{"id":"https://openalex.org/W2102252821","doi":"https://doi.org/10.1109/jssc.2011.2151510","title":"SHA-Less Pipelined ADC With In Situ Background Clock-Skew Calibration","display_name":"SHA-Less Pipelined ADC With In Situ Background Clock-Skew Calibration","publication_year":2011,"publication_date":"2011-06-17","ids":{"openalex":"https://openalex.org/W2102252821","doi":"https://doi.org/10.1109/jssc.2011.2151510","mag":"2102252821"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2151510","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2151510","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104031015","display_name":"Pingli Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Pingli Huang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois, Urbana-Champaign, Urbana, IL, USA","Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois, Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058100506","display_name":"Szu-Kang Hsien","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Szukang Hsien","raw_affiliation_strings":["Texas Instruments, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112551990","display_name":"Victor Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Victor Lu","raw_affiliation_strings":["Department of Computer Science, University of Illinois, Urbana-Champaign, Urbana, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois, Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046722826","display_name":"Peiyuan Wan","orcid":"https://orcid.org/0000-0003-4875-6432"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peiyuan Wan","raw_affiliation_strings":["Beijing University of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100626897","display_name":"Seung\u2010Chul Lee","orcid":"https://orcid.org/0000-0002-1034-1410"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seung-Chul Lee","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois, Urbana-Champaign, Urbana, IL, USA","Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois, Urbana-Champaign, Urbana, IL, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115601800","display_name":"Wenbo Liu","orcid":"https://orcid.org/0009-0003-6572-2872"},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wenbo Liu","raw_affiliation_strings":["Broadcom Corporation, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Irvine, CA, USA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100679032","display_name":"Bo\u2010Wei Chen","orcid":"https://orcid.org/0000-0001-6526-9017"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bo-Wei Chen","raw_affiliation_strings":["Industrial Technology and Research Institute, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012092992","display_name":"Yung-Pin Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yung-Pin Lee","raw_affiliation_strings":["Industrial Technology and Research Institute, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052778735","display_name":"Wen-Tsao Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wen-Tsao Chen","raw_affiliation_strings":["Industrial Technology and Research Institute, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020851000","display_name":"Tzu-Yi Yang","orcid":"https://orcid.org/0000-0002-5854-2836"},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tzu-Yi Yang","raw_affiliation_strings":["Industrial Technology and Research Institute, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103610951","display_name":"Gin-Kou Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Gin-Kou Ma","raw_affiliation_strings":["Industrial Technology and Research Institute, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047697146","display_name":"Yun Chiu","orcid":"https://orcid.org/0000-0001-5239-4417"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yun Chiu","raw_affiliation_strings":["Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Analog Center of Excellence (TxACE), University of Texas, Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319","https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5104031015"],"corresponding_institution_ids":["https://openalex.org/I117023288","https://openalex.org/I157725225","https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":3.3576,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.92104443,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"46","issue":"8","first_page":"1893","last_page":"1903"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.7509137392044067},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.5646381974220276},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.525425910949707},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5028088092803955},{"id":"https://openalex.org/keywords/flash-adc","display_name":"Flash ADC","score":0.4858562648296356},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4379728138446808},{"id":"https://openalex.org/keywords/clock-generator","display_name":"Clock