{"id":"https://openalex.org/W2106132754","doi":"https://doi.org/10.1109/jssc.2011.2139530","title":"A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 $\\mu$V/$^{\\circ}$C Offset Drift","display_name":"A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 $\\mu$V/$^{\\circ}$C Offset Drift","publication_year":2011,"publication_date":"2011-06-20","ids":{"openalex":"https://openalex.org/W2106132754","doi":"https://doi.org/10.1109/jssc.2011.2139530","mag":"2106132754"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2011.2139530","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2139530","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023841079","display_name":"Muhammed Bolatkale","orcid":"https://orcid.org/0000-0001-9608-2036"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]},{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Muhammed Bolatkale","raw_affiliation_strings":["Delft University of Technnology, Delft, Netherlands","NXP Semiconductors, Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019433498","display_name":"Michiel A. P. Pertijs","orcid":"https://orcid.org/0000-0002-9891-4374"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Michiel A. P. Pertijs","raw_affiliation_strings":["Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006552335","display_name":"W.J. Kindt","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wilko J. Kindt","raw_affiliation_strings":["National Semiconductor Corporation, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"National Semiconductor Corporation, Delft, Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091851429","display_name":"Johan H. Huijsing","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Johan H. Huijsing","raw_affiliation_strings":["Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5023841079"],"corresponding_institution_ids":["https://openalex.org/I109147379","https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.647,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.71739153,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"46","issue":"9","first_page":"2099","last_page":"2107"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trimming","display_name":"Trimming","score":0.9656844139099121},{"id":"https://openalex.org/keywords/input-offset-voltage","display_name":"Input offset voltage","score":0.8337947130203247},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7930256128311157},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5891968607902527},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5680861473083496},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.5525158643722534},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44515568017959595},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4426727294921875},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.40311703085899353},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4012478291988373},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3976697623729706},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34657996892929077},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2748561501502991},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20706546306610107},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.16125288605690002}],"concepts":[{"id":"https://openalex.org/C56951928","wikidata":"https://www.wikidata.org/wiki/Q3539213","display_name":"Trimming","level":2,"score":0.9656844139099121},{"id":"https://openalex.org/C63651839","wikidata":"https://www.wikidata.org/wiki/Q478566","display_name":"Input offset voltage","level":5,"score":0.8337947130203247},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7930256128311157},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5891968607902527},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5680861473083496},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.5525158643722534},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44515568017959595},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4426727294921875},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.40311703085899353},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4012478291988373},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3976697623729706},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34657996892929077},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2748561501502991},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20706546306610107},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.16125288605690002},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2011.2139530","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2011.2139530","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320934","display_name":"Koninklijke Nederlandse Akademie van Wetenschappen","ror":"https://ror.org/043c0p156"},{"id":"https://openalex.org/F4320321012","display_name":"Technische Universiteit Delft","ror":"https://ror.org/02e2c7k09"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1533614470","https://openalex.org/W1564201208","https://openalex.org/W1593133950","https://openalex.org/W2015289250","https://openalex.org/W2021424057","https://openalex.org/W2101394360","https://openalex.org/W2110033475","https://openalex.org/W2112611349","https://openalex.org/W2119640888","https://openalex.org/W2121987784","https://openalex.org/W2132846136","https://openalex.org/W2140281076","https://openalex.org/W2140823559","https://openalex.org/W2143035400","https://openalex.org/W2150938923","https://openalex.org/W2157404888","https://openalex.org/W2490765418","https://openalex.org/W2544920336","https://openalex.org/W2566193534","https://openalex.org/W3147616483","https://openalex.org/W6635195737"],"related_works":["https://openalex.org/W2057887322","https://openalex.org/W2999611009","https://openalex.org/W2947484675","https://openalex.org/W2106132754","https://openalex.org/W1560414352","https://openalex.org/W4361800525","https://openalex.org/W1971997791","https://openalex.org/W1596270481","https://openalex.org/W2594925873","https://openalex.org/W2128994505"],"abstract_inverted_index":{"A":[0,46],"MOS-input":[1],"operational":[2],"amplifier":[3],"has":[4,83],"a":[5,28,68,89,99],"reconfigurable":[6],"input":[7,24],"stage":[8,25],"that":[9],"enables":[10],"trimming":[11,81],"of":[12,27,61,63,70,102,110,118],"both":[13],"offset":[14,16,33,38,60,101,108],"and":[15,54,73,86,106],"drift":[17,34,109],"based":[18],"only":[19],"on":[20],"single-temperature":[21,80,95],"measurements.":[22],"The":[23],"consists":[26],"MOS":[29,65],"differential":[30],"pair,":[31],"whose":[32],"is":[35,52],"predicted":[36],"from":[37],"voltage":[39],"measurements":[40],"made":[41],"at":[42],"well-defined":[43],"bias":[44,71],"currents.":[45],"theoretical":[47],"motivation":[48],"for":[49],"this":[50],"approach":[51],"presented":[53],"validated":[55],"experimentally":[56],"by":[57],"characterizing":[58],"the":[59,78,115],"pairs":[62],"discrete":[64],"transistors":[66],"as":[67],"function":[69],"current":[72],"temperature.":[74],"An":[75],"opamp":[76],"using":[77],"proposed":[79],"technique":[82],"been":[84],"designed":[85],"fabricated":[87],"in":[88],"0.5":[90],"\u03bcm":[91],"BiCMOS":[92],"process.":[93],"After":[94],"trimming,":[96],"it":[97],"achieves":[98],"maximum":[100],"\u00b1":[103],"30":[104],"\u03bcV":[105],"an":[107],"0.33":[111],"\u03bcV/\u00b0C":[112],"(3\u03c3)":[113],"over":[114],"temperature":[116],"range":[117],"-40\u00b0C":[119],"to":[120],"+125\u00b0C.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-07T14:57:38.498316","created_date":"2025-10-10T00:00:00"}