{"id":"https://openalex.org/W2053286848","doi":"https://doi.org/10.1109/jssc.2012.2227607","title":"A 100-m Range 10-Frame/s 340$\\,\\times\\, $96-Pixel Time-of-Flight Depth Sensor in 0.18-$\\mu\\hbox{m}$ CMOS","display_name":"A 100-m Range 10-Frame/s 340$\\,\\times\\, $96-Pixel Time-of-Flight Depth Sensor in 0.18-$\\mu\\hbox{m}$ CMOS","publication_year":2013,"publication_date":"2013-01-24","ids":{"openalex":"https://openalex.org/W2053286848","doi":"https://doi.org/10.1109/jssc.2012.2227607","mag":"2053286848"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2012.2227607","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2227607","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069051247","display_name":"Cristiano Niclass","orcid":"https://orcid.org/0000-0001-8264-5408"},"institutions":[{"id":"https://openalex.org/I1293612202","display_name":"Toyota Motor Corporation (Switzerland)","ror":"https://ror.org/05p0pbv75","country_code":"CH","type":"company","lineage":["https://openalex.org/I1293612202","https://openalex.org/I4210125472","https://openalex.org/I4210137853"]},{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Cristiano Niclass","raw_affiliation_strings":["Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","institution_ids":["https://openalex.org/I4210165351"]},{"raw_affiliation_string":"Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan","institution_ids":["https://openalex.org/I1293612202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033497384","display_name":"Mineki Soga","orcid":null},"institutions":[{"id":"https://openalex.org/I1293612202","display_name":"Toyota Motor Corporation (Switzerland)","ror":"https://ror.org/05p0pbv75","country_code":"CH","type":"company","lineage":["https://openalex.org/I1293612202","https://openalex.org/I4210125472","https://openalex.org/I4210137853"]},{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Mineki Soga","raw_affiliation_strings":["Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","institution_ids":["https://openalex.org/I4210165351"]},{"raw_affiliation_string":"Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan","institution_ids":["https://openalex.org/I1293612202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103193312","display_name":"Hiroyuki Matsubara","orcid":"https://orcid.org/0000-0002-9279-5458"},"institutions":[{"id":"https://openalex.org/I1293612202","display_name":"Toyota Motor Corporation (Switzerland)","ror":"https://ror.org/05p0pbv75","country_code":"CH","type":"company","lineage":["https://openalex.org/I1293612202","https://openalex.org/I4210125472","https://openalex.org/I4210137853"]},{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Matsubara","raw_affiliation_strings":["Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","institution_ids":["https://openalex.org/I4210165351"]},{"raw_affiliation_string":"Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan","institution_ids":["https://openalex.org/I1293612202"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011165746","display_name":"Satoru Kato","orcid":"https://orcid.org/0000-0002-5590-8652"},"institutions":[{"id":"https://openalex.org/I1293612202","display_name":"Toyota Motor Corporation (Switzerland)","ror":"https://ror.org/05p0pbv75","country_code":"CH","type":"company","lineage":["https://openalex.org/I1293612202","https://openalex.org/I4210125472","https://openalex.org/I4210137853"]},{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Satoru Kato","raw_affiliation_strings":["Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","institution_ids":["https://openalex.org/I4210165351"]},{"raw_affiliation_string":"Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan","institution_ids":["https://openalex.org/I1293612202"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031008650","display_name":"Manabu Kagami","orcid":"https://orcid.org/0000-0001-6249-0859"},"institutions":[{"id":"https://openalex.org/I1293612202","display_name":"Toyota Motor Corporation (Switzerland)","ror":"https://ror.org/05p0pbv75","country_code":"CH","type":"company","lineage":["https://openalex.org/I1293612202","https://openalex.org/I4210125472","https://openalex.org/I4210137853"]},{"id":"https://openalex.org/I4210165351","display_name":"Toyota Central Research and Development Laboratories (Japan)","ror":"https://ror.org/05mjgqe69","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125472","https://openalex.org/I4210165351"]}],"countries":["CH","JP"],"is_corresponding":false,"raw_author_name":"Manabu Kagami","raw_affiliation_strings":["Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Electronics Research Division, Applied Optics Laboratory, Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi, Japan","institution_ids":["https://openalex.org/I4210165351"]},{"raw_affiliation_string":"Inf. & Electron. Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan","institution_ids":["https://openalex.org/I1293612202"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":43.927,"has_fulltext":false,"cited_by_count":220,"citation_normalized_percentile":{"value":0.99747475,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"48","issue":"2","first_page":"559","last_page":"572"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7358087301254272},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6471120715141296},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5702366828918457},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5606517791748047},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5418525338172913},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5387604832649231},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.46844273805618286},{"id":"https://openalex.org/keywords/time-of-flight","display_name":"Time of