{"id":"https://openalex.org/W2058483530","doi":"https://doi.org/10.1109/jssc.2014.2362853","title":"Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction","display_name":"Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction","publication_year":2014,"publication_date":"2014-10-31","ids":{"openalex":"https://openalex.org/W2058483530","doi":"https://doi.org/10.1109/jssc.2014.2362853","mag":"2058483530"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2014.2362853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2362853","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002874074","display_name":"Masanori Natsui","orcid":"https://orcid.org/0000-0001-7424-4663"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masanori Natsui","raw_affiliation_strings":["Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005147311","display_name":"Daisuke Suzuki","orcid":"https://orcid.org/0000-0002-8329-5734"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Suzuki","raw_affiliation_strings":["Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046800775","display_name":"Noboru Sakimura","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noboru Sakimura","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075000622","display_name":"Ryusuke Nebashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryusuke Nebashi","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005055352","display_name":"Y. Tsuji","orcid":"https://orcid.org/0000-0003-4814-2887"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukihide Tsuji","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108467315","display_name":"A. Morioka","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ayuka Morioka","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111921651","display_name":"Tadahiko Sugibayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadahiko Sugibayashi","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046409450","display_name":"S. Miura","orcid":"https://orcid.org/0000-0001-5603-3205"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sadahiko Miura","raw_affiliation_strings":["NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Green Platform Research Laboratories, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035295738","display_name":"H. Honjo","orcid":"https://orcid.org/0000-0002-5742-108X"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Honjo","raw_affiliation_strings":["NEC Corporation, Tsukuba, Japan","Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083467150","display_name":"Kentaro Kinoshita","orcid":"https://orcid.org/0000-0001-8684-229X"},"institutions":[{"id":"https://openalex.org/I4210125833","display_name":"Spintronics Research Network of Japan","ror":"https://ror.org/03bbyax37","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I203951103","https://openalex.org/I4210125833","https://openalex.org/I74801974","https://openalex.org/I98285908"]},{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keizo Kinoshita","raw_affiliation_strings":["Onogawa, Tsukuba, JAPAN","Tohoku University, Center for Spintronics Integrated Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Onogawa, Tsukuba, JAPAN","institution_ids":[]},{"raw_affiliation_string":"Tohoku University, Center for Spintronics Integrated Systems, Sendai, Japan","institution_ids":["https://openalex.org/I4210125833","https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012267283","display_name":"Shoji Ikeda","orcid":"https://orcid.org/0000-0002-3925-4089"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Ikeda","raw_affiliation_strings":["Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083722186","display_name":"Tetsuo Endoh","orcid":"https://orcid.org/0000-0002-5583-3283"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuo Endoh","raw_affiliation_strings":["Tohoku University, Graduate School of Engineering, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Graduate School of Engineering, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081983682","display_name":"Hideo Ohno","orcid":"https://orcid.org/0000-0001-9688-8259"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Ohno","raw_affiliation_strings":["Tohoku University, Research Institute of Electrical Communication, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Research Institute of Electrical Communication, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062434040","display_name":"Takahiro Hanyu","orcid":"https://orcid.org/0000-0002-4397-8290"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Hanyu","raw_affiliation_strings":["Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku University, Center for Innovative Integrated Electronic Systems, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5002874074"],"corresponding_institution_ids":["https://openalex.org/I201537933"],"apc_list":null,"apc_paid":null,"fwci":3.9257,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.93986922,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"50","issue":"2","first_page":"476","last_page":"489"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.677115261554718},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5721539258956909},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4993727207183838},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.497635155916214},{"id":"https://openalex.org/keywords/programmable-logic-device","display_name":"Programmable