{"id":"https://openalex.org/W2169735823","doi":"https://doi.org/10.1109/jssc.2014.2379265","title":"An Ultra-Low Phase Noise Class-F 2 CMOS Oscillator With 191 dBc/Hz FoM and Long-Term Reliability","display_name":"An Ultra-Low Phase Noise Class-F 2 CMOS Oscillator With 191 dBc/Hz FoM and Long-Term Reliability","publication_year":2015,"publication_date":"2015-01-12","ids":{"openalex":"https://openalex.org/W2169735823","doi":"https://doi.org/10.1109/jssc.2014.2379265","mag":"2169735823"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2014.2379265","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2379265","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/7049386/07006708.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/4/7049386/07006708.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038559388","display_name":"Masoud Babaie","orcid":"https://orcid.org/0000-0001-7635-5324"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Masoud Babaie","raw_affiliation_strings":["Department of Electrical Engineering, Delft University of Technology, Delft, Zuid-Holland, The Netherlands","Department of Electrical Engineering, Delft University of Technology, Delft The Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Delft University of Technology, Delft, Zuid-Holland, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Department of Electrical Engineering, Delft University of Technology, Delft The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027017637","display_name":"Robert Bogdan Staszewski","orcid":"https://orcid.org/0000-0001-9848-1129"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]},{"id":"https://openalex.org/I100930933","display_name":"University College Dublin","ror":"https://ror.org/05m7pjf47","country_code":"IE","type":"education","lineage":["https://openalex.org/I100930933"]}],"countries":["IE","NL"],"is_corresponding":false,"raw_author_name":"Robert Bogdan Staszewski","raw_affiliation_strings":["Delft University of Technology, Delft, CD, The Netherlands","University College, Dublin, Ireland","Delft University of Technology, Delft, CD, The Netherlands; University College, Dublin, Ireland"],"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"University College, Dublin, Ireland","institution_ids":["https://openalex.org/I100930933"]},{"raw_affiliation_string":"Delft University of Technology, Delft, CD, The Netherlands; University College, Dublin, Ireland","institution_ids":["https://openalex.org/I98358874","https://openalex.org/I100930933"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5038559388"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":7.2996,"has_fulltext":true,"cited_by_count":106,"citation_normalized_percentile":{"value":0.97472899,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"50","issue":"3","first_page":"679","last_page":"692"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.822655975818634},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.8090252876281738},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.6062881350517273},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.5694947242736816},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5677613019943237},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5643264055252075},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48642992973327637},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43960145115852356},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4088842272758484},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.405911386013031},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35645410418510437},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3546639680862427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29268690943717957}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.822655975818634},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.8090252876281738},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.6062881350517273},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.5694947242736816},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5677613019943237},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5643264055252075},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48642992973327637},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43960145115852356},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4088842272758484},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.405911386013031},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35645410418510437},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3546639680862427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29268690943717957}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/jssc.2014.2379265","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2379265","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/7049386/07006708.