{"id":"https://openalex.org/W2341891553","doi":"https://doi.org/10.1109/jssc.2015.2511168","title":"A A Integrated Current-Sensing System With % Gain Error and 16 \u03bcA Offset From to","display_name":"A A Integrated Current-Sensing System With % Gain Error and 16 \u03bcA Offset From to","publication_year":2016,"publication_date":"2016-02-01","ids":{"openalex":"https://openalex.org/W2341891553","doi":"https://doi.org/10.1109/jssc.2015.2511168","mag":"2341891553"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2015.2511168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2511168","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://resolver.tudelft.nl/uuid:4233a592-56ac-416f-a434-faaf57a34b52","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035537867","display_name":"Saleh Heidary Shalmany","orcid":"https://orcid.org/0000-0003-3846-134X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Saleh Heidary Shalmany","raw_affiliation_strings":["Department of Micro-electronics, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Micro-electronics, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022953640","display_name":"D. Draxelmayr","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Dieter Draxelmayr","raw_affiliation_strings":["Infineon Technologies AG, Villach, Carinthia, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Villach, Carinthia, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Department of Micro-electronics, Delft University of Technology, Delft, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Micro-electronics, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035537867"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":2.3889,"has_fulltext":true,"cited_by_count":27,"citation_normalized_percentile":{"value":0.89315114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"51","issue":"4","first_page":"800","last_page":"808"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.8097226023674011},{"id":"https://openalex.org/keywords/shunt","display_name":"Shunt (medical)","score":0.6278277635574341},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6206696629524231},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6008927822113037},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.593895673751831},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5871303081512451},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5760741233825684},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5464940071105957},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4904038906097412},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4503081738948822},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43439358472824097},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4260081648826599},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.42483723163604736},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4148155152797699},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.318713515996933}],"concepts":[{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.8097226023674011},{"id":"https://openalex.org/C2780968331","wikidata":"https://www.wikidata.org/wiki/Q1890115","display_name":"Shunt (medical)","level":2,"score":0.6278277635574341},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6206696629524231},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6008927822113037},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.593895673751831},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5871303081512451},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5760741233825684},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5464940071105957},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4904038906097412},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4503081738948822},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43439358472824097},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4260081648826599},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.42483723163604736},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4148155152797699},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.318713515996933},{"id":"https://openalex.org/C164705383","wikidata":"https://www.wikidata.org/wiki/Q10379","display_name":"Cardiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2015.2511168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2511168","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:tudelft.nl:uuid:4233a592-56ac-416f-a434-faaf57a34b52","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:4233a592-56ac-416f-a434-faaf57a34b52","pdf_url":"http://resolver.tudelft.nl/uuid:4233a592-56ac-416f-a434-faaf57a34b52","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":{"id":"pmh:oai:tudelft.nl:uuid:4233a592-56ac-416f-a434-faaf57a34b52","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:4233a592-56ac-416f-a434-faaf57a34b52","pdf_url":"http://resolver.tudelft.nl/uuid:4233a592-56ac-416f-a434-faaf57a34b52","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"},"sustainable_development_goals":[{"score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2341891553.pdf","grobid_xml":"https://content.openalex.org/works/W2341891553.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W334033941","https://openalex.org/W1489953367","https://openalex.org/W1505544142","https://openalex.org/W1530099233","https://openalex.org/W1563298501","https://openalex.org/W1576465555","https://openalex.org/W1592605254","https://openalex.org/W1962658814","https://openalex.org/W1968318216","https://openalex.org/W1975132130","https://openalex.org/W1989483638","https://openalex.org/W2023841370","https://openalex.org/W2044489809","https://openalex.org/W2055944305","https://openalex.org/W2074425652","https://openalex.org/W2076469371","https://openalex.org/W2077738473","https://openalex.org/W2081291956","https://openalex.org/W2081859728","https://openalex.org/W2094597636","https://openalex.org/W2101501150","https://openalex.org/W2102390974","https://openalex.org/W2107271589","https://openalex.org/W2112158038","https://openalex.org/W2115475919","https://openalex.org/W2121985488","https://openalex.org/W2127394451","https://openalex.org/W2133806020","https://openalex.org/W2135416188","https://openalex.org/W2162069682","https://openalex.org/W2163297099","https://openalex.org/W2204876191","https://openalex.org/W2284815708","https://openalex.org/W2286878303","https://openalex.org/W2294332288","https://openalex.org/W2322305490","https://openalex.org/W2852052492","https://openalex.org/W4247586331","https://openalex.org/W6640879253"],"related_works":["https://openalex.org/W2370820504","https://openalex.org/W2133199116","https://openalex.org/W2347289947","https://openalex.org/W2364640622","https://openalex.org/W2390376289","https://openalex.org/W2372270451","https://openalex.org/W1970992322","https://openalex.org/W2907906161","https://openalex.org/W2404318024","https://openalex.org/W11147392"],"abstract_inverted_index":{"This":[0,140],"paper":[1],"presents":[2],"an":[3,161],"integrated":[4],"current-sensing":[5],"system":[6],"(CSS)":[7],"that":[8,38],"is":[9,52],"intended":[10],"for":[11],"the":[12,40,47,149,152,158],"use":[13,159],"in":[14,54,100],"battery-powered":[15],"devices.":[16],"It":[17],"consists":[18],"of":[19,84,96,119,131,138,142,151,160],"a":[20,27,33,55,72,90,101,116,128,134,145,167],"10":[21],"m\u03a9":[22],"on-chip":[23],"metal":[24],"shunt":[25,163],"resistor,":[26],"switched-capacitor":[28],"(SC)":[29],"\u0394\u03a3":[30],"ADC,":[31],"and":[32,44,67,94,114,133,154,171],"dynamic":[34,173],"bandgap":[35],"reference":[36,42],"(BGR)":[37],"provides":[39],"ADC's":[41],"voltage":[43],"also":[45],"senses":[46],"shunt's":[48],"temperature.":[49],"The":[50],"CSS":[51],"realized":[53],"standard":[56,102],"0.13":[57],"\u03bcm":[58],"CMOS":[59],"process,":[60],"occupies":[61],"1.15":[62],"mm":[63],"<sup":[64],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[65],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[66],"draws":[68],"55":[69],"\u03bcA":[70],"from":[71,109],"1.5":[73],"V":[74],"supply.":[75],"Extensive":[76],"measurements":[77],"were":[78,86,98],"made":[79],"on":[80,148],"24":[81],"devices,":[82],"12":[83,95],"which":[85,97],"directly":[87],"bonded":[88],"to":[89,111,122],"printed-circuit":[91],"board":[92],"(PCB)":[93],"packaged":[99],"HVQFN":[103],"plastic":[104],"package.":[105],"For":[106],"currents":[107],"ranging":[108],"-5":[110],"+5":[112],"A":[113],"over":[115],"temperature":[117,164],"range":[118],"-55":[120],"\u00b0C":[121],"+":[123],"85":[124],"\u00b0C,":[125],"they":[126],"exhibit":[127],"maximum":[129,135],"offset":[130],"16\u03bcA":[132],"gain":[136],"error":[137,174],"\u00b10.3%.":[139],"level":[141],"accuracy":[143],"represents":[144],"significant":[146],"improvement":[147],"state":[150],"art,":[153],"was":[155],"achieved":[156],"by":[157],"accurate":[162],"compensation":[165],"scheme,":[166,170],"low-leakage":[168],"sampling":[169],"several":[172],"correction":[175],"techniques.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}