{"id":"https://openalex.org/W2079415017","doi":"https://doi.org/10.1109/jssc.2012.2190191","title":"Associative Memory for Nearest-Hamming-Distance Search Based on Frequency Mapping","display_name":"Associative Memory for Nearest-Hamming-Distance Search Based on Frequency Mapping","publication_year":2012,"publication_date":"2012-04-20","ids":{"openalex":"https://openalex.org/W2079415017","doi":"https://doi.org/10.1109/jssc.2012.2190191","mag":"2079415017"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2012.2190191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2190191","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086404781","display_name":"Hans J\u00fcrgen Mattausch","orcid":"https://orcid.org/0000-0001-5712-1020"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hans J\u00fcrgen Mattausch","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033954544","display_name":"Wataru Imafuku","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Wataru Imafuku","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045375143","display_name":"Akio Kawabata","orcid":"https://orcid.org/0000-0001-6254-2073"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akio Kawabata","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112183058","display_name":"Tania Ansari","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tania Ansari","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017806490","display_name":"Masahiro Yasuda","orcid":"https://orcid.org/0000-0002-8384-8167"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Yasuda","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025654896","display_name":"Tetsushi Koide","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210126469","display_name":"Higashihiroshima Medical Center","ror":"https://ror.org/03bd22t26","country_code":"JP","type":"healthcare","lineage":["https://openalex.org/I4210126469","https://openalex.org/I4210137409"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsushi Koide","raw_affiliation_strings":["Hiroshima University, Higashihiroshima, Japan","Hiroshima University Higashi-Hiroshima Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721","https://openalex.org/I4210126469"]},{"raw_affiliation_string":"Hiroshima University Higashi-Hiroshima Japan","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3353,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.88862187,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"47","issue":"6","first_page":"1448","last_page":"1459"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.7093503475189209},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6009302735328674},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.5661230087280273},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5258458256721497},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5243176221847534},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4918403625488281},{"id":"https://openalex.org/keywords/content-addressable-memory","display_name":"Content-addressable memory","score":0.46014392375946045},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4512575566768646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4326241910457611},{"id":"https://openalex.org/keywords/gray-code","display_name":"Gray code","score":0.4256579279899597},{"id":"https://openalex.org/keywords/circuit-complexity","display_name":"Circuit complexity","score":0.41062748432159424},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3357667922973633},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.2179589867591858},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1857086718082428},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.18321815133094788},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17141175270080566},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1699836552143097},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14903417229652405},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13594752550125122},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13127651810646057}],"concepts":[{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.7093503475189209},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6009302735328674},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.5661230087280273},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5258458256721497},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5243176221847534},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4918403625488281},{"id":"https://openalex.org/C53442348","wikidata":"https://www.wikidata.org/wiki/Q745101","display_name":"Content-addressable memory","level":3,"score":0.46014392375946045},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4512575566768646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4326241910457611},{"id":"https://openalex.org/C129861397","wikidata":"https://www.wikidata.org/wiki/Q332772","display_name":"Gray