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:researchrepository.ucd.ie:10197/7319","is_oa":true,"landing_page_url":"http://hdl.handle.net/10197/7319","pdf_url":"http://hdl.handle.net/10197/7319","source":{"id":"https://openalex.org/S4306402280","display_name":"Research Repository UCD (University College Dublin)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100930933","host_organization_name":"University College Dublin","host_organization_lineage":["https://openalex.org/I100930933"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:tud:oai:tudelft.nl:uuid:954919b2-273e-4be0-8160-1e376cfb7408","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:954919b2-273e-4be0-8160-1e376cfb7408","pdf_url":"http://resolver.tudelft.nl/uuid:954919b2-273e-4be0-8160-1e376cfb7408","source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Journal of Solid-State Circuits, 50 (3), 2015","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/jssc.2014.2379265","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2379265","pdf_url":"https://ieeexplore.ieee.org/ielx7/4/7049386/07006708.pdf","source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2169735823.pdf","grobid_xml":"https://content.openalex.org/works/W2169735823.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1907766519","https://openalex.org/W1968052665","https://openalex.org/W1983554950","https://openalex.org/W1987471704","https://openalex.org/W1999937163","https://openalex.org/W2005735336","https://openalex.org/W2007792906","https://openalex.org/W2011862369","https://openalex.org/W2019684161","https://openalex.org/W2020373460","https://openalex.org/W2050645980","https://openalex.org/W2055978681","https://openalex.org/W2065727956","https://openalex.org/W2067999683","https://openalex.org/W2068450074","https://openalex.org/W2088606459","https://openalex.org/W2098907338","https://openalex.org/W2099064239","https://openalex.org/W2104340505","https://openalex.org/W2107145322","https://openalex.org/W2111565821","https://openalex.org/W2120448564","https://openalex.org/W2128128047","https://openalex.org/W2135143797","https://openalex.org/W2163805657","https://openalex.org/W2535569897","https://openalex.org/W2891483507"],"related_works":["https://openalex.org/W2141726610","https://openalex.org/W2061664740","https://openalex.org/W1964543336","https://openalex.org/W4242529045","https://openalex.org/W2057338677","https://openalex.org/W4236967454","https://openalex.org/W2105518569","https://openalex.org/W2112742062","https://openalex.org/W2589125258","https://openalex.org/W2911266525"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,25,50,55],"new":[6],"class":[7],"of":[8,10,37,60,99,137,153],"operation":[9],"an":[11,42,150],"RF":[12],"oscillator":[13,103],"that":[14],"minimizes":[15],"its":[16,83],"phase":[17,68,91,135],"noise.":[18,96],"The":[19,97,166],"main":[20],"idea":[21],"is":[22,104,128,170],"to":[23,49,93,149],"enforce":[24],"clipped":[26],"voltage":[27,40,78],"waveform":[28],"around":[29],"the":[30,35,57,61,66,76,90,100,163],"LC":[31],"tank":[32],"by":[33],"increasing":[34],"second-harmonic":[36],"fundamental":[38],"oscillation":[39],"through":[41],"additional":[43],"impedance":[44],"peak,":[45],"thus":[46],"giving":[47],"rise":[48],"class-F":[51,101],"2":[52,102,115,159],"operation.":[53],"As":[54],"result,":[56],"noise":[58,69,136],"contribution":[59],"tail":[62],"current":[63,80],"transistor":[64],"on":[65],"total":[67],"can":[70],"be":[71],"significantly":[72],"decreased":[73],"without":[74],"sacrificing":[75],"oscillator's":[77],"and":[79],"efficiencies.":[81],"Furthermore,":[82],"special":[84],"impulse":[85],"sensitivity":[86,92],"function":[87],"(ISF)":[88],"reduces":[89],"thermal":[94],"circuit":[95],"prototype":[98],"implemented":[105],"in":[106],"standard":[107],"TSMC":[108],"65":[109],"nm":[110],"CMOS":[111],"occupying":[112],"0.2":[113],"mm":[114],".":[116],"It":[117,133],"draws":[118],"32-38":[119],"mA":[120],"from":[121,144],"1.3":[122],"V":[123],"supply.":[124],"Its":[125],"tuning":[126,164],"range":[127],"19%":[129],"covering":[130],"7.2-8.8":[131],"GHz.":[132],"exhibits":[134],"-139":[138],"dBc/Hz":[139,155],"at":[140],"3":[141],"MHz":[142],"offset":[143],"8.7":[145],"GHz":[146],"carrier,":[147],"translated":[148],"average":[151],"figure-of-merit":[152],"191":[154],"with":[156,173],"less":[157],"than":[158],"dB":[160],"variation":[161],"across":[162],"range.":[165],"long":[167],"term":[168],"reliability":[169],"also":[171],"investigated":[172],"estimated":[174],">10":[175],"year":[176],"lifetime.":[177]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":16},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":10},{"year":2015,"cited_by_count":9}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}