{"id":"https://openalex.org/W1975545060","doi":"https://doi.org/10.1109/jssc.2011.2164298","title":"A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC","display_name":"A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC","publication_year":2011,"publication_date":"2011-09-28","ids":{"openalex":"https://openalex.org/W1975545060","doi":"https://doi.org/10.1109/jssc.2011.2164298","mag":"1975545060"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2164298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2164298","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007930789","display_name":"Min-Woong Seo","orcid":"https://orcid.org/0000-0002-5819-1378"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Min-Woong Seo","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057986515","display_name":"Sungho Suh","orcid":"https://orcid.org/0000-0003-3723-1980"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sung-Ho Suh","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113631648","display_name":"Tetsuya Iida","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tetsuya Iida","raw_affiliation_strings":["Brookman Technology, Inc., Hamamatsu, Japan","Brookman Technol., Inc., Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc., Hamamatsu, Japan","institution_ids":[]},{"raw_affiliation_string":"Brookman Technol., Inc., Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074244031","display_name":"Taishi Takasawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taishi Takasawa","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055768252","display_name":"Keigo Isobe","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Keigo Isobe","raw_affiliation_strings":["Brookman Technology, Inc., Hamamatsu, Japan","Brookman Technol., Inc., Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc., Hamamatsu, Japan","institution_ids":[]},{"raw_affiliation_string":"Brookman Technol., Inc., Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101499939","display_name":"Takashi Watanabe","orcid":"https://orcid.org/0000-0002-9380-8193"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takashi Watanabe","raw_affiliation_strings":["Brookman Technology, Inc., Hamamatsu, Japan","Brookman Technol., Inc., Hamamatsu, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Brookman Technology, Inc., Hamamatsu, Japan","institution_ids":[]},{"raw_affiliation_string":"Brookman Technol., Inc., Hamamatsu, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102115966","display_name":"Shinya Itoh","orcid":null},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinya Itoh","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032893390","display_name":"Keita Yasutomi","orcid":"https://orcid.org/0000-0003-0818-8506"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keita Yasutomi","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065338590","display_name":"Shoji Kawahito","orcid":"https://orcid.org/0000-0003-4456-5006"},"institutions":[{"id":"https://openalex.org/I1298590031","display_name":"Shizuoka University","ror":"https://ror.org/01w6wtk13","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shoji Kawahito","raw_affiliation_strings":["Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan","institution_ids":["https://openalex.org/I1298590031"]},{"raw_affiliation_string":"[Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan]","institution_ids":["https://openalex.org/I1298590031"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.6497,"has_fulltext":false,"cited_by_count":124,"citation_normalized_percentile":{"value":0.97949973,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"47","issue":"1","first_page":"272","last_page":"283"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6333072781562805},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.6278948187828064},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6256480813026428},{"id":"https://openalex.org/keywords/folding","display_name":"Folding (DSP implementation)","score":0.5746731162071228},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.5398193597793579},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5017192363739014},{"id":"https://openalex.org/keywords/wide-dynamic-range","display_name":"Wide dynamic range","score":0.48830127716064453},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.41107672452926636},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3655604124069214},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25428307056427},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.23981517553329468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19564345479011536},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.15710565447807312},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1271359920501709},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1215025782585144},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10154873132705688}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6333072781562805},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6278948187828064},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6256480813026428},{"id":"https://openalex.org/C2776545253","wikidata":"https://www.wikidata.org/wiki/Q5464292","display_name":"Folding (DSP implementation)","level":2,"score":0.5746731162071228},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.5398193597793579},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5017192363739014},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.48830127716064453},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.41107672452926636},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3655604124069214},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25428307056427},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.23981517553329468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19564345479011536},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.15710565447807312},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1271359920501709},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1215025782585144},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10154873132705688},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2011.2164298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2164298","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1975793277","https://openalex.org/W1985693990","https://openalex.org/W2007597602","https://openalex.org/W2011593284","https://openalex.org/W2018657325","https://openalex.org/W2028898488","https://openalex.org/W2031533823","https://openalex.org/W2067589847","https://openalex.org/W2070247293","https://openalex.org/W2088957091","https://openalex.org/W2095817904","https://openalex.org/W2104086223","https://openalex.org/W2108083714","https://openalex.org/W2112370080","https://openalex.org/W2120062331","https://openalex.org/W2134145839","https://openalex.org/W2136416972","https://openalex.org/W2144536291","https://openalex.org/W2148303938","https://openalex.org/W2152434001","https://openalex.org/W2159191222","https://openalex.org/W6681593992"],"related_works":["https://openalex.org/W2160828022","https://openalex.org/W2004664178","https://openalex.org/W1975921377","https://openalex.org/W2129163123","https://openalex.org/W4200290804","https://openalex.org/W2995437883","https://openalex.org/W2132014979","https://openalex.org/W2534961362","https://openalex.org/W2023957560","https://openalex.org/W2157322820"],"abstract_inverted_index":{"A":[0,13],"low":[1],"temporal":[2,34],"noise":[3],"and":[4,21,96],"high":[5,49],"dynamic":[6,38],"range":[7,39,100],"CMOS":[8,15,70],"image":[9,16,71],"sensor":[10,17,72],"is":[11,57],"developed.":[12],"1Mpixel":[14],"with":[18],"column-parallel":[19],"folding-integration":[20,45],"cyclic":[22],"ADCs":[23],"has":[24,77],"80\u03bcV":[25],"<sub":[26],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[27,31,83,93],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">rms</sub>":[28],"(1.2e":[29],"<sup":[30,92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup>":[32,94],")":[33],"noise,":[35],"82":[36],"dB":[37],"using":[40,73],"64":[41],"samplings":[42,64],"in":[43],"the":[44,61,78,86],"ADC":[46],"mode.":[47],"Very":[48],"variable":[50],"gray-scale":[51],"resolution":[52],"of":[53,63,65,80,89,101],"13b":[54],"through":[55],"19b":[56],"attained":[58],"by":[59],"changing":[60],"number":[62],"pixel":[66],"outputs.":[67],"The":[68],"implemented":[69],"a":[74],"0.18-\u03bcm":[75],"technology":[76],"sensitivity":[79],"10-":[81],"<i":[82],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">V</i>":[84],"/lx\u00b7s,":[85],"conversion":[87],"gain":[88],"67-":[90],"\u03bcV/e":[91],",":[95],"linear":[97],"digital":[98],"code":[99],"more":[102],"than":[103],"4":[104],"decades.":[105]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":10},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":16},{"year":2014,"cited_by_count":20},{"year":2013,"cited_by_count":10},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}