code","level":2,"score":0.4256579279899597},{"id":"https://openalex.org/C90702460","wikidata":"https://www.wikidata.org/wiki/Q1055112","display_name":"Circuit complexity","level":3,"score":0.41062748432159424},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3357667922973633},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2179589867591858},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1857086718082428},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.18321815133094788},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17141175270080566},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1699836552143097},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14903417229652405},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13594752550125122},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13127651810646057},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.0},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2012.2190191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2012.2190191","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8600000143051147,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1191470825","https://openalex.org/W1586467074","https://openalex.org/W1663973292","https://openalex.org/W1968702576","https://openalex.org/W1997559019","https://openalex.org/W2008749436","https://openalex.org/W2012208786","https://openalex.org/W2015006044","https://openalex.org/W2041702797","https://openalex.org/W2102708435","https://openalex.org/W2111025585","https://openalex.org/W2136401082","https://openalex.org/W2150572079","https://openalex.org/W2166999360","https://openalex.org/W2594639291","https://openalex.org/W6676607320"],"related_works":["https://openalex.org/W2943247777","https://openalex.org/W2619231335","https://openalex.org/W2740543340","https://openalex.org/W2371167013","https://openalex.org/W1582340598","https://openalex.org/W1541021634","https://openalex.org/W2779867339","https://openalex.org/W2794545997","https://openalex.org/W2040688628","https://openalex.org/W1997618736"],"abstract_inverted_index":{"The":[0,139,154],"developed":[1],"associative-memory":[2,88,116,206],"architecture":[3,89,117],"utilizes":[4],"a":[5,24,62,102,122,237,247],"mapping":[6],"operation":[7],"of":[8,29,46,57,79,86,97,105,114,136,151,168,189,239,249],"the":[9,30,47,55,58,73,84,87,95,98,106,190,197,208,219,232,253],"Hamming":[10,32,243,255],"distances":[11],"into":[12],"frequency":[13,21,59],"space":[14],"with":[15,34,121,186],"ring":[16],"oscillators":[17],"programmable":[18],"in":[19,125,184],"discrete":[20],"steps.":[22],"As":[23],"result":[25],"fast":[26],"word-parallel":[27],"search":[28,178,221,233],"nearest":[31],"distance":[33,244,256],"low":[35,147],"power":[36,155,210],"consumption":[37],"is":[38,50,61,90,142,157,180,212,223],"obtained.":[39],"Additionally,":[40],"high":[41],"robustness":[42],"against":[43],"fabrication-related":[44],"variations":[45,188],"MOSFET":[48],"characteristics":[49],"achievable":[51],"by":[52],"design":[53,65,99,124,192],"because":[54],"size":[56],"steps":[60],"freely":[63],"selectable":[64],"parameter":[66],"which":[67],"can":[68],"be":[69,183],"adjusted":[70],"to":[71,146,182,202,246],"compensate":[72],"variation":[74,81,107,198],"magnitude.":[75],"A":[76],"quantitative":[77],"analysis":[78],"within-die":[80],"effects":[82,108],"on":[83],"reliability":[85,179],"presented":[91],"and":[92,112,162,173,194],"guidelines":[93],"for":[94,252],"choice":[96],"parameters":[100,193],"at":[101,165,242],"given":[103],"magnitude":[104],"are":[109,118],"derived.":[110],"Feasibility":[111],"performance":[113],"this":[115],"experimentally":[119],"evaluated":[120],"VLSI":[123],"180":[126],"nm":[127],"CMOS":[128],"technology":[129],"containing":[130],"64":[131],"reference":[132],"patterns":[133],"each":[134],"consisting":[135],"256":[137],"bits.":[138],"fabricated":[140],"chip":[141],"correctly":[143],"operating":[144],"down":[145],"supply":[148,166],"voltages":[149,167],"(Vdd)":[150],"0.7":[152,174],"V.":[153],"dissipation":[156,211],"less":[158],"than":[159,214],"36.5":[160],"mW":[161],"307":[163],"\u03bcW":[164],"1.8":[169,230],"V":[170,231],"(nominal":[171],"supply)":[172],"V,":[175],"respectively.":[176],"Measured":[177],"found":[181],"agreement":[185],"measured":[187],"important":[191],"expectations":[195],"from":[196,236],"analysis.":[199],"In":[200],"comparison":[201],"previously":[203],"reported":[204],"digital":[205],"designs,":[207],"achieved":[209],"more":[213],"5":[215],"times":[216],"smaller,":[217],"while":[218],"average":[220],"speed":[222],"only":[224],"slightly":[225],"improved.":[226],"For":[227],"Vdd":[228],"=":[229],"time":[234],"ranges":[235],"minimum":[238],"50":[240],"ns":[241,251],"0":[245],"maximum":[248],"245":[250],"largest":[254],"255.":[257]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}