{"id":"https://openalex.org/W1993138703","doi":"https://doi.org/10.1109/jssc.2012.2216217","title":"An 11-b 300-MS/s Double-Sampling Pipelined ADC With On-Chip Digital Calibration for Memory Effects","display_name":"An 11-b 300-MS/s Double-Sampling Pipelined ADC With On-Chip Digital Calibration for Memory Effects","publication_year":2012,"publication_date":"2012-09-30","ids":{"openalex":"https://openalex.org/W1993138703","doi":"https://doi.org/10.1109/jssc.2012.2216217","mag":"1993138703"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2012.2216217","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2216217","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011412701","display_name":"Takuji Miki","orcid":"https://orcid.org/0000-0002-0168-3304"},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Takuji Miki","raw_affiliation_strings":["Panasonic Corporation, Osaka, Japan","Panasonic Corp., Kadoma, Japan"],"affiliations":[{"raw_affiliation_string":"Panasonic Corporation, Osaka, Japan","institution_ids":["https://openalex.org/I1283155146"]},{"raw_affiliation_string":"Panasonic Corp., Kadoma, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100729080","display_name":"Takashi Morie","orcid":"https://orcid.org/0000-0003-2708-4307"},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Morie","raw_affiliation_strings":["Panasonic Corporation, Osaka, Japan","Panasonic Corp., Kadoma, Japan"],"affiliations":[{"raw_affiliation_string":"Panasonic Corporation, Osaka, Japan","institution_ids":["https://openalex.org/I1283155146"]},{"raw_affiliation_string":"Panasonic Corp., Kadoma, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027791847","display_name":"Toshiaki Ozeki","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiaki Ozeki","raw_affiliation_strings":["Panasonic Corporation, Osaka, Japan","Panasonic Corp., Kadoma, Japan"],"affiliations":[{"raw_affiliation_string":"Panasonic Corporation, Osaka, Japan","institution_ids":["https://openalex.org/I1283155146"]},{"raw_affiliation_string":"Panasonic Corp., Kadoma, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048987876","display_name":"Shiro Dosho","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shiro Dosho","raw_affiliation_strings":["Panasonic Corporation, Osaka, Japan","Panasonic Corp., Kadoma, Japan"],"affiliations":[{"raw_affiliation_string":"Panasonic Corporation, Osaka, Japan","institution_ids":["https://openalex.org/I1283155146"]},{"raw_affiliation_string":"Panasonic Corp., Kadoma, Japan","institution_ids":["https://openalex.org/I1283155146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5011412701"],"corresponding_institution_ids":["https://openalex.org/I1283155146"],"apc_list":null,"apc_paid":null,"fwci":1.0085,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.75148093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"47","issue":"11","first_page":"2773","last_page":"2782"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6546090841293335},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6450799703598022},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6340306997299194},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6228446960449219},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5615200996398926},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5387396216392517},{"id":"https://openalex.org/keywords/charge-sharing","display_name":"Charge sharing","score":0.5079692006111145},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.47206977009773254},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43819066882133484},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.42225706577301025},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29782164096832275},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20224907994270325},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1829419732093811},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.16924092173576355},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.16780009865760803},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.16048982739448547},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12697100639343262},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12361261248588562},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07972192764282227}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6546090841293335},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6450799703598022},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6340306997299194},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6228446960449219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5615200996398926},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5387396216392517},{"id":"https://openalex.org/C2781179661","wikidata":"https://www.wikidata.org/wiki/Q5074272","display_name":"Charge sharing","level":3,"score":0.5079692006111145},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.47206977009773254},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43819066882133484},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.42225706577301025},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29782164096832275},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20224907994270325},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1829419732093811},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.16924092173576355},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.16780009865760803},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16048982739448547},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12697100639343262},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12361261248588562},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07972192764282227},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2012.2216217","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2216217","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1568694809","https://openalex.org/W1978678774","https://openalex.org/W2033845134","https://openalex.org/W2093123829","https://openalex.org/W2097559264","https://openalex.org/W2099286798","https://openalex.org/W2105505384","https://openalex.org/W2107761951","https://openalex.org/W2109289538","https://openalex.org/W2110225462","https://openalex.org/W2111647779","https://openalex.org/W2113333016","https://openalex.org/W2117363435","https://openalex.org/W2119119508","https://openalex.org/W2122365245","https://openalex.org/W2138634253","https://openalex.org/W2140351762","https://openalex.org/W2152434001","https://openalex.org/W2154586669","https://openalex.org/W2163914596","https://openalex.org/W6676388060"],"related_works":["https://openalex.org/W2240573311","https://openalex.org/W3128876586","https://openalex.org/W2797770331","https://openalex.org/W2589751677","https://openalex.org/W2790599292","https://openalex.org/W3025032786","https://openalex.org/W2110880033","https://openalex.org/W1971306317","https://openalex.org/W1497509927","https://openalex.org/W749362741"],"abstract_inverted_index":{"An":[0],"11-b":[1],"300-MS/s":[2],"double":[3],"sampling":[4],"pipelined":[5,18,36],"ADC":[6,19,91],"with":[7],"on-chip":[8],"digital":[9,49,87],"calibration":[10,41,88],"for":[11],"memory":[12,21,45],"effects":[13],"is":[14,72,102],"presented.":[15],"In":[16],"double-sampling":[17],"architecture,":[20],"effect":[22,46],"of":[23,35],"residual":[24],"charge":[25],"occurs":[26],"due":[27],"to":[28],"sharing":[29],"an":[30],"op-amp":[31],"between":[32],"two":[33],"channels":[34],"ADC.":[37],"The":[38,70,90],"proposed":[39],"foreground":[40],"technique":[42,57],"removes":[43],"the":[44,56,59,64],"error":[47],"in":[48,74],"domain":[50],"without":[51],"additional":[52],"analog":[53,60],"circuit.":[54],"Thus,":[55],"simplifies":[58],"circuits,":[61],"which":[62],"extends":[63],"operation":[65],"speed":[66],"over":[67],"300":[68],"MHz.":[69],"chip":[71],"fabricated":[73],"a":[75,96],"40":[76,93],"nm":[77],"CMOS":[78],"and":[79,100],"occupies":[80],"0.42":[81],"mm":[82],"<sup":[83],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[84],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[85],"including":[86],"logic.":[89],"consumes":[92],"mW":[94],"from":[95],"1.8":[97],"V":[98],"supply,":[99],"FoM":[101],"0.24-pJ/conversion-step.":[103]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}