{"id":"https://openalex.org/W2112990568","doi":"https://doi.org/10.1109/jssc.2011.2160790","title":"Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing","display_name":"Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing","publication_year":2011,"publication_date":"2011-08-03","ids":{"openalex":"https://openalex.org/W2112990568","doi":"https://doi.org/10.1109/jssc.2011.2160790","mag":"2112990568"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2160790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2160790","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080313258","display_name":"Mutsuo Daito","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mutsuo Daito","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111455360","display_name":"Yoshiro Nakata","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiro Nakata","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076137369","display_name":"Satoshi Sasaki","orcid":"https://orcid.org/0000-0003-3643-1649"},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Sasaki","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057979242","display_name":"H. Gomyo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Gomyo","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055122719","display_name":"Hideki Kusamitsu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideki Kusamitsu","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014394659","display_name":"Yoshio Komoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshio Komoto","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113951225","display_name":"Kunihiko Iizuka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127336","display_name":"Association of Super-Advanced Electronics","ror":"https://ror.org/0292ym357","country_code":"JP","type":"other","lineage":["https://openalex.org/I4210127336"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiko Iizuka","raw_affiliation_strings":["Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Association of Super-Advanced Electronics Technologies (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]},{"raw_affiliation_string":"Assoc. of Super-Adv. Electron. Technol. (ASET), Yokohama, Japan","institution_ids":["https://openalex.org/I4210127336"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111992985","display_name":"Katsuyuki Ikeuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Katsuyuki Ikeuchi","raw_affiliation_strings":["The University of Tokyo, Tokyo, Japan","Univ. of Tokyo, Tokyo (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Univ. of Tokyo, Tokyo (Japan)","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112824579","display_name":"Gil Su Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Gil Su Kim","raw_affiliation_strings":["The University of Tokyo, Tokyo, Japan","Univ. of Tokyo, Tokyo (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Univ. of Tokyo, Tokyo (Japan)","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003282110","display_name":"Makoto Takamiya","orcid":"https://orcid.org/0000-0003-0289-7790"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Takamiya","raw_affiliation_strings":["The University of Tokyo, Tokyo, Japan","Univ. of Tokyo, Tokyo (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Univ. of Tokyo, Tokyo (Japan)","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112189116","display_name":"Takayasu Sakurai","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayasu Sakurai","raw_affiliation_strings":["The University of Tokyo, Tokyo, Japan","Univ. of Tokyo, Tokyo (Japan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Univ. of Tokyo, Tokyo (Japan)","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1321,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.92800424,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"46","issue":"10","first_page":"2386","last_page":"2395"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6892335414886475},{"id":"https://openalex.org/keywords/ringing","display_name":"Ringing","score":0.5066741108894348},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4778423011302948},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4668702781200409},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46271511912345886},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.460640013217926},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44688647985458374},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4407207667827606},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4235178828239441},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.42099544405937195},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23346152901649475},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08322852849960327}],"concepts":[{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6892335414886475},{"id":"https://openalex.org/C30684385","wikidata":"https://www.wikidata.org/wiki/Q176509","display_name":"Ringing","level":3,"score":0.5066741108894348},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4778423011302948},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4668702781200409},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46271511912345886},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.460640013217926},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44688647985458374},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4407207667827606},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4235178828239441},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.42099544405937195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23346152901649475},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08322852849960327}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/jssc.2011.2160790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2160790","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.669.6350","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.669.6350","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://icdesign.iis.u-tokyo.ac.jp/2011_47.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.690.8717","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.690.8717","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://icdesign.iis.u-tokyo.ac.jp/2010_3.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1538352461","https://openalex.org/W1554123512","https://openalex.org/W2062952706","https://openalex.org/W2071461165","https://openalex.org/W2096280646","https://openalex.org/W2104660976","https://openalex.org/W2107235564","https://openalex.org/W2141061687","https://openalex.org/W2150283660","https://openalex.org/W2159072744","https://openalex.org/W2159386314","https://openalex.org/W2160673368","https://openalex.org/W2168063067","https://openalex.org/W2170215783","https://openalex.org/W2175000298","https://openalex.org/W2176473673","https://openalex.org/W3142316126","https://openalex.org/W3149739945"],"related_works":["https://openalex.org/W2394351004","https://openalex.org/W1975101660","https://openalex.org/W2359211325","https://openalex.org/W4293080436","https://openalex.org/W2151975639","https://openalex.org/W4229488911","https://openalex.org/W2775406816","https://openalex.org/W2359156683","https://openalex.org/W1971363047","https://openalex.org/W2332473953"],"abstract_inverted_index":{"A":[0,62],"capacitively":[1],"coupled":[2],"probing":[3],"circuit":[4],"with":[5,43],"a":[6,9,13,20,66,73],"novel":[7],"de-skewer,":[8],"low-pass":[10,45],"filter":[11,46],"and":[12,36,65,79],"high-sensitivity":[14],"receiver":[15,42],"is":[16,87,96,108],"proposed":[17],"to":[18],"realize":[19],"membrane-based":[21],"wafer-level":[22],"simultaneous":[23],"testing":[24],"robustly.":[25],"The":[26,41,94],"de-skewer":[27],"can":[28,47],"be":[29],"designed":[30],"by":[31,53],"only":[32],"digital":[33],"core":[34,86],"transistors":[35],"has":[37],"stable":[38],"feed-forward":[39],"architecture.":[40],"the":[44,49,54,59,80,105],"suppress":[48],"undesirable":[50],"ringing":[51],"caused":[52],"complex":[55],"wiring":[56],"structure":[57],"in":[58,72],"probe":[60,63],"card.":[61],"chip":[64],"300":[67],"mm":[68],"DUT-wafer":[69],"are":[70],"fabricated":[71],"1.2":[74],"V":[75],"90":[76],"nm":[77],"technology":[78],"measured":[81],"power":[82],"consumption":[83],"of":[84],"RX":[85],"0.5":[88],"mW":[89],"at":[90],"1":[91],"Gbps":[92],"operation.":[93],"BER":[95],"improved":[97],"below":[98],"10-12over":[99],"almost":[100],"all":[101],"UI":[102],"range":[103],"when":[104],"de-skewing":[106],"function":[107],"turned":[109],"on.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}