{"id":"https://openalex.org/W2068602229","doi":"https://doi.org/10.1109/jssc.2011.2147030","title":"Improvement of Read Margin and Its Distribution by $V_{\\rm TH}$ Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection","display_name":"Improvement of Read Margin and Its Distribution by $V_{\\rm TH}$ Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection","publication_year":2011,"publication_date":"2011-06-29","ids":{"openalex":"https://openalex.org/W2068602229","doi":"https://doi.org/10.1109/jssc.2011.2147030","mag":"2068602229"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2147030","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2147030","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103441049","display_name":"Kousuke Miyaji","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Kousuke Miyaji","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030358122","display_name":"Shuhei Tanakamaru","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuhei Tanakamaru","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110178896","display_name":"Kentaro Honda","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kentaro Honda","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103578844","display_name":"Shinji Miyano","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinji Miyano","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032914719","display_name":"Ken Takeuchi","orcid":"https://orcid.org/0000-0002-9345-6503"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Takeuchi","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103441049"],"corresponding_institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":1.8547,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.8660792,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"46","issue":"9","first_page":"2180","last_page":"2188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.7021688222885132},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6478961110115051},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4707033336162567},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4582158923149109},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4553660750389099},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.43617239594459534},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.39560040831565857},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38906678557395935},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36535871028900146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2662637531757355},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23124763369560242},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16258960962295532},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13420653343200684},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.10757479071617126},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.09634098410606384},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.06737062335014343}],"concepts":[{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.7021688222885132},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6478961110115051},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4707033336162567},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4582158923149109},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4553660750389099},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.43617239594459534},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.39560040831565857},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38906678557395935},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36535871028900146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2662637531757355},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23124763369560242},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16258960962295532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13420653343200684},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.10757479071617126},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.09634098410606384},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.06737062335014343},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2011.2147030","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2147030","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1997419502","https://openalex.org/W2004175552","https://openalex.org/W2006292752","https://openalex.org/W2012133071","https://openalex.org/W2040864640","https://openalex.org/W2060617458","https://openalex.org/W2071159343","https://openalex.org/W2098740348","https://openalex.org/W2106800147","https://openalex.org/W2120450525","https://openalex.org/W2125347149","https://openalex.org/W2130692995","https://openalex.org/W2132357267","https://openalex.org/W2146245450","https://openalex.org/W2147769068","https://openalex.org/W2151654658","https://openalex.org/W2154612605","https://openalex.org/W2171922263","https://openalex.org/W2172173999","https://openalex.org/W2412082861","https://openalex.org/W3143462235","https://openalex.org/W3148792909","https://openalex.org/W3150255627","https://openalex.org/W6634045704"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":{"A":[0],"<i":[1,53],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[2,5,54,57],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">V</i>":[3,55],"<sub":[4,56],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">TH</sub>":[6,58],"mismatch":[7],"self-repair":[8,110],"scheme":[9,67,91],"in":[10,79],"6T-SRAM":[11],"with":[12],"asymmetric":[13,52,86],"pass":[14,34],"gate":[15,35],"transistor":[16,36],"by":[17,84,98,105],"post-process":[18],"local":[19],"electron":[20,25],"injection":[21,26],"is":[22,27,60],"proposed.":[23],"Local":[24],"automatically":[28],"and":[29,70],"simultaneously":[30],"achieved":[31],"to":[32,108],"either":[33],"that":[37],"most":[38],"increases":[39],"the":[40,65,85,94,109],"read":[41,96,102],"margin":[42,97,103],"for":[43],"each":[44],"cell":[45,71],"without":[46,68,81],"investigating":[47],"its":[48],"characteristics.":[49],"The":[50,89],"proposed":[51,90],"shift":[59],"twice":[61],"as":[62,64],"large":[63],"conventional":[66],"process":[69],"area":[72],"penalty.":[73],"Measurement":[74],"results":[75],"show":[76],"20%":[77],"increase":[78],"SNM":[80],"write":[82],"degradation":[83],"PG":[87],"transistor.":[88],"also":[92],"enhances":[93],"minimum":[95],"70%":[99],"while":[100],"reducing":[101],"distribution":[104],"20%,":[106],"thanks":[107],"function.":[111]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}