{"id":"https://openalex.org/W2164567793","doi":"https://doi.org/10.1109/jssc.2013.2297417","title":"Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme","display_name":"Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme","publication_year":2014,"publication_date":"2014-01-31","ids":{"openalex":"https://openalex.org/W2164567793","doi":"https://doi.org/10.1109/jssc.2013.2297417","mag":"2164567793"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2013.2297417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2013.2297417","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023225287","display_name":"Meng\u2010Fan Chang","orcid":"https://orcid.org/0000-0001-6905-6350"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Meng-Fan Chang","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023453353","display_name":"Chia-Chen Kuo","orcid":"https://orcid.org/0000-0002-7672-377X"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chia-Chen Kuo","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112150802","display_name":"Shyh-Shyuan Sheu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shyh-Shyuan Sheu","raw_affiliation_strings":["EOL, ITRI, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EOL, ITRI, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023656341","display_name":"Chorng-Jung Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chorng-Jung Lin","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085948014","display_name":"Ya\u2010Chin King","orcid":"https://orcid.org/0000-0003-4065-0350"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ya-Chin King","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057482445","display_name":"Frederick T. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Frederick T. Chen","raw_affiliation_strings":["EOL, ITRI, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EOL, ITRI, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068496383","display_name":"Tzu-Kun Ku","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzu-Kun Ku","raw_affiliation_strings":["EOL, ITRI, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EOL, ITRI, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108417335","display_name":"Ming\u2010Jinn Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Jinn Tsai","raw_affiliation_strings":["EOL, ITRI, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EOL, ITRI, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102085839","display_name":"Jui-Jen Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jui-Jen Wu","raw_affiliation_strings":["DTP, TSMC, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DTP, TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108829163","display_name":"Yue\u2010Der Chih","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yue-Der Chih","raw_affiliation_strings":["DTP, TSMC, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DTP, TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0909,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.88348899,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"49","issue":"4","first_page":"908","last_page":"916"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.6828984618186951},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.6414626836776733},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4568113386631012},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.4427567422389984},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43734613060951233},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32423415780067444},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2707306146621704},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.26987361907958984},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.242356538772583},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23563170433044434},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15018442273139954},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09461206197738647}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.6828984618186951},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.6414626836776733},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4568113386631012},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.4427567422389984},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43734613060951233},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32423415780067444},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2707306146621704},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.26987361907958984},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.242356538772583},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23563170433044434},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15018442273139954},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09461206197738647}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2013.2297417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2013.2297417","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"},{"id":"https://openalex.org/F4320323092","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1549725729","https://openalex.org/W1811048333","https://openalex.org/W1997388392","https://openalex.org/W1999458342","https://openalex.org/W1999506977","https://openalex.org/W2020647206","https://openalex.org/W2027342132","https://openalex.org/W2039053368","https://openalex.org/W2051736202","https://openalex.org/W2105408739","https://openalex.org/W2114001543","https://openalex.org/W2124673785","https://openalex.org/W2154474882","https://openalex.org/W2161941625","https://openalex.org/W2168972302","https://openalex.org/W2178102281","https://openalex.org/W2221855158","https://openalex.org/W2545789532","https://openalex.org/W2546250013","https://openalex.org/W6632791987","https://openalex.org/W6638413975","https://openalex.org/W6649860485","https://openalex.org/W6650345545","https://openalex.org/W6678448230","https://openalex.org/W6683782459","https://openalex.org/W6684474170","https://openalex.org/W6685295466","https://openalex.org/W6729481744"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2054635671","https://openalex.org/W2545245183","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2078381924","https://openalex.org/W4206468571","https://openalex.org/W2199653281"],"abstract_inverted_index":{"The":[0],"design":[1],"of":[2,69,93,110],"resistive":[3],"RAM":[4],"(ReRAM)":[5],"faces":[6],"two":[7],"major":[8],"challenges:":[9],"1)":[10],"cell":[11,19,40],"area":[12],"versus":[13,23],"write":[14,56],"current":[15,21,57],"requirements":[16],"and":[17,37,99],"2)":[18],"read":[20,24,89,117],"($I_{CELL}$)":[22],"disturbance.":[25],"This":[26],"paper":[27],"proposes":[28],"ReRAM":[29,53,105],"macros":[30,106],"using":[31],"logic-process-based":[32],"vertical":[33],"parasitic-BJT":[34],"(VPBJT)":[35],"switches":[36],"a":[38,45,73],"corresponding":[39],"array":[41],"(VPBJT-CA),":[42],"resulting":[43,113],"in":[44,63,114],"4.5\u00d7":[46],"macro":[47],"density":[48],"compared":[49],"to":[50,80],"conventional":[51],"NMOS-switch":[52],"for":[54],"given":[55],"requirements.":[58],"To":[59],"overcome":[60],"temperature-dependent":[61],"fluctuations":[62],"the":[64,108,111],"base-emitter":[65],"voltage":[66,77],"difference":[67],"($V_{BE}$)":[68],"VPBJT,":[70],"we":[71],"propose":[72],"temperature-aware":[74],"bitline":[75],"(BL)":[76],"bias$(V_{BL-R})$(TABB)":[78],"scheme":[79],"provide":[81],"current-mode":[82],"sensing":[83],"with":[84],"4.7\u00d7":[85],"larger$I_{CELL}$and":[86],"1.6\u00d7":[87],"faster":[88],"speeds.":[90],"Test":[91],"results":[92],"fabricated":[94],"0.18":[95],"\u00b5m":[96],"1":[97],"Mb":[98,103],"65":[100],"nm":[101],"2":[102],"VPBJT":[104],"confirm":[107],"efficacy":[109],"temperature-aware$V_{BL-R}$,":[112],"sub-5-ns":[115],"random":[116],"access":[118],"times.":[119]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}