{"id":"https://openalex.org/W1639598785","doi":"https://doi.org/10.1109/jssc.2015.2464672","title":"A 2 kfps Sub-\u00b5W/Pix Uncooled-PbSe Digital Imager With 10 Bit DR Adjustment and FPN Correction for High-Speed and Low-Cost MWIR Applications","display_name":"A 2 kfps Sub-\u00b5W/Pix Uncooled-PbSe Digital Imager With 10 Bit DR Adjustment and FPN Correction for High-Speed and Low-Cost MWIR Applications","publication_year":2015,"publication_date":"2015-09-02","ids":{"openalex":"https://openalex.org/W1639598785","doi":"https://doi.org/10.1109/jssc.2015.2464672","mag":"1639598785"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2015.2464672","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2464672","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://digital.csic.es/bitstream/10261/143411/3/JSSC-Feb-15-0042-rev1-postprint.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052074339","display_name":"Josep Maria Margarit","orcid":"https://orcid.org/0000-0003-4477-035X"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Josep Maria Margarit","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066133392","display_name":"G. Vergara","orcid":"https://orcid.org/0000-0002-9406-1335"},"institutions":[{"id":"https://openalex.org/I4210100062","display_name":"New Infrared Technologies (Spain)","ror":"https://ror.org/010mx9v03","country_code":"ES","type":"company","lineage":["https://openalex.org/I4210100062"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"German Vergara","raw_affiliation_strings":["New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain","institution_ids":["https://openalex.org/I4210100062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069435370","display_name":"V. Villamayor","orcid":"https://orcid.org/0000-0001-5904-8912"},"institutions":[{"id":"https://openalex.org/I4210100062","display_name":"New Infrared Technologies (Spain)","ror":"https://ror.org/010mx9v03","country_code":"ES","type":"company","lineage":["https://openalex.org/I4210100062"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Victor Villamayor","raw_affiliation_strings":["New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain","institution_ids":["https://openalex.org/I4210100062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053065169","display_name":"R. Guti\u00e9rrez-\u00c1lvarez","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100062","display_name":"New Infrared Technologies (Spain)","ror":"https://ror.org/010mx9v03","country_code":"ES","type":"company","lineage":["https://openalex.org/I4210100062"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Raul Gutierrez-Alvarez","raw_affiliation_strings":["New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain","institution_ids":["https://openalex.org/I4210100062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053504530","display_name":"C. Fern\u00e1ndez-Montojo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100062","display_name":"New Infrared Technologies (Spain)","ror":"https://ror.org/010mx9v03","country_code":"ES","type":"company","lineage":["https://openalex.org/I4210100062"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Carlos Fernandez-Montojo","raw_affiliation_strings":["New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New Infrared Technologies S.L., Boadilla del Monte, Madrid, Spain","institution_ids":["https://openalex.org/I4210100062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007355640","display_name":"Llu\u00eds Ter\u00e9s","orcid":"https://orcid.org/0000-0002-9263-411X"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Lluis Teres","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056485115","display_name":"Francisco Serra-Graells","orcid":"https://orcid.org/0000-0002-7274-1911"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francisco Serra-Graells","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona (IMB-CNM, CSIC), Cerdanyola del Vall\u00e8s, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9718,"has_fulltext":true,"cited_by_count":23,"citation_normalized_percentile":{"value":0.78150206,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"50","issue":"10","first_page":"2394","last_page":"2405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6277651786804199},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.604072093963623},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5524319410324097},{"id":"https://openalex.org/keywords/large-format","display_name":"Large format","score":0.5017101764678955},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4872106909751892},{"id":"https://openalex.org/keywords/cardinal-point","display_name":"Cardinal point","score":0.4454087018966675},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4365699589252472},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42062515020370483},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.4202615022659302},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4196022152900696},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32476741075515747},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3183792233467102},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20023921132087708}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6277651786804199},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.604072093963623},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5524319410324097},{"id":"https://openalex.org/C2780478481","wikidata":"https://www.wikidata.org/wiki/Q1189460","display_name":"Large