{"id":"https://openalex.org/W2019274525","doi":"https://doi.org/10.1109/jssc.2014.2300199","title":"A 10-Bit 800-MHz 19-mW CMOS ADC","display_name":"A 10-Bit 800-MHz 19-mW CMOS ADC","publication_year":2014,"publication_date":"2014-01-31","ids":{"openalex":"https://openalex.org/W2019274525","doi":"https://doi.org/10.1109/jssc.2014.2300199","mag":"2019274525"},"language":"nl","primary_location":{"id":"doi:10.1109/jssc.2014.2300199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2300199","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033562869","display_name":"Shiuh-Hua Wood Chiang","orcid":"https://orcid.org/0000-0001-8091-6569"},"institutions":[{"id":"https://openalex.org/I4210140791","display_name":"Irvine University","ror":"https://ror.org/04ysmca02","country_code":"US","type":"education","lineage":["https://openalex.org/I4210140791"]},{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]},{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shiuh-Hua Wood Chiang","raw_affiliation_strings":["Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","institution_ids":["https://openalex.org/I4210140791","https://openalex.org/I161318765","https://openalex.org/I204250578"]},{"raw_affiliation_string":"Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076497414","display_name":"Hyuk Sun","orcid":"https://orcid.org/0000-0001-5838-0075"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]},{"id":"https://openalex.org/I4210140791","display_name":"Irvine University","ror":"https://ror.org/04ysmca02","country_code":"US","type":"education","lineage":["https://openalex.org/I4210140791"]},{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyuk Sun","raw_affiliation_strings":["Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","institution_ids":["https://openalex.org/I4210140791","https://openalex.org/I161318765","https://openalex.org/I204250578"]},{"raw_affiliation_string":"Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049567991","display_name":"Behzad Razavi","orcid":"https://orcid.org/0000-0003-1168-9205"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]},{"id":"https://openalex.org/I4210140791","display_name":"Irvine University","ror":"https://ror.org/04ysmca02","country_code":"US","type":"education","lineage":["https://openalex.org/I4210140791"]},{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Behzad Razavi","raw_affiliation_strings":["Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of California, Irvine, Los Angeles, CA","institution_ids":["https://openalex.org/I4210140791","https://openalex.org/I161318765","https://openalex.org/I204250578"]},{"raw_affiliation_string":"Electr. Eng. Dept., Univ. of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5033562869"],"corresponding_institution_ids":["https://openalex.org/I161318765","https://openalex.org/I204250578","https://openalex.org/I4210140791"],"apc_list":null,"apc_paid":null,"fwci":5.7916,"has_fulltext":false,"cited_by_count":82,"citation_normalized_percentile":{"value":0.96509745,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"49","issue":"4","first_page":"935","last_page":"949"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.831997275352478},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5622196793556213},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.544649064540863},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5363219380378723},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5050461888313293},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.48234838247299194},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4646987318992615},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.45090311765670776},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44628873467445374},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.41156211495399475},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4114833474159241},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3852262496948242},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3187282085418701},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.2653622329235077},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2471044361591339},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.22324657440185547},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.20537838339805603}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.831997275352478},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5622196793556213},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.544649064540863},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5363219380378723},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5050461888313293},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.48234838247299194},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4646987318992615},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.45090311765670776},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44628873467445374},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.41156211495399475},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4114833474159241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3852262496948242},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3187282085418701},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.2653622329235077},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2471044361591339},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.22324657440185547},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.20537838339805603},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2014.2300199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2014.2300199","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1483413032","https://openalex.org/W1967180561","https://openalex.org/W1977030506","https://openalex.org/W2003916130","https://openalex.org/W2015794844","https://openalex.org/W2020486311","https://openalex.org/W2064594344","https://openalex.org/W2095658739","https://openalex.org/W2099731160","https://openalex.org/W2101468035","https://openalex.org/W2106999185","https://openalex.org/W2109289538","https://openalex.org/W2118524348","https://openalex.org/W2119601365","https://openalex.org/W2124222653","https://openalex.org/W2128413723","https://openalex.org/W2149641475","https://openalex.org/W2163359472","https://openalex.org/W2163826094","https://openalex.org/W2172010302","https://openalex.org/W3136483495","https://openalex.org/W4249558463","https://openalex.org/W6655109629","https://openalex.org/W6666345469"],"related_works":["https://openalex.org/W2411923897","https://openalex.org/W4285347720","https://openalex.org/W3014521742","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W1911569504","https://openalex.org/W2964424296","https://openalex.org/W2533295986","https://openalex.org/W2542076270"],"abstract_inverted_index":{"A":[0],"pipelined":[1],"ADC":[2,69],"employs":[3],"charge-steering":[4],"op":[5,18],"amps":[6,19],"to":[7],"relax":[8],"the":[9],"trade-offs":[10],"among":[11],"speed,":[12],"noise,":[13],"and":[14,26,37,43,61],"power":[15,35],"consumption.":[16],"Such":[17],"afford":[20],"a":[21,27,33,47,55,72],"fourfold":[22],"increase":[23],"in":[24,30,50],"speed":[25],"twofold":[28],"reduction":[29],"noise":[31],"for":[32],"given":[34],"consumption":[36],"voltage":[38],"gain.":[39],"Applying":[40],"full-rate":[41],"nonlinearity":[42],"gain":[44],"error":[45],"calibration,":[46],"prototype":[48],"realized":[49],"65-nm":[51],"CMOS":[52],"technology":[53],"exhibits":[54],"Nyquist":[56],"SNDR":[57],"of":[58],"52.2":[59],"dB":[60],"draws":[62],"19":[63],"mW":[64],"at":[65],"800":[66],"MHz.":[67],"The":[68],"also":[70],"demonstrates":[71],"new":[73],"histogram-based":[74],"background":[75],"calibration":[76],"technique.":[77]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":13},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}