{"id":"https://openalex.org/W1979318985","doi":"https://doi.org/10.1109/jssc.2013.2297402","title":"A 0.45\u20131 V Fully-Integrated Distributed Switched Capacitor DC-DC Converter With High Density MIM Capacitor in 22 nm Tri-Gate CMOS","display_name":"A 0.45\u20131 V Fully-Integrated Distributed Switched Capacitor DC-DC Converter With High Density MIM Capacitor in 22 nm Tri-Gate CMOS","publication_year":2014,"publication_date":"2014-02-11","ids":{"openalex":"https://openalex.org/W1979318985","doi":"https://doi.org/10.1109/jssc.2013.2297402","mag":"1979318985"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2013.2297402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2013.2297402","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111558720","display_name":"Rinkle Jain","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Rinkle Jain","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065471436","display_name":"Bibiche Geuskens","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bibiche M. Geuskens","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025226668","display_name":"Stephen T. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen T. Kim","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036997390","display_name":"Muhammad Khellah","orcid":"https://orcid.org/0000-0001-9651-5639"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muhammad M. Khellah","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003048953","display_name":"Jaydeep P. Kulkarni","orcid":"https://orcid.org/0000-0002-0258-6776"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaydeep Kulkarni","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067753561","display_name":"James Tschanz","orcid":"https://orcid.org/0000-0003-0317-4332"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James W. Tschanz","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076642880","display_name":"Vivek De","orcid":"https://orcid.org/0000-0001-5207-1079"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vivek De","raw_affiliation_strings":["Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Circuit Research Lab, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Circuit Res. Labs, Intel Corp., Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5111558720"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":10.2125,"has_fulltext":false,"cited_by_count":95,"citation_normalized_percentile":{"value":0.98588214,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":100},"biblio":{"volume":"49","issue":"4","first_page":"917","last_page":"927"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11230","display_name":"Innovative Energy Harvesting Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.727851927280426},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6971093416213989},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6558043956756592},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5611751079559326},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5265733599662781},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.505704402923584},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4457210898399353},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3510103225708008},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34657198190689087},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33544376492500305},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25435343384742737},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19326984882354736},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.06824389100074768}],"concepts":[{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.727851927280426},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6971093416213989},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6558043956756592},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5611751079559326},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5265733599662781},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.505704402923584},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4457210898399353},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3510103225708008},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34657198190689087},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33544376492500305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25435343384742737},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19326984882354736},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.06824389100074768},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2013.2297402","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2013.2297402","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1668910163","https://openalex.org/W1969269883","https://openalex.org/W1971634392","https://openalex.org/W2072607061","https://openalex.org/W2078398926","https://openalex.org/W2097324958","https://openalex.org/W2099649318","https://openalex.org/W2101987266","https://openalex.org/W2115664328","https://openalex.org/W2121024086","https://openalex.org/W2121623496","https://openalex.org/W2129879525","https://openalex.org/W2158552598","https://openalex.org/W2162517322","https://openalex.org/W2170109093","https://openalex.org/W6637350122","https://openalex.org/W6668441287","https://openalex.org/W6685003241"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2354365353","https://openalex.org/W1988437325","https://openalex.org/W2347585086","https://openalex.org/W3212531278","https://openalex.org/W2099626417","https://openalex.org/W2019514496","https://openalex.org/W3129126528","https://openalex.org/W2354552488","https://openalex.org/W2124313625"],"abstract_inverted_index":{"A":[0],"fully":[1],"integrated":[2],"switched":[3],"capacitor":[4],"voltage":[5,37,46,166],"regulator":[6,167],"(SCVR)":[7],"with":[8,110,122],"on-die":[9],"high":[10],"density":[11,61,105],"MIM":[12],"capacitor,":[13],"distributed":[14],"across":[15,137],"a":[16,34,43,57,170],"14":[17],"KB":[18],"register":[19],"file":[20],"(RF)":[21],"load":[22,59,78,139],"is":[23,79,83,156],"demonstrated":[24],"in":[25,89,150],"22":[26],"nm":[27],"tri-gate":[28],"CMOS.":[29],"The":[30,69,129,145],"multi-conversion-ratio":[31],"SCVR":[32,75,124],"provides":[33],"wide":[35],"output":[36],"range":[38],"of":[39,47,62,72,114,153],"0.45-1":[40],"V":[41],"from":[42],"fixed":[44],"input":[45],"1.225":[48],"V.":[49],"It":[50],"achieves":[51],"63-84%":[52],"conversion":[53,101],"efficiency":[54,102],"and":[55,103,125,140,183],"supports":[56],"maximum":[58,181],"current":[60,104],"0.88":[63],"A/mm":[64],"<sup":[65],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[66],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[67],".":[68],"area":[70,184],"overhead":[71],"the":[73,77,123,126,138,151],"dedicated":[74],"on":[76,85,93],"3.6%.":[80],"Measured":[81],"data":[82],"presented":[84],"various":[86,96],"performance":[87],"indices":[88],"detail.":[90],"Subsequent":[91],"learning":[92],"tradeoffs":[94],"between":[95],"factors":[97],"like":[98],"capacitance":[99],"characteristics,":[100],"are":[106],"delineated":[107],"and,":[108],"correlated":[109],"theoretical":[111],"estimates.":[112],"Performance":[113],"RF":[115],"array":[116],"shows":[117],"comparable":[118],"results":[119],"when":[120],"powered":[121],"external":[127],"rail.":[128],"all-digital,":[130],"modular":[131],"design":[132],"allows":[133],"efficient":[134],"spatial":[135],"distribution":[136],"hence":[141],"robust":[142],"power":[143,161],"delivery.":[144],"extremely":[146],"fast":[147],"response":[148],"times":[149],"order":[152],"few":[154],"nanoseconds":[155],"targeted":[157],"to":[158],"benefit":[159],"agile":[160],"management.":[162],"This":[163],"work":[164],"evinces":[165],"technology":[168],"as":[169],"standard":[171],"homogenous":[172],"CMOS":[173],"component,":[174],"which":[175],"can":[176],"proliferate":[177],"DVFS":[178],"domains":[179],"for":[180],"energy":[182],"benefits.":[185]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":18},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":6}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}