{"id":"https://openalex.org/W2016619833","doi":"https://doi.org/10.1109/jssc.2014.2316219","title":"Scalable 0.35 V to 1.2 V SRAM Bitcell Design From 65 nm CMOS to 28 nm FDSOI","display_name":"Scalable 0.35 V to 1.2 V SRAM Bitcell Design From 65 nm CMOS to 28 nm FDSOI","publication_year":2014,"publication_date":"2014-04-24","ids":{"openalex":"https://openalex.org/W2016619833","doi":"https://doi.org/10.1109/jssc.2014.2316219","mag":"2016619833"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2014.2316219","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2316219","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102010427","display_name":"Fady Abouzeid","orcid":"https://orcid.org/0000-0001-8711-0664"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":true,"raw_author_name":"Fady Abouzeid","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047131832","display_name":"Audrey Bienfait","orcid":"https://orcid.org/0000-0002-2927-1037"},"institutions":[{"id":"https://openalex.org/I127558574","display_name":"DSM (Netherlands)","ror":"https://ror.org/00k01kt20","country_code":"NL","type":"company","lineage":["https://openalex.org/I127558574"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Audrey Bienfait","raw_affiliation_strings":["CEA/ DSM/ IRAMIS/SPEC/QUANTRONICS GROUP, Gif-sur-Yvette, Cedex","CEA/ DSM/ IRAMIS/SPEC/QUANTRONICS GROUP, Gif-sur-Yvette"],"affiliations":[{"raw_affiliation_string":"CEA/ DSM/ IRAMIS/SPEC/QUANTRONICS GROUP, Gif-sur-Yvette, Cedex","institution_ids":["https://openalex.org/I127558574"]},{"raw_affiliation_string":"CEA/ DSM/ IRAMIS/SPEC/QUANTRONICS GROUP, Gif-sur-Yvette","institution_ids":["https://openalex.org/I127558574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073499418","display_name":"Kaya Can Akyel","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Kaya Can Akyel","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009134887","display_name":"Anis F\u00e9ki","orcid":"https://orcid.org/0000-0002-9817-9445"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Anis Feki","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003876121","display_name":"Sylvain Clerc","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Sylvain Clerc","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024938018","display_name":"L. Ciampolini","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Lorenzo Ciampolini","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010826190","display_name":"F. Giner","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Fabien Giner","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109569165","display_name":"Robin Wilson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Robin Wilson","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111893673","display_name":"Philippe Roch\u00e9","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Philippe Roche","raw_affiliation_strings":["STMicroelectronics, Crolles, Cedex, France","[STMicroelectronics Crolles France]"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, Cedex, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5102010427"],"corresponding_institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":2.7659,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.91213244,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"49","issue":"7","first_page":"1499","last_page":"1505"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8432809114456177},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7638833522796631},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.639640212059021},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6111292839050293},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5851877331733704},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.5450173020362854},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5388460159301758},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5117730498313904},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.46704357862472534},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41218698024749756},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34553951025009155},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2982091009616852},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.2781338691711426},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21492016315460205}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8432809114456177},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7638833522796631},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.639640212059021},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6111292839050293},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5851877331733704},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.5450173020362854},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5388460159301758},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5117730498313904},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.46704357862472534},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41218698024749756},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34553951025009155},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2982091009616852},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.2781338691711426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21492016315460205},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2014.2316219","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2316219","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1998894515","https://openalex.org/W2014039723","https://openalex.org/W2016655135","https://openalex.org/W2033922263","https://openalex.org/W2041446224","https://openalex.org/W2080326481","https://openalex.org/W2094337739","https://openalex.org/W2095953597","https://openalex.org/W2099087448","https://openalex.org/W2116100358","https://openalex.org/W2122144284","https://openalex.org/W2124433229","https://openalex.org/W2158715350","https://openalex.org/W2159133228","https://openalex.org/W2159375591","https://openalex.org/W2908089652","https://openalex.org/W4236811439","https://openalex.org/W4255246482","https://openalex.org/W6658587840","https://openalex.org/W6677415780","https://openalex.org/W6683085269","https://openalex.org/W6683518350","https://openalex.org/W6818034446"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2771786520","https://openalex.org/W3151633427","https://openalex.org/W2810180604","https://openalex.org/W2325281603","https://openalex.org/W2042526628","https://openalex.org/W2027381561","https://openalex.org/W2018483002","https://openalex.org/W4241238243"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,11,33,60,72,84],"method":[4,39],"for":[5],"the":[6,100],"design":[7],"and":[8,32,45,110],"characterization":[9],"of":[10],"scalable":[12],"ultra-wide":[13],"voltage":[14,86],"range":[15],"static":[16,44],"random":[17],"access":[18],"memory":[19,63,75],"using":[20],"an":[21],"optimized":[22],"10":[23],"transistor":[24],"bitcell,":[25],"targeting":[26],"minimum":[27],"operating":[28],"voltage,":[29,102],"high":[30,97],"yield":[31],"Silicon-CAD":[34],"correlation":[35],"within":[36],"5%.":[37],"The":[38,48],"is":[40,81],"based":[41],"on":[42,59,71],"both":[43],"dynamic":[46],"metrics.":[47],"experimental":[49],"validation":[50],"was":[51],"first":[52],"performed":[53],"in":[54,67,106,113],"BULK":[55,109],"CMOS":[56],"65":[57,107],"nm":[58,69,108,115],"32":[61],"kb":[62,74],"array,":[64],"then":[65],"applied":[66],"28":[68,114],"FDSOI":[70],"64":[73],"array.":[76],"Over":[77],"10\u00d7":[78],"energy":[79],"reduction":[80],"achieved":[82],"across":[83],"wide":[85],"range,":[87],"i.e.,":[88,103],"from":[89],"1.2":[90],"V":[91,94],"to":[92],"0.35":[93],"while":[95],"achieving":[96],"speed":[98],"at":[99],"nominal":[101],"485":[104],"MHz":[105],"1":[111],"GHz":[112],"FDSOI.":[116]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}