{"id":"https://openalex.org/W2318028930","doi":"https://doi.org/10.1109/jssc.2016.2527718","title":"Rail Clamp with Dynamic Time-Constant Adjustment","display_name":"Rail Clamp with Dynamic Time-Constant Adjustment","publication_year":2016,"publication_date":"2016-03-01","ids":{"openalex":"https://openalex.org/W2318028930","doi":"https://doi.org/10.1109/jssc.2016.2527718","mag":"2318028930"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2016.2527718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2527718","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087317088","display_name":"Ramachandran Venkatasubramanian","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ramachandran Venkatasubramanian","raw_affiliation_strings":["Broadcom Corporation, Chandler, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Chandler, AZ, USA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072063993","display_name":"Kent Oertle","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kent Oertle","raw_affiliation_strings":["Broadcom Corporation, Chandler, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Chandler, AZ, USA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5087317088"],"corresponding_institution_ids":["https://openalex.org/I4210127325"],"apc_list":null,"apc_paid":null,"fwci":2.0214,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.87387621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"51","issue":"5","first_page":"1313","last_page":"1324"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/clamp","display_name":"Clamp","score":0.8438448905944824},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.710970401763916},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6293540000915527},{"id":"https://openalex.org/keywords/time-constant","display_name":"Time constant","score":0.5964159369468689},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.5603628158569336},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5380686521530151},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5293769836425781},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5185349583625793},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5064481496810913},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.46625080704689026},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.4196486473083496},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3860172927379608},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3831106126308441},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3346138596534729},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3120642900466919},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14706775546073914},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14315423369407654}],"concepts":[{"id":"https://openalex.org/C2776161997","wikidata":"https://www.wikidata.org/wiki/Q846600","display_name":"Clamp","level":3,"score":0.8438448905944824},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.710970401763916},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6293540000915527},{"id":"https://openalex.org/C81370116","wikidata":"https://www.wikidata.org/wiki/Q1335249","display_name":"Time constant","level":2,"score":0.5964159369468689},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.5603628158569336},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5380686521530151},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5293769836425781},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5185349583625793},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5064481496810913},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.46625080704689026},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.4196486473083496},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3860172927379608},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3831106126308441},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3346138596534729},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3120642900466919},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14706775546073914},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14315423369407654},{"id":"https://openalex.org/C84111939","wikidata":"https://www.wikidata.org/wiki/Q5125465","display_name":"Clamping","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2016.2527718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2016.2527718","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1576337139","https://openalex.org/W1603233670","https://openalex.org/W1963315061","https://openalex.org/W1966291942","https://openalex.org/W1968273903","https://openalex.org/W1981979220","https://openalex.org/W2004424954","https://openalex.org/W2043264894","https://openalex.org/W2051382375","https://openalex.org/W2102866901","https://openalex.org/W2108510307","https://openalex.org/W2109641950","https://openalex.org/W2114894573","https://openalex.org/W2123782173","https://openalex.org/W2124399691","https://openalex.org/W2135190827","https://openalex.org/W2166986753","https://openalex.org/W2169305461","https://openalex.org/W2300401259","https://openalex.org/W3101296782","https://openalex.org/W3143899571","https://openalex.org/W6634361228","https://openalex.org/W6636290830","https://openalex.org/W6642211719","https://openalex.org/W6676706392"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W1565155074","https://openalex.org/W2122613745","https://openalex.org/W2137612574","https://openalex.org/W2370794270","https://openalex.org/W2151082990","https://openalex.org/W1496466303","https://openalex.org/W2112301210","https://openalex.org/W2114894573","https://openalex.org/W2129849823"],"abstract_inverted_index":{"A":[0],"dual":[1],"time-constant":[2],"rail":[3],"clamp":[4,30,40],"for":[5],"protecting":[6],"CMOS":[7],"circuits":[8],"during":[9,33,67],"electrostatic":[10],"discharge":[11],"(ESD)":[12],"events":[13],"is":[14,25,31,50,63,80],"described.":[15],"In":[16],"the":[17,29,34,39,44,105],"new":[18],"circuit,":[19],"a":[20],"relatively":[21],"small":[22],"time":[23],"constant":[24],"dynamically":[26],"adjusted":[27],"after":[28],"triggered":[32],"ESD":[35,46],"event,":[36],"to":[37,65,82],"keep":[38],"conducting":[41],"and":[42,71,91,101],"dissipate":[43],"full":[45],"energy.":[47],"The":[48,78],"design":[49],"area-efficient,":[51],"can":[52],"support":[53],"applications":[54],"with":[55,104],"power-on":[56],"times":[57],"as":[58,60],"fast":[59],"200":[61],"ns,":[62],"immune":[64],"lock-on":[66],"normal":[68],"powered-on":[69],"operation,":[70],"corrects":[72],"very":[73],"quickly":[74],"when":[75],"accidentally":[76],"triggered.":[77],"circuit":[79,107],"able":[81],"maintain":[83],"robust":[84],"performance":[85,102],"over":[86],"industry":[87],"standard":[88],"process,":[89],"voltage,":[90],"temperature":[92],"(PVT)":[93],"conditions.":[94],"Experimental":[95],"results":[96],"from":[97],"fabricated":[98],"silicon":[99],"die":[100],"comparisons":[103],"traditional":[106],"are":[108],"presented.":[109]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}