flight","score":0.4412654936313629},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.4323440194129944},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.42938217520713806},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4199782609939575},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2518194317817688},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23783481121063232},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23752188682556152},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.19382956624031067},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12572291493415833}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7358087301254272},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6471120715141296},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5702366828918457},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5606517791748047},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5418525338172913},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5387604832649231},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.46844273805618286},{"id":"https://openalex.org/C98960154","wikidata":"https://www.wikidata.org/wiki/Q3983322","display_name":"Time of flight","level":2,"score":0.4412654936313629},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.4323440194129944},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.42938217520713806},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4199782609939575},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2518194317817688},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23783481121063232},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23752188682556152},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.19382956624031067},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12572291493415833},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2012.2227607","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2227607","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320915","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052"},{"id":"https://openalex.org/F4320322622","display_name":"Toyota Motor Corporation","ror":"https://ror.org/02zqm6r10"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1975328031","https://openalex.org/W1975496472","https://openalex.org/W2009893859","https://openalex.org/W2016464725","https://openalex.org/W2019230763","https://openalex.org/W2029106456","https://openalex.org/W2038643807","https://openalex.org/W2053286848","https://openalex.org/W2053423586","https://openalex.org/W2054210605","https://openalex.org/W2091505087","https://openalex.org/W2098852067","https://openalex.org/W2099487702","https://openalex.org/W2102792607","https://openalex.org/W2103864821","https://openalex.org/W2117519497","https://openalex.org/W2131010094","https://openalex.org/W2135171485","https://openalex.org/W2139137304","https://openalex.org/W2141493752","https://openalex.org/W2154676620","https://openalex.org/W2155168576","https://openalex.org/W2169162190","https://openalex.org/W2578612933","https://openalex.org/W6677406754","https://openalex.org/W6682911615"],"related_works":["https://openalex.org/W1966119149","https://openalex.org/W2028671992","https://openalex.org/W2347245756","https://openalex.org/W2351312630","https://openalex.org/W3139631222","https://openalex.org/W2367429071","https://openalex.org/W2466718138","https://openalex.org/W2099015120","https://openalex.org/W2183250885","https://openalex.org/W2020270528"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,31,49,73,148,165,190,203],"single-photon":[4,60],"detection":[5],"technique":[6],"for":[7],"time-of-flight":[8],"distance":[9,157],"ranging":[10],"based":[11,55],"on":[12,56],"the":[13,44,47,98,117,136,156,171,174,184,197],"temporal":[14],"and":[15,107,124,129],"spatial":[16],"correlation":[17,91,105],"of":[18,33,46,59,68,82,86,96,100,110,116,127,135,159,168,186],"photons.":[19],"A":[20],"proof-of-concept":[21],"prototype":[22],"achieving":[23],"depth":[24,198],"imaging":[25],"up":[26],"to":[27,121,164,182],"100":[28,160],"meters":[29],"with":[30],"resolution":[32],"340":[34],"\u00d7":[35],"96":[36],"pixels":[37],"at":[38],"10":[39,153],"frames/s":[40],"was":[41,70,178,200],"implemented.":[42],"At":[43],"core":[45],"system,":[48],"sensor":[50,138,199],"chip":[51,77],"comprising":[52],"32":[53,83,111],"macro-pixels":[54],"an":[57,64,80,108],"array":[58,81,109,119],"avalanche":[61],"diodes":[62],"featuring":[63],"optical":[65],"fill":[66],"factor":[67],"70%":[69],"fabricated":[71],"in":[72,103,189,195,202],"0.18-\u03bcm":[74],"CMOS.":[75],"The":[76],"also":[78,208],"comprises":[79],"circuits":[84],"capable":[85],"generating":[87],"precise":[88],"triggers":[89],"upon":[90],"events":[92],"as":[93,95],"well":[94],"sampling":[97],"number":[99],"photons":[101],"involved":[102],"each":[104],"event,":[106],"12-b":[112],"time-to-digital":[113],"converters.":[114],"Characterization":[115],"TDC":[118],"led":[120],"-0.52":[122],"LSB":[123,126],"0.73":[125],"differential":[128],"integral":[130],"nonlinearities,":[131],"respectively.":[132],"Quantitative":[133],"evaluation":[134],"TOF":[137],"under":[139],"strong":[140],"solar":[141],"background":[142],"light,":[143],"i.e.,":[144],"80":[145],"klux,":[146],"revealed":[147],"repeatability":[149],"error":[150,177],"better":[151],"than":[152],"cm":[154],"throughout":[155],"range":[158],"m,":[161],"thus":[162],"leading":[163],"relative":[166,175],"precision":[167],"0.1%.":[169],"In":[170,180],"same":[172],"condition,":[173],"nonlinearity":[176],"0.37%.":[179],"order":[181],"show":[183],"suitability":[185],"our":[187],"approach":[188],"real-world":[191],"situation,":[192],"experimental":[193],"results":[194],"which":[196],"operated":[201],"typical":[204],"traffic":[205],"scenario":[206],"are":[207],"reported.":[209]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":17},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":24},{"year":2021,"cited_by_count":24},{"year":2020,"cited_by_count":15},{"year":2019,"cited_by_count":20},{"year":2018,"cited_by_count":17},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":15},{"year":2015,"cited_by_count":13},{"year":2014,"cited_by_count":20},{"year":2013,"cited_by_count":10},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}