generator","score":0.4313107132911682},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43020954728126526},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42023080587387085},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.41908830404281616},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.4106985926628113},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3931806683540344},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3012538552284241},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29791897535324097},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.29361429810523987},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21880024671554565},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.10457709431648254},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0902346670627594},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08341038227081299}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.7509137392044067},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.5646381974220276},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.525425910949707},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5028088092803955},{"id":"https://openalex.org/C164862427","wikidata":"https://www.wikidata.org/wiki/Q2744647","display_name":"Flash ADC","level":4,"score":0.4858562648296356},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4379728138446808},{"id":"https://openalex.org/C2778023540","wikidata":"https://www.wikidata.org/wiki/Q2164847","display_name":"Clock generator","level":4,"score":0.4313107132911682},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43020954728126526},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42023080587387085},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.41908830404281616},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.4106985926628113},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3931806683540344},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3012538552284241},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29791897535324097},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.29361429810523987},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21880024671554565},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.10457709431648254},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0902346670627594},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08341038227081299},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2011.2151510","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2151510","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1536704551","https://openalex.org/W1560969784","https://openalex.org/W2003252571","https://openalex.org/W2007472976","https://openalex.org/W2097638226","https://openalex.org/W2115712965","https://openalex.org/W2123776947","https://openalex.org/W2127364381","https://openalex.org/W2135250983","https://openalex.org/W2137512755","https://openalex.org/W2152434001","https://openalex.org/W2169707891","https://openalex.org/W2183205474","https://openalex.org/W2562048429","https://openalex.org/W6680148096"],"related_works":["https://openalex.org/W3028366910","https://openalex.org/W2340159482","https://openalex.org/W2297502789","https://openalex.org/W4206356469","https://openalex.org/W1771023983","https://openalex.org/W2904640696","https://openalex.org/W2809902876","https://openalex.org/W2147238716","https://openalex.org/W2054018984","https://openalex.org/W2108842766"],"abstract_inverted_index":{"A":[0,162],"10-b,":[1],"100-MS/s":[2],"pipelined":[3],"analog-to-digital":[4],"converter":[5,79],"(ADC)":[6],"without":[7,96],"dedicated":[8],"front-end":[9,35,65],"sample-and-hold":[10,73],"amplifier":[11],"(SHA)":[12],"converts":[13],"from":[14,42],"dc":[15],"to":[16,58,67,93],"the":[17,29,33,43,61,64,72,76,103,114,121,124,148,192],"12th":[18],"Nyquist":[19,194],"band":[20],"with":[21,47,69,110,129,178],"in":[22,32,75,85,99,101,191],"situ,":[23],"mostly":[24],"digital":[25],"background":[26],"calibration":[27,111,130,149],"for":[28],"clock":[30],"skew":[31,38,97],"3.5-b":[34],"stage.":[36],"The":[37,81,127],"information":[39],"is":[40,56],"extracted":[41],"first-stage":[44],"residue":[45],"output":[46],"two":[48],"comparators":[49],"sensing":[50],"out-of-range":[51],"errors;":[52],"a":[53,86,169,179,184],"gradient-descent":[54],"algorithm":[55],"used":[57],"adaptively":[59],"adjust":[60],"timing":[62],"of":[63,71,123],"sub-ADC":[66,116],"synchronize":[68],"that":[70],"(S/H)":[74],"multiplying":[77],"digital-to-analog":[78],"(MDAC).":[80],"prototype":[82,128],"ADC,":[83],"implemented":[84],"90-nm":[87],"CMOS":[88],"process,":[89],"digitizes":[90],"inputs":[91],"up":[92],"610":[94],"MHz":[95,109],"errors":[98],"experiments;":[100],"contrast,":[102],"same":[104],"ADC":[105],"fails":[106],"at":[107,120],"130":[108],"disabled":[112],"(with":[113],"default":[115],"sample":[117],"point":[118],"set":[119],"midpoint":[122],"delay":[125],"range).":[126],"circuits":[131,150],"fully":[132],"integrated":[133],"on":[134],"chip":[135],"consumes":[136],"12.2":[137],"mW":[138,153],"and":[139,154,168,172,183],"occupies":[140],"0.26-mm":[141],"<sup":[142,158],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[143,159],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[144,160],"silicon":[145],"area,":[146],"while":[147],"dissipate":[151],"0.9":[152],"occupy":[155],"0.01":[156],"mm":[157],".":[161],"71-dB":[163],"spurious-free":[164],"dynamic":[165],"range":[166],"(SFDR)":[167],"55-dB":[170,187],"signal-to-noise":[171],"distortion":[173],"ratio":[174],"(SNDR)":[175],"were":[176],"measured":[177,190],"20-MHz":[180],"sine-wave":[181],"input,":[182],"larger":[185],"than":[186],"SFDR":[188],"was":[189],"10th":[193],"band.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":9}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}