format","level":2,"score":0.5017101764678955},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4872106909751892},{"id":"https://openalex.org/C138395690","wikidata":"https://www.wikidata.org/wiki/Q376733","display_name":"Cardinal point","level":2,"score":0.4454087018966675},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4365699589252472},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42062515020370483},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.4202615022659302},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4196022152900696},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32476741075515747},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3183792233467102},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20023921132087708}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2015.2464672","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2464672","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:digital.csic.es:10261/143411","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/143411","pdf_url":"https://digital.csic.es/bitstream/10261/143411/3/JSSC-Feb-15-0042-rev1-postprint.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"http://purl.org/coar/resource_type/c_6501"}],"best_oa_location":{"id":"pmh:oai:digital.csic.es:10261/143411","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/143411","pdf_url":"https://digital.csic.es/bitstream/10261/143411/3/JSSC-Feb-15-0042-rev1-postprint.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"http://purl.org/coar/resource_type/c_6501"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6200000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1639598785.pdf","grobid_xml":"https://content.openalex.org/works/W1639598785.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1963955345","https://openalex.org/W1964947706","https://openalex.org/W1986285185","https://openalex.org/W1992014495","https://openalex.org/W1996332175","https://openalex.org/W2000735547","https://openalex.org/W2039099998","https://openalex.org/W2049905908","https://openalex.org/W2057669332","https://openalex.org/W2068682793","https://openalex.org/W2069363022","https://openalex.org/W2070225719","https://openalex.org/W2106505617","https://openalex.org/W2112116115","https://openalex.org/W2113444870","https://openalex.org/W2123538082","https://openalex.org/W2131144373","https://openalex.org/W2132870234","https://openalex.org/W2149171183","https://openalex.org/W2153049630","https://openalex.org/W2154437080","https://openalex.org/W2158904135","https://openalex.org/W2159582793","https://openalex.org/W2164414052","https://openalex.org/W2252303270","https://openalex.org/W2788622643"],"related_works":["https://openalex.org/W605071409","https://openalex.org/W2398395371","https://openalex.org/W2132941549","https://openalex.org/W2389683564","https://openalex.org/W3087769092","https://openalex.org/W2501009925","https://openalex.org/W2143347850","https://openalex.org/W4281894265","https://openalex.org/W2037686119","https://openalex.org/W2118782798"],"abstract_inverted_index":{"Mid-wavelength":[0],"infrared":[1],"(MWIR)":[2],"thermography":[3],"is":[4,24],"an":[5,173],"emerging":[6],"technology":[7,128],"with":[8,133],"promising":[9],"applications":[10],"such":[11],"as":[12],"industrial":[13],"monitoring,":[14],"medicine":[15],"and":[16,37,66,70,95,110,129,138,152,172],"automotive,":[17],"but":[18],"its":[19,92],"use":[20],"in":[21,107],"high-speed":[22,55],"cameras":[23],"not":[25],"yet":[26],"widespread":[27],"due":[28],"to":[29,77],"the":[30,48,79,98,156],"lack":[31],"of":[32,86,91,97,176,178],"inexpensive":[33],"sensor":[34],"integration":[35],"solutions":[36],"their":[38],"common":[39],"reliance":[40],"on":[41,58],"bulky":[42],"cooling":[43],"mechanisms.":[44],"This":[45,82],"work":[46],"fills":[47],"gap":[49],"by":[50,104],"presenting":[51],"a":[52,67],"monolithic":[53],"uncooled":[54],"imager":[56,118],"based":[57],"vapor-phase":[59],"deposition":[60],"lead":[61],"selenide":[62],"(VPD":[63],"PbSe)":[64],"photoconductors":[65],"fully":[68],"digital":[69],"configurable":[71],"CMOS":[72,108,127],"read-out":[73],"integrated":[74,121],"circuit":[75],"(ROIC)":[76],"operate":[78],"MWIR":[80],"imager.":[81],"ROIC":[83],"features":[84],"cancellation":[85],"PbSe":[87,130],"dark":[88],"current,":[89],"compensation":[90,151],"output":[93],"capacitance":[94],"correction":[96],"fixed":[99],"pattern":[100],"noise":[101],"(FPN)":[102],"caused":[103],"process":[105],"non-uniformities":[106],"fabrication":[109],"detector":[111,131],"deposition.":[112],"The":[113],"low-cost":[114],"80":[115,117],"\u00d7":[116,181],"has":[119],"been":[120],"using":[122],"0.35":[123],"\u03bcm":[124,135],"2P4M":[125],"standard":[126],"post-processing":[132],"135":[134],"pixel":[136,169],"pitch":[137],"68%":[139],"fill":[140],"factor":[141],"values.":[142],"Experimental":[143],"opto-electrical":[144],"performance":[145],"exhibits":[146],"10":[147],"bit":[148],"real-time":[149],"FPN":[150],"DR":[153],"calibration":[154],"over":[155],"entire":[157],"focal":[158],"plane":[159],"operating":[160],"at":[161],"2":[162],"kfps,":[163],"sub-0.5":[164],"LSB":[165],"inter-pixel":[166],"crosstalk,":[167],"sub-\u03bcW":[168],"power":[170],"consumption,":[171],"overall":[174],"figure":[175],"merit":[177],"55":[179],"mK":[180],"ms.":[182]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}