{"id":"https://openalex.org/W2146324717","doi":"https://doi.org/10.1109/jssc.2010.2092997","title":"A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference","display_name":"A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference","publication_year":2010,"publication_date":"2010-12-22","ids":{"openalex":"https://openalex.org/W2146324717","doi":"https://doi.org/10.1109/jssc.2010.2092997","mag":"2146324717"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2010.2092997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2092997","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030807407","display_name":"Luca Magnelli","orcid":null},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Luca Magnelli","raw_affiliation_strings":["Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086668405","display_name":"Felice Crupi","orcid":"https://orcid.org/0000-0002-5011-6621"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Felice Crupi","raw_affiliation_strings":["Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003003043","display_name":"Pasquale Corsonello","orcid":"https://orcid.org/0000-0002-9528-1110"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pasquale Corsonello","raw_affiliation_strings":["Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072470570","display_name":"C. Nick Pace","orcid":"https://orcid.org/0000-0002-9998-7129"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Calogero Pace","raw_affiliation_strings":["Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Arcavacata di Rende, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informatica e Sistemistica, Universita degli Studi della Calabria, Arcavacata di Rende, Cosenza, Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Dipt. di Elettron., Inf. e Sist., Univ. della Calabria, Arcavacata di Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076267890","display_name":"Giuseppe Iannaccone","orcid":"https://orcid.org/0000-0003-3375-1647"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Iannaccone","raw_affiliation_strings":["Dipartimento di Ingegneria dellInformazione, Elettronica, Informatica e Telecomunicazioni, Universita di Pisa, Pisa, Italy","Dipt. di Ing. dell' Inf. Elettron., Inf., e Telecomun., Univ. di Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dellInformazione, Elettronica, Informatica e Telecomunicazioni, Universita di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Dipt. di Ing. dell' Inf. Elettron., Inf., e Telecomun., Univ. di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5030807407"],"corresponding_institution_ids":["https://openalex.org/I45204951"],"apc_list":null,"apc_paid":null,"fwci":7.7955,"has_fulltext":false,"cited_by_count":285,"citation_normalized_percentile":{"value":0.978715,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"46","issue":"2","first_page":"465","last_page":"474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.7843154668807983},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7595185041427612},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6561945080757141},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.6527925729751587},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.6394616961479187},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6087185144424438},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5590559244155884},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5579631328582764},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5473743081092834},{"id":"https://openalex.org/keywords/line-regulation","display_name":"Line regulation","score":0.5194589495658875},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.48199787735939026},{"id":"https://openalex.org/keywords/overdrive-voltage","display_name":"Overdrive voltage","score":0.4802848994731903},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.425630658864975},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.42151951789855957},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.41151565313339233},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.32681840658187866},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.22506994009017944},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.20095399022102356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12478438019752502}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.7843154668807983},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7595185041427612},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6561945080757141},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.6527925729751587},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.6394616961479187},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6087185144424438},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5590559244155884},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5579631328582764},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5473743081092834},{"id":"https://openalex.org/C2777901765","wikidata":"https://www.wikidata.org/wiki/Q6553328","display_name":"Line regulation","level":5,"score":0.5194589495658875},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.48199787735939026},{"id":"https://openalex.org/C195905723","wikidata":"https://www.wikidata.org/wiki/Q7113634","display_name":"Overdrive voltage","level":5,"score":0.4802848994731903},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.425630658864975},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.42151951789855957},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.41151565313339233},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.32681840658187866},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.22506994009017944},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.20095399022102356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12478438019752502},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2010.2092997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2092997","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:arpi.unipi.it:11568/149724","is_oa":false,"landing_page_url":"http://hdl.handle.net/11568/149724","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324136","display_name":"Universit\u00e0 della Calabria","ror":"https://ror.org/02rc97e94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W242070949","https://openalex.org/W1566907904","https://openalex.org/W1566916904","https://openalex.org/W1761143336","https://openalex.org/W1973745339","https://openalex.org/W2013511403","https://openalex.org/W2018918953","https://openalex.org/W2032998311","https://openalex.org/W2067658274","https://openalex.org/W2092954710","https://openalex.org/W2105330050","https://openalex.org/W2109252375","https://openalex.org/W2112801319","https://openalex.org/W2118526058","https://openalex.org/W2132334378","https://openalex.org/W2133201500","https://openalex.org/W2139525369","https://openalex.org/W2139801901","https://openalex.org/W2141207690","https://openalex.org/W2171702041","https://openalex.org/W2545806777"],"related_works":["https://openalex.org/W2348464439","https://openalex.org/W2072896344","https://openalex.org/W2225727459","https://openalex.org/W2038852706","https://openalex.org/W2018896836","https://openalex.org/W2196780314","https://openalex.org/W2536407726","https://openalex.org/W4316814912","https://openalex.org/W4226184094","https://openalex.org/W4297399679"],"abstract_inverted_index":{"A":[0],"voltage":[1,16,30],"reference":[2,15,29],"circuit":[3,49,146],"operating":[4],"with":[5,55,87],"all":[6],"transistors":[7],"biased":[8],"in":[9,23,95],"weak":[10],"inversion,":[11],"providing":[12],"a":[13,73,88,96],"mean":[14,104],"of":[17,37,67,75,83,91,144],"257.5":[18],"mV,":[19],"has":[20],"been":[21],"fabricated":[22],"0.18":[24],"m":[25],"CMOS":[26],"technology.":[27],"The":[28,103,118,141],"can":[31],"be":[32],"approximated":[33],"by":[34],"the":[35,48,145],"difference":[36],"transistor":[38],"threshold":[39],"voltages":[40,57,111],"at":[41,52,124,129],"room":[42,53],"temperature.":[43],"Accurate":[44],"subthreshold":[45],"design":[46],"allows":[47],"to":[50,59,101,115],"work":[51],"temperature":[54,81,97],"supply":[56,110,120],"down":[58],"0.45":[60,114],"V":[61],"and":[62,127,137],"an":[63,79],"average":[64,80],"current":[65],"consumption":[66],"5.8":[68],"nA.":[69],"Measurements":[70],"performed":[71],"over":[72],"set":[74],"40":[76],"samples":[77],"showed":[78],"coefficient":[82],"165":[84],"ppm/":[85,93],"C":[86],"standard":[89],"deviation":[90],"100":[92],"C,":[94],"range":[98],"from":[99,113],"0":[100],"125\u00b0C.":[102],"line":[105],"sensitivity":[106],"is":[107,132,147],"\u22480.44%/V,":[108],"for":[109],"ranging":[112],"1.8":[116],"V.":[117],"power":[119],"rejection":[121],"ratio":[122],"measured":[123],"30":[125],"Hz":[126],"simulated":[128],"10":[130],"MHz":[131],"lower":[133],"than":[134],"-40":[135],"dB":[136],"-12":[138],"dB,":[139],"respectively.":[140],"active":[142],"area":[143],"\u22480.043mm":[148],"<sup":[149],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[150],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[151],".":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":21},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":20},{"year":2020,"cited_by_count":18},{"year":2019,"cited_by_count":16},{"year":2018,"cited_by_count":22},{"year":2017,"cited_by_count":31},{"year":2016,"cited_by_count":32},{"year":2015,"cited_by_count":27},{"year":2014,"cited_by_count":23},{"year":2013,"cited_by_count":22},{"year":2012,"cited_by_count":8}],"updated_date":"2026-03-29T08:15:47.926485","created_date":"2025-10-10T00:00:00"}