{"id":"https://openalex.org/W2583045991","doi":"https://doi.org/10.1109/jssc.2016.2638464","title":"A BJT-Based Temperature-to-Digital Converter With \u00b160 mK ( $3~\\sigma$ ) Inaccuracy From \u221255 \u00b0C to +125 \u00b0C in 0.16-\u03bcm CMOS","display_name":"A BJT-Based Temperature-to-Digital Converter With \u00b160 mK ( $3~\\sigma$ ) Inaccuracy From \u221255 \u00b0C to +125 \u00b0C in 0.16-\u03bcm CMOS","publication_year":2017,"publication_date":"2017-01-23","ids":{"openalex":"https://openalex.org/W2583045991","doi":"https://doi.org/10.1109/jssc.2016.2638464","mag":"2583045991"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2016.2638464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2638464","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030222348","display_name":"Bahman Yousefzadeh","orcid":"https://orcid.org/0000-0002-3668-215X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Bahman Yousefzadeh","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035537867","display_name":"Saleh Heidary Shalmany","orcid":"https://orcid.org/0000-0003-3846-134X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Saleh Heidary Shalmany","raw_affiliation_strings":["Broadcom Netherlands, Bunnik, AJ, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Broadcom Netherlands, Bunnik, AJ, The Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technology, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030222348"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":4.071,"has_fulltext":false,"cited_by_count":99,"citation_normalized_percentile":{"value":0.9425448,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"52","issue":"4","first_page":"1044","last_page":"1052"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7175906896591187},{"id":"https://openalex.org/keywords/common-emitter","display_name":"Common emitter","score":0.6551425457000732},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.6203858256340027},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6089804172515869},{"id":"https://openalex.org/keywords/trim","display_name":"Trim","score":0.5694402456283569},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47810739278793335},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43627768754959106},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.4247155785560608},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.42435818910598755},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4046036899089813},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3927982449531555},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3823608160018921},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3721767067909241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3247684836387634},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3146005868911743},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.28309670090675354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21539893746376038},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.08149993419647217}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7175906896591187},{"id":"https://openalex.org/C46918542","wikidata":"https://www.wikidata.org/wiki/Q1648344","display_name":"Common emitter","level":2,"score":0.6551425457000732},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.6203858256340027},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6089804172515869},{"id":"https://openalex.org/C88611116","wikidata":"https://www.wikidata.org/wiki/Q957004","display_name":"Trim","level":2,"score":0.5694402456283569},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47810739278793335},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43627768754959106},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.4247155785560608},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42435818910598755},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4046036899089813},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3927982449531555},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3823608160018921},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3721767067909241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3247684836387634},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3146005868911743},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.28309670090675354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21539893746376038},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08149993419647217},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2016.2638464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2638464","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:tudelft.nl:uuid:7f0f0293-af44-4eab-a615-3b91971351de","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:7f0f0293-af44-4eab-a615-3b91971351de","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6399999856948853,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W649290676","https://openalex.org/W1480606358","https://openalex.org/W1965838897","https://openalex.org/W1977865810","https://openalex.org/W1989483638","https://openalex.org/W2023758271","https://openalex.org/W2055944305","https://openalex.org/W2065808645","https://openalex.org/W2071848335","https://openalex.org/W2104728225","https://openalex.org/W2107271589","https://openalex.org/W2140823559","https://openalex.org/W2140877124","https://openalex.org/W2156999106","https://openalex.org/W2163297099","https://openalex.org/W2236722122","https://openalex.org/W2341891553","https://openalex.org/W2523775370","https://openalex.org/W4247586331"],"related_works":["https://openalex.org/W2185874911","https://openalex.org/W1485418874","https://openalex.org/W1919724461","https://openalex.org/W2184349518","https://openalex.org/W2025633334","https://openalex.org/W2043970876","https://openalex.org/W2038397621","https://openalex.org/W1981729447","https://openalex.org/W1978929727","https://openalex.org/W2069256397"],"abstract_inverted_index":{"This":[0,45,127],"paper":[1],"presents":[2],"a":[3,41,76,116,134,178,207,220],"precision":[4],"CMOS":[5],"temperature-to-digital":[6],"converter":[7],"(TDC),":[8],"which":[9,153],"senses":[10],"the":[11,52,62,68,83,86,96,110,147,157,166,175,186],"temperature-dependent":[12],"base-emitter":[13,72],"voltage":[14],"of":[15,31,55,92,120,160,165,177,210,212,224],"substrate":[16],"PNPs.":[17],"Measurements":[18],"on":[19,95],"20":[20],"samples":[21,104],"from":[22,35,105,123,198],"one":[23],"batch":[24],"show":[25],"that":[26],"it":[27],"achieves":[28,206],"an":[29],"inaccuracy":[30,98,119],"\u00b160":[32],"mK":[33,131],"(3\u03c3)":[34,122,132],"-55":[36],"\u00b0C":[37],"to":[38,51,60,80,125,129,200],"+125\u00b0C,":[39],"after":[40,133],"single":[42,135],"room-temperature":[43],"trim.":[44,137],"state-of-the-art":[46,221],"result":[47],"is":[48],"mainly":[49],"due":[50],"extensive":[53],"use":[54],"dynamic":[56],"error":[57],"cancellation":[58],"techniques":[59],"generate":[61],"PNP's":[63,87,167],"collector":[64],"currents,":[65],"thus":[66,141],"minimizing":[67],"spread":[69,84],"in":[70,85,183],"their":[71],"voltages,":[73],"together":[74],"with":[75,174],"digital":[77],"PTAT":[78],"trim":[79],"correct":[81],"for":[82,149],"saturation":[88],"currents.":[89],"The":[90,138,163],"effect":[91,164],"process":[93],"variation":[94],"TDC's":[97],"was":[99,171],"investigated":[100,173],"by":[101,145],"measuring":[102],"80":[103],"three":[106],"different":[107],"batches.":[108],"Using":[109],"same":[111],"calibration":[112,143,151,159],"parameters,":[113,152],"they":[114],"exhibit":[115],"maximum":[117],"untrimmed":[118],"\u00b12\u00b0C":[121],"-55\u00b0C":[124],"+125\u00b0C.":[126],"drops":[128],"\u00b1100":[130],"point":[136],"proposed":[139],"TDC":[140,187],"reduces":[142],"costs":[144],"obviating":[146],"need":[148],"batch-specific":[150],"would":[154],"otherwise":[155],"require":[156],"multipoint":[158],"several":[161],"samples.":[162],"current":[168],"gain":[169],"\u03b2":[170],"also":[172],"help":[176],"novel":[179],"\u03b2-detection":[180],"circuit.":[181],"Implemented":[182],"0.16-\u03bcm":[184],"CMOS,":[185],"occupies":[188],"0.16":[189],"mm":[190],"<sup":[191,215],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[192,216],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[193,217],"and":[194,219],"draws":[195],"4.6":[196],"\u03bcA":[197],"1.5":[199],"2":[201],"V":[202],"supply":[203,222],"voltages.":[204],"It":[205],"resolution":[208],"Figure":[209],"Merit":[211],"7.8":[213],"pJ\u00b0C":[214],",":[218],"sensitivity":[223],"0.01\u00b0C/V.":[225]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":19},{"year":2023,"cited_by_count":15},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":10},{"year":2017,"cited_by_count":4}],"updated_date":"2026-04-04T08:04:53.788161","created_date":"2017-02-03T00:00:00"}