{"id":"https://openalex.org/W2566998670","doi":"https://doi.org/10.1109/jssc.2015.2461598","title":"Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring","display_name":"Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring","publication_year":2015,"publication_date":"2015-09-14","ids":{"openalex":"https://openalex.org/W2566998670","doi":"https://doi.org/10.1109/jssc.2015.2461598","mag":"2566998670"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2015.2461598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2461598","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102980295","display_name":"Mahfuzul Islam","orcid":"https://orcid.org/0000-0002-5011-4044"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. K. M. Mahfuzul Islam","raw_affiliation_strings":["Institute of Industrial Science, The University of Tokyo, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Industrial Science, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107461620","display_name":"Jun Shiomi","orcid":"https://orcid.org/0000-0003-2733-9349"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Shiomi","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022726556","display_name":"Tohru Ishihara","orcid":"https://orcid.org/0000-0002-1650-9958"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tohru Ishihara","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetoshi Onodera","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6044,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.84938376,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"50","issue":"11","first_page":"2475","last_page":"2490"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6170034408569336},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6076768040657043},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5576472282409668},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.535454511642456},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5339608788490295},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4613834023475647},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45183098316192627},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4164885878562927},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4052310585975647},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33305227756500244},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3017927408218384}],"concepts":[{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6170034408569336},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6076768040657043},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5576472282409668},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.535454511642456},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5339608788490295},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4613834023475647},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45183098316192627},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4164885878562927},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4052310585975647},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33305227756500244},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3017927408218384},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2015.2461598","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2015.2461598","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1974420955","https://openalex.org/W1975790448","https://openalex.org/W1981384041","https://openalex.org/W1994824427","https://openalex.org/W1995306443","https://openalex.org/W2004049596","https://openalex.org/W2031068066","https://openalex.org/W2040207274","https://openalex.org/W2047055294","https://openalex.org/W2063046178","https://openalex.org/W2088693242","https://openalex.org/W2108790707","https://openalex.org/W2110134128","https://openalex.org/W2116766520","https://openalex.org/W2117648153","https://openalex.org/W2125892790","https://openalex.org/W2131862714","https://openalex.org/W2136600361","https://openalex.org/W2146410479","https://openalex.org/W2153292994","https://openalex.org/W2159719035","https://openalex.org/W2163297099","https://openalex.org/W2169089880","https://openalex.org/W2477509976","https://openalex.org/W4251240676","https://openalex.org/W6649167131","https://openalex.org/W6681681969"],"related_works":["https://openalex.org/W2367891013","https://openalex.org/W2007108787","https://openalex.org/W4390604093","https://openalex.org/W2084837496","https://openalex.org/W2373210218","https://openalex.org/W3147659851","https://openalex.org/W3119861251","https://openalex.org/W2103570580","https://openalex.org/W3019679473","https://openalex.org/W2315503980"],"abstract_inverted_index":{"Variation":[0],"in":[1,10,154],"process,":[2],"voltage":[3,44],"and":[4,33,45,54,85,124,147,163,167],"temperature":[5,55],"is":[6,39,49,76,129,135],"a":[7,67,102,115],"major":[8],"obstacle":[9],"achieving":[11],"energy-efficient":[12],"operation":[13],"of":[14,28,30,88,110,121],"LSI.":[15],"This":[16],"paper":[17],"proposes":[18],"an":[19],"all-digital":[20],"on-chip":[21],"circuit":[22,48,58],"to":[23,42,62,78],"monitor":[24,69,81,127],"leakage":[25,37],"current":[26,38],"variations":[27],"both":[29,120],"the":[31,47,80,89,108,111,122,126],"nMOSFET":[32,123],"pMOSFET":[34],"independently.":[35],"As":[36],"highly":[40],"sensitive":[41],"threshold":[43],"temperature,":[46],"suitable":[50],"for":[51,119,157],"tracking":[52],"process":[53],"variation.":[56],"The":[57,83,142],"uses":[59],"reconfigurable":[60,73],"inhomogeneity":[61],"obtain":[63],"statistical":[64],"properties":[65],"from":[66,101],"single":[68],"instance.":[70],"A":[71],"compact":[72,84],"inverter":[74,90],"topology":[75],"proposed":[77,112,143],"implement":[79],"circuit.":[82,113],"digital":[86],"nature":[87],"enables":[91,145],"cell-based":[92],"design,":[93],"which":[94],"will":[95],"reduce":[96],"design":[97],"costs.":[98],"Measurement":[99],"results":[100],"65":[103],"nm":[104],"test":[105],"chip":[106],"show":[107],"validity":[109],"For":[114],"124":[116],"sample":[117],"size":[118],"pMOSFET,":[125],"area":[128],"4500":[130],"\u03bcm2and":[131],"active":[132],"power":[133],"consumption":[134],"76":[136],"nW":[137],"at":[138],"0.8":[139],"V":[140],"operation.":[141],"technique":[144],"area-efficient":[146],"low-cost":[148],"implementation":[149],"thus":[150],"can":[151],"be":[152],"used":[153],"product":[155],"chips":[156],"applications":[158],"such":[159],"as":[160],"dynamic":[161],"energy":[162],"thermal":[164],"management,":[165],"testing":[166],"post-silicon":[168],"tuning.":[169]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}