo Kim","orcid":"https://orcid.org/0000-0002-9933-9789"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Minseo Kim","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023250057","display_name":"Jaeeun Jang","orcid":"https://orcid.org/0000-0002-1311-7721"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeeun Jang","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101574426","display_name":"Hyunki Kim","orcid":"https://orcid.org/0000-0001-5949-9238"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunki Kim","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048898383","display_name":"Ji Hee Lee","orcid":"https://orcid.org/0000-0003-1440-9088"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihee Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045893267","display_name":"Jae-hyuck Lee","orcid":"https://orcid.org/0000-0001-6292-598X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuck Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100444749","display_name":"Jiwon Lee","orcid":"https://orcid.org/0009-0009-6529-5333"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jiwon Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014233617","display_name":"Kyoung-Rog Lee","orcid":"https://orcid.org/0000-0002-4017-0536"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoung-Rog Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048657794","display_name":"Kwantae Kim","orcid":"https://orcid.org/0000-0001-8962-4554"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwantae Kim","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101773264","display_name":"Yongsu Lee","orcid":"https://orcid.org/0000-0001-8174-3444"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongsu Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101638097","display_name":"Kyuho Lee","orcid":"https://orcid.org/0000-0002-4047-1013"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyuho Jason Lee","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-Jun Yoo","raw_affiliation_strings":["Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5100671475"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":3.0718,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":{"value":0.92145398,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"52","issue":"11","first_page":"2829","last_page":"2842"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11196","display_name":"Non-Invasive Vital Sign Monitoring","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11700","display_name":"Hemodynamic Monitoring and Therapy","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2746","display_name":"Surgery"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7463064193725586},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5192065834999084},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4729235768318176},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4147145748138428},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4128165543079376},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38968828320503235},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3876226544380188},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3440372347831726},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33710506558418274},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.32516366243362427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.324969083070755}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7463064193725586},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5192065834999084},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4729235768318176},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4147145748138428},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4128165543079376},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38968828320503235},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3876226544380188},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3440372347831726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33710506558418274},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.32516366243362427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.324969083070755}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2017.2753234","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2753234","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/24536","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/8057579/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1480858673","https://openalex.org/W1844637553","https://openalex.org/W1978238763","https://openalex.org/W1978770244","https://openalex.org/W1980893811","https://openalex.org/W1998025986","https://openalex.org/W1998962655","https://openalex.org/W2002606334","https://openalex.org/W2009786158","https://openalex.org/W2014519391","https://openalex.org/W2020733548","https://openalex.org/W2030655456","https://openalex.org/W2031992884","https://openalex.org/W2034332958","https://openalex.org/W2053510218","https://openalex.org/W2057438408","https://openalex.org/W2065422801","https://openalex.org/W2068854215","https://openalex.org/W2096088049","https://openalex.org/W2113761410","https://openalex.org/W2132662889","https://openalex.org/W2138536318","https://openalex.org/W2147498826","https://openalex.org/W2162461562","https://openalex.org/W2406997757","https://openalex.org/W2897807752","https://openalex.org/W4236312734","https://openalex.org/W4250556634","https://openalex.org/W6628604793","https://openalex.org/W6683860327"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2051428347","https://openalex.org/W4285180073","https://openalex.org/W4391184577","https://openalex.org/W3097371773","https://openalex.org/W2944246511","https://openalex.org/W2362037466"],"abstract_inverted_index":{"A":[0,94],"wearable":[1,31],"electrical":[2],"impedance":[3,92,110,138],"tomography":[4],"(EIT)":[5],"system":[6,117],"is":[7,46,100,124],"proposed":[8,101],"for":[9,81],"the":[10,49,69,73,78,114,119,141],"portable":[11],"real-time":[12,192],"3-D":[13,193],"lung":[14,194],"ventilation":[15],"monitoring.":[16],"It":[17],"consists":[18],"of":[19,22,71,106,137,185],"two":[20],"types":[21],"SoCs,":[23],"active":[24],"electrode":[25],"(AE)-SoC":[26],"and":[27,44,56,84,122,149,159,168,187],"Hub-SoC,":[28],"mounted":[29],"on":[30,38],"belts.":[32],"The":[33,145],"48-channel":[34,115],"AE-SoCs":[35],"are":[36,181,196],"integrated":[37,47],"flexible":[39],"printed":[40],"circuit":[41],"board":[42],"belt,":[43],"Hub-SoC":[45],"in":[48,140,142,155],"hub":[50],"module":[51],"which":[52],"performs":[53],"data":[54],"gathering":[55],"wireless":[57],"communication":[58,121],"between":[59],"an":[60],"external":[61],"imaging":[62],"device.":[63],"To":[64],"get":[65],"high":[66],"accuracy":[67],"under":[68],"variation":[70],"conductivity,":[72],"dual-mode":[74],"current":[75],"stimulator":[76],"provides":[77],"optimal":[79],"frequency":[80,85],"time":[82],"difference-EIT":[83,86],"with":[87,118,171,183],"simultaneous":[88],"4":[89],"k\u2013128":[90],"kHz":[91],"sensing.":[93,111],"wide":[95,107],"dynamic":[96,108],"range":[97,109],"instruments":[98],"amplifier":[99],"to":[102,126,189],"provide":[103],"94":[104],"dB":[105],"In":[112],"addition,":[113],"AE":[116],"dedicated":[120],"calibration":[123],"implemented":[125],"achieve":[127],"1.4-":[128],"<inline-formula":[129,161],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[130,153,162],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[131,163],"<tex-math":[132,164],"notation=\"LaTeX\">$\\text{m}\\Omega":[133],"$":[134],"</tex-math></inline-formula>":[135,167],"sensitivity":[136],"difference":[139],"vivo":[143],"environment.":[144],"AE-/Hub-SoCs":[146],"occupy":[147],"3.2":[148],"1.3":[150],"mm":[151],"<sup":[152],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[154],"65-nm":[156],"CMOS":[157],"technology":[158],"consume":[160],"notation=\"LaTeX\">$124~\\mu":[165],"\\text{W}$":[166],"1.1":[169],"mW":[170],"1.2":[172],"V":[173],"supply,":[174],"respectively.":[175],"As":[176],"a":[177],"result,":[178],"EIT":[179],"images":[180,195],"reconstructed":[182],"90%":[184],"accuracy,":[186],"up":[188],"10":[190],"frames/s":[191],"successfully":[197],"displayed.":[198]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":6}],"updated_date":"2026-04-03T22:45:19.894376","created_date":"2025-10-10T00:00:00"}