{"id":"https://openalex.org/W1980970064","doi":"https://doi.org/10.1109/jssc.2011.2164294","title":"A Digitized Replica Bitline Delay Technique for Random-Variation-Tolerant Timing Generation of SRAM Sense Amplifiers","display_name":"A Digitized Replica Bitline Delay Technique for Random-Variation-Tolerant Timing Generation of SRAM Sense Amplifiers","publication_year":2011,"publication_date":"2011-09-23","ids":{"openalex":"https://openalex.org/W1980970064","doi":"https://doi.org/10.1109/jssc.2011.2164294","mag":"1980970064"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2164294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2164294","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055824203","display_name":"Yusuke Niki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yusuke Niki","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080211932","display_name":"Atsushi Kawasumi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Kawasumi","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110259435","display_name":"Azuma Suzuki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Azuma Suzuki","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032269766","display_name":"Y. Takeyama","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuhisa Takeyama","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013755323","display_name":"Osamu Hirabayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Osamu Hirabayashi","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044735538","display_name":"K. Kushida","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiichi Kushida","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021907697","display_name":"Fumihiko Tachibana","orcid":"https://orcid.org/0000-0002-6311-9215"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fumihiko Tachibana","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108640527","display_name":"Yuki Fujimura","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuki Fujimura","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054331498","display_name":"Tomoaki Yabe","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoaki Yabe","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"[Center for Semiconductor R&D, Toshiba Corporation, Kawasaki, Japan]","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.703,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.90268166,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"46","issue":"11","first_page":"2545","last_page":"2551"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/replica","display_name":"Replica","score":0.8893672227859497},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7844261527061462},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5828912854194641},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5105618238449097},{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.5066843628883362},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.4595540761947632},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4548223614692688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44667455554008484},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.43268248438835144},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3891068994998932},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34721821546554565},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.32236284017562866},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29016387462615967},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2569183111190796},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2521933615207672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2133229374885559},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17754942178726196}],"concepts":[{"id":"https://openalex.org/C2775937380","wikidata":"https://www.wikidata.org/wiki/Q1232589","display_name":"Replica","level":2,"score":0.8893672227859497},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7844261527061462},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5828912854194641},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5105618238449097},{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.5066843628883362},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.4595540761947632},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4548223614692688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44667455554008484},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.43268248438835144},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3891068994998932},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34721821546554565},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32236284017562866},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29016387462615967},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2569183111190796},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2521933615207672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2133229374885559},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17754942178726196},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2011.2164294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2164294","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1990823448","https://openalex.org/W1997419502","https://openalex.org/W2066274996","https://openalex.org/W2100483769","https://openalex.org/W2105175332","https://openalex.org/W2107909712","https://openalex.org/W2109531912","https://openalex.org/W2111701388","https://openalex.org/W2115811012","https://openalex.org/W2133385928","https://openalex.org/W2140823559","https://openalex.org/W2166287616"],"related_works":["https://openalex.org/W1835913819","https://openalex.org/W2051363901","https://openalex.org/W2029990318","https://openalex.org/W2601845499","https://openalex.org/W2127348582","https://openalex.org/W2117344730","https://openalex.org/W4231592364","https://openalex.org/W2373152541","https://openalex.org/W2125441476","https://openalex.org/W1989206638"],"abstract_inverted_index":{"A":[0],"digitized":[1,55],"replica":[2,48,51],"bitline":[3,52],"delay":[4,53],"technique":[5,81],"has":[6],"been":[7],"proposed":[8],"for":[9,65],"random-variation-tolerant":[10],"timing":[11,23,64,72],"generation":[12],"of":[13,25,32,47,69,97],"static":[14],"random":[15,30],"access":[16],"memory":[17],"(SRAM)":[18],"sense":[19],"amplifiers":[20],"(SA).":[21],"The":[22,67],"variation":[24,31,68],"SA":[26],"attributable":[27],"to":[28,58,61],"the":[29,62,70,89],"transistor":[33],"threshold":[34],"voltage":[35,91],"(V":[36,92],"<sub":[37,93],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[38,94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">TH</sub>":[39],")":[40,96],"is":[41,54],"reduced":[42,86],"by":[43],"a":[44,79],"sufficient":[45],"count":[46],"cells,":[49],"and":[50,56,82],"multiplied":[57],"adjust":[59],"it":[60],"target":[63],"SA.":[66],"generated":[71],"was":[73,85],"41%":[74],"smaller":[75],"than":[76],"that":[77],"with":[78,105],"conventional":[80],"cycle":[83],"time":[84],"20%":[87],"at":[88],"supply":[90],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[95],"0.6":[98],"V":[99],"in":[100],"40":[101],"nm":[102],"CMOS":[103],"technology":[104],"this":[106],"scheme.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}