{"id":"https://openalex.org/W2787708333","doi":"https://doi.org/10.1109/jssc.2017.2751610","title":"A 0.18- $\\mu \\text{m}$ CMOS Image Sensor With Phase-Delay-Counting and Oversampling Dual-Slope Integrating Column ADCs Achieving $1{\\text {e}}^{-}_{\\mathrm{ rms}}$ Noise at 3.8- $\\mu \\text{s}$ Conversion Time","display_name":"A 0.18- $\\mu \\text{m}$ CMOS Image Sensor With Phase-Delay-Counting and Oversampling Dual-Slope Integrating Column ADCs Achieving $1{\\text {e}}^{-}_{\\mathrm{ rms}}$ Noise at 3.8- $\\mu \\text{s}$ Conversion Time","publication_year":2017,"publication_date":"2017-10-11","ids":{"openalex":"https://openalex.org/W2787708333","doi":"https://doi.org/10.1109/jssc.2017.2751610","mag":"2787708333"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2017.2751610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2751610","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072365038","display_name":"Ha Le-Thai","orcid":"https://orcid.org/0000-0002-7938-3336"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Ha Le-Thai","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044760931","display_name":"Genis Chapinal","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Genis Chapinal","raw_affiliation_strings":["ON Semiconductor, Mechelen, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Mechelen, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020687101","display_name":"Tomas Geurts","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tomas Geurts","raw_affiliation_strings":["ON Semiconductor, Mechelen, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Mechelen, Belgium","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges G. E. Gielen","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072365038"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.54631101,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"53","issue":"2","first_page":"515","last_page":"526"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.9363598823547363},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6013135313987732},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5682845711708069},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5392298698425293},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.47084829211235046},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.43396905064582825},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.39847251772880554},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35255110263824463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34881776571273804},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.32806193828582764},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23496299982070923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15708136558532715},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.11664682626724243},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11056491732597351}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.9363598823547363},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6013135313987732},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5682845711708069},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5392298698425293},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.47084829211235046},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.43396905064582825},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39847251772880554},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35255110263824463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34881776571273804},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.32806193828582764},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23496299982070923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15708136558532715},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11664682626724243},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11056491732597351}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2017.2751610","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2751610","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/596038","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/596038/3/doc.%20Halethai.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Solid-State Circuits, vol. 53 (2), (515-526)","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1491916731","https://openalex.org/W1566916904","https://openalex.org/W1969965391","https://openalex.org/W1975838359","https://openalex.org/W1988229577","https://openalex.org/W2009436441","https://openalex.org/W2011593284","https://openalex.org/W2016997355","https://openalex.org/W2018657325","https://openalex.org/W2019987216","https://openalex.org/W2048500522","https://openalex.org/W2056587553","https://openalex.org/W2070247293","https://openalex.org/W2093218199","https://openalex.org/W2096299759","https://openalex.org/W2096434843","https://openalex.org/W2099753344","https://openalex.org/W2102524343","https://openalex.org/W2103867893","https://openalex.org/W2108324407","https://openalex.org/W2113025650","https://openalex.org/W2113851294","https://openalex.org/W2124081222","https://openalex.org/W2142856313","https://openalex.org/W2150423223","https://openalex.org/W2200449959","https://openalex.org/W2216726118","https://openalex.org/W2290915144","https://openalex.org/W2466228052","https://openalex.org/W2522024758","https://openalex.org/W2524303370","https://openalex.org/W4400185593","https://openalex.org/W6653099678","https://openalex.org/W6674652224","https://openalex.org/W6696564931","https://openalex.org/W6727241211"],"related_works":["https://openalex.org/W2090950954","https://openalex.org/W1602708344","https://openalex.org/W2142308932","https://openalex.org/W194396510","https://openalex.org/W2043303332","https://openalex.org/W2144509711","https://openalex.org/W1571224200","https://openalex.org/W2076947669","https://openalex.org/W3106211825","https://openalex.org/W3174284207"],"abstract_inverted_index":{"A":[0,40],"CMOS":[1],"image":[2],"sensor":[3],"(CIS)":[4],"is":[5,50],"presented,":[6],"simultaneously":[7],"achieving":[8],"low":[9],"noise":[10,41,130],"and":[11,31,87,127,150,168],"high":[12],"frame":[13],"rate.":[14],"The":[15,93,110,141],"imager":[16],"innovatively":[17],"employs":[18],"column-parallel":[19],"dual-slope":[20],"(DS)":[21],"integrating":[22],"analog-to-digital":[23],"converters":[24],"(ADCs)":[25],"based":[26,71],"on":[27,72,79],"a":[28,98,104,122,129,159],"phase-delay-counting":[29],"principle":[30],"using":[32],"oversampling":[33],"to":[34,52],"suppress":[35],"the":[36,44,54,58,62,66,73,90,117,147,154],"readout":[37],"thermal":[38],"noise.":[39],"analysis":[42,74],"of":[43,57,65,75,116,132,163,166],"DS-integrating":[45],"ADC":[46],"in":[47,89,97,124,158],"correlated-double-sampling":[48],"operation":[49],"provided":[51],"prove":[53],"low-noise":[55],"advantage":[56],"proposed":[59],"architecture.":[60],"Furthermore,":[61],"design":[63,83],"considerations":[64],"presented":[67],"architecture":[68],"are":[69,85],"derived":[70],"nonideality":[76],"effects.":[77],"Based":[78],"these":[80],"analytical":[81],"results,":[82],"tradeoffs":[84],"discussed":[86],"applied":[88],"test":[91,94],"chip.":[92],"chip,":[95],"fabricated":[96],"4M1P":[99],"0.18-\u03bcm":[100],"CIS":[101],"technology,":[102],"contains":[103],"128":[105,107,118],"\u00d7":[106],"pixel":[108,123],"array.":[109],"measurement":[111],"results":[112],"show":[113],"that":[114],"each":[115],"column-level":[119],"ADCs":[120],"converts":[121],"3.8":[125],"\u03bcs":[126],"achieves":[128],"floor":[131],"1e":[133],"<sub":[134],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[135,138,172],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">rms</sub>":[136],"<sup":[137,171],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup>":[139,173],".":[140],"chip":[142],"consumes":[143],"49":[144],"mW":[145,152],"excluding":[146],"I/O":[148,155],"power":[149],"59":[151],"including":[153],"power,":[156],"resulting":[157],"very":[160],"good":[161],"figure":[162],"merit":[164],"value":[165],"1.4":[167],"1.7":[169],"[e":[170],".nJ],":[174],"respectively.":[175]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2018-02-23T00:00:00"}