logic device","score":0.45275378227233887},{"id":"https://openalex.org/keywords/gating","display_name":"Gating","score":0.4465048611164093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4231805205345154},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41490116715431213},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3904542922973633},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33963465690612793},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24849840998649597},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21057286858558655},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.12520819902420044}],"concepts":[{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.677115261554718},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5721539258956909},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4993727207183838},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.497635155916214},{"id":"https://openalex.org/C206274596","wikidata":"https://www.wikidata.org/wiki/Q1063837","display_name":"Programmable logic device","level":2,"score":0.45275378227233887},{"id":"https://openalex.org/C194544171","wikidata":"https://www.wikidata.org/wiki/Q21105679","display_name":"Gating","level":2,"score":0.4465048611164093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4231805205345154},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41490116715431213},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3904542922973633},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33963465690612793},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24849840998649597},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21057286858558655},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.12520819902420044},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C42407357","wikidata":"https://www.wikidata.org/wiki/Q521","display_name":"Physiology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2014.2362853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2362853","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320325836","display_name":"Tokyo University of Agriculture and Technology","ror":"https://ror.org/00qg0kr10"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1977773606","https://openalex.org/W1978047040","https://openalex.org/W1979290174","https://openalex.org/W1982398126","https://openalex.org/W1994065394","https://openalex.org/W2001809292","https://openalex.org/W2008604842","https://openalex.org/W2022691368","https://openalex.org/W2032558960","https://openalex.org/W2047540651","https://openalex.org/W2048344562","https://openalex.org/W2062349132","https://openalex.org/W2064151456","https://openalex.org/W2067176830","https://openalex.org/W2067483345","https://openalex.org/W2076872062","https://openalex.org/W2077116387","https://openalex.org/W2085442213","https://openalex.org/W2087234896","https://openalex.org/W2089356732","https://openalex.org/W2094797776","https://openalex.org/W2096445739","https://openalex.org/W2123740239","https://openalex.org/W2132111537","https://openalex.org/W2138670105","https://openalex.org/W2149623497","https://openalex.org/W2158863139","https://openalex.org/W2169801078","https://openalex.org/W2398602857","https://openalex.org/W2460159704","https://openalex.org/W6658403690","https://openalex.org/W6666491121","https://openalex.org/W6679871945","https://openalex.org/W6685169983","https://openalex.org/W6712653349","https://openalex.org/W6718654500"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2377919138","https://openalex.org/W2378857091","https://openalex.org/W4256502920","https://openalex.org/W2259094912","https://openalex.org/W2371329481","https://openalex.org/W2399345582","https://openalex.org/W4237548795","https://openalex.org/W1984480206","https://openalex.org/W1994172189"],"abstract_inverted_index":{"A":[0],"magnetic":[1],"tunnel":[2],"junction":[3],"(MTJ)-based":[4],"logic-in-memory":[5],"hardware":[6],"accelerator":[7],"LSI":[8,41,115],"with":[9,50],"cycle-based":[10],"power":[11,36],"gating":[12],"is":[13,42],"fabricated":[14,69,78],"using":[15,116],"a":[16,22,61,91],"90":[17],"nm":[18],"MTJ/MOS":[19],"process":[20],"on":[21],"300":[23],"mm":[24],"wafer":[25],"fabrication":[26],"line":[27],"for":[28,111],"practical-scale,":[29],"fully":[30],"parallel":[31],"motion-vector":[32],"prediction,":[33],"without":[34],"wasted":[35],"dissipation.":[37],"The":[38],"proposed":[39],"nonvolatile":[40,117],"designed":[43],"by":[44,67],"establishing":[45],"an":[46],"automated":[47,108],"design":[48,109],"environment":[49,110],"MTJ-based":[51],"logic-circuit":[52],"IPs":[53],"and":[54,102],"peripheral":[55],"assistant":[56],"tools,":[57],"as":[58,60],"well":[59],"precise":[62],"MTJ":[63,100],"device":[64,101],"model":[65],"produced":[66],"the":[68,73,77,84,87,96,99,103,106],"test":[70],"chips.":[71],"Through":[72],"measurement":[74],"results":[75],"of":[76,86,98,105],"LSI,":[79],"this":[80],"study":[81],"shows":[82],"both":[83],"impact":[85],"power-gating":[88],"technique":[89],"in":[90],"fine":[92],"temporal":[93],"granularity":[94],"utilizing":[95],"non-volatility":[97],"effectiveness":[104],"established":[107],"designing":[112],"random":[113],"logic":[114],"logic-in-memory.":[118]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}