{"id":"https://openalex.org/W2754812974","doi":"https://doi.org/10.1109/jssc.2017.2734910","title":"A 2.4-GHz 1.5-mW Digital Multiplying Delay-Locked Loop Using Pulsewidth Comparator and Double Injection Technique","display_name":"A 2.4-GHz 1.5-mW Digital Multiplying Delay-Locked Loop Using Pulsewidth Comparator and Double Injection Technique","publication_year":2017,"publication_date":"2017-09-12","ids":{"openalex":"https://openalex.org/W2754812974","doi":"https://doi.org/10.1109/jssc.2017.2734910","mag":"2754812974"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2017.2734910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2734910","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103210975","display_name":"Hyunik Kim","orcid":"https://orcid.org/0000-0001-5065-8351"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyunik Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089447360","display_name":"Yongjo Kim","orcid":"https://orcid.org/0000-0001-5204-2251"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongjo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058392128","display_name":"Tae-Ik Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeik Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110512444","display_name":"Hyung-Jong Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung-Jong Ko","raw_affiliation_strings":["Samsung Electronics, Hwaseong, South Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040917581","display_name":"SeongHwan Cho","orcid":"https://orcid.org/0000-0001-7938-2694"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seonghwan Cho","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103210975"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":3.0102,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.91962315,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"52","issue":"11","first_page":"2934","last_page":"2946"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8279761075973511},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6867308616638184},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.6298888921737671},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5464337468147278},{"id":"https://openalex.org/keywords/signal-edge","display_name":"Signal edge","score":0.5305978059768677},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.4975285828113556},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.47408998012542725},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4519391655921936},{"id":"https://openalex.org/keywords/delay-locked-loop","display_name":"Delay-locked loop","score":0.4122052490711212},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3949340879917145},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3661655783653259},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.3497285544872284},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34457913041114807},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23367103934288025},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22843202948570251},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1531030833721161},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14290010929107666},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13343918323516846},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.08102518320083618}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8279761075973511},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6867308616638184},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.6298888921737671},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5464337468147278},{"id":"https://openalex.org/C117525741","wikidata":"https://www.wikidata.org/wiki/Q775654","display_name":"Signal edge","level":4,"score":0.5305978059768677},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.4975285828113556},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.47408998012542725},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4519391655921936},{"id":"https://openalex.org/C190462668","wikidata":"https://www.wikidata.org/wiki/Q492265","display_name":"Delay-locked loop","level":4,"score":0.4122052490711212},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3949340879917145},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3661655783653259},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.3497285544872284},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34457913041114807},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23367103934288025},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22843202948570251},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1531030833721161},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14290010929107666},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13343918323516846},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.08102518320083618},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2017.2734910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2017.2734910","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4399999976158142}],"awards":[{"id":"https://openalex.org/G6869998799","display_name":null,"funder_award_id":"NRF-2015R1A5A1036133","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320324161","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1568860942","https://openalex.org/W1948778041","https://openalex.org/W1977030506","https://openalex.org/W2029794151","https://openalex.org/W2062327827","https://openalex.org/W2066871406","https://openalex.org/W2080432344","https://openalex.org/W2105386586","https://openalex.org/W2107514446","https://openalex.org/W2112731410","https://openalex.org/W2121854746","https://openalex.org/W2153267648","https://openalex.org/W2161139924","https://openalex.org/W2167891824","https://openalex.org/W2172477025","https://openalex.org/W2177383565","https://openalex.org/W2290934758","https://openalex.org/W2295656041","https://openalex.org/W2462522525","https://openalex.org/W2594705442","https://openalex.org/W6634093161","https://openalex.org/W6644600904","https://openalex.org/W6683540766","https://openalex.org/W6696509207"],"related_works":["https://openalex.org/W1912065184","https://openalex.org/W2049525097","https://openalex.org/W2372909716","https://openalex.org/W2012676707","https://openalex.org/W2354050524","https://openalex.org/W2083878249","https://openalex.org/W2401743820","https://openalex.org/W3177439118","https://openalex.org/W4295813049","https://openalex.org/W2119216036"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,14,52,61,89,107],"low-jitter":[6],"low-power":[7],"digital":[8,100],"multiplying":[9],"delay-locked":[10],"loop":[11],"(MDLL)":[12],"with":[13,51,88],"self-calibrated":[15],"double":[16],"reference":[17],"injection":[18,55],"scheme.":[19],"To":[20],"reduce":[21],"jitter,":[22],"the":[23,27,33,39,65,70,98],"noisy":[24],"edge":[25],"of":[26,38,64,69,109,116],"oscillator":[28],"is":[29,80],"replaced":[30],"by":[31,60,82],"both":[32],"rising":[34],"and":[35,72,78,105,112],"falling":[36],"edges":[37],"clean":[40],"reference,":[41,71],"which":[42],"results":[43],"in":[44,47,95],"6-dB":[45],"reduction":[46],"phase":[48],"noise":[49],"compared":[50],"conventional":[53],"single-edge":[54],"MDLL.":[56],"Reference":[57],"spur":[58,108],"caused":[59],"frequency":[62],"error":[63,68],"oscillator,":[66],"duty-cycle":[67],"circuit":[73],"imperfection,":[74],"such":[75],"as":[76],"offset":[77],"mismatch,":[79],"removed":[81],"employing":[83],"three":[84],"background":[85],"feedback":[86],"loops":[87],"shared":[90],"analog":[91],"pulsewidth":[92],"comparator.":[93],"Implemented":[94],"28-nm":[96],"CMOS,":[97],"proposed":[99],"MDLL":[101],"generates":[102],"2.4-GHz":[103],"clock":[104],"achieves":[106],"-51.4":[110],"dBc":[111],"an":[113],"rms":[114],"jitter":[115],"699":[117],"fsrms":[118],"while":[119],"consuming":[120],"1.5":[121],"mW":[122],"from":[123],"1-V":[124],"supply.":[125]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}