{"id":"https://openalex.org/W2167355919","doi":"https://doi.org/10.1109/jssc.2010.2091351","title":"Automatic Compensation of the Voltage Attenuation in 3-D Interconnection Based on Capacitive Coupling","display_name":"Automatic Compensation of the Voltage Attenuation in 3-D Interconnection Based on Capacitive Coupling","publication_year":2010,"publication_date":"2010-12-14","ids":{"openalex":"https://openalex.org/W2167355919","doi":"https://doi.org/10.1109/jssc.2010.2091351","mag":"2167355919"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2010.2091351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2091351","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087194868","display_name":"Eleonora Franchi Scarselli","orcid":"https://orcid.org/0000-0001-6994-2088"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Eleonora Franchi Scarselli","raw_affiliation_strings":["ARCES, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"ARCES, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083737379","display_name":"A. Gnudi","orcid":"https://orcid.org/0000-0002-2186-3468"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Gnudi","raw_affiliation_strings":["ARCES, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"ARCES, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066709887","display_name":"Federico Natali","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096308","display_name":"Institute of Materials for Electronics and Magnetism","ror":"https://ror.org/00z8ws214","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210096308","https://openalex.org/I4210155236"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Federico Natali","raw_affiliation_strings":["CNR-IMEM, Parma, Italy"],"affiliations":[{"raw_affiliation_string":"CNR-IMEM, Parma, Italy","institution_ids":["https://openalex.org/I4210096308"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025943165","display_name":"M. Scandiuzzo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mauro Scandiuzzo","raw_affiliation_strings":["STMicroelectronics, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Milan, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044201884","display_name":"R. Canegallo","orcid":"https://orcid.org/0000-0002-3381-0697"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Canegallo","raw_affiliation_strings":["STMicroelectronics, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Milan, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040667886","display_name":"R. Guerrieri","orcid":"https://orcid.org/0000-0002-8601-6884"},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Guerrieri","raw_affiliation_strings":["ARCES, University of Bologna, Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"ARCES, University of Bologna, Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5087194868"],"corresponding_institution_ids":["https://openalex.org/I9360294"],"apc_list":null,"apc_paid":null,"fwci":0.2886,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.66148495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"46","issue":"2","first_page":"498","last_page":"506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.46853509545326233},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.4641234874725342},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44187644124031067},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.41575175523757935},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3885539174079895},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2662540674209595},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25646936893463135},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1917577087879181},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15713495016098022},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.1170218288898468}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.46853509545326233},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.4641234874725342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44187644124031067},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.41575175523757935},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3885539174079895},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2662540674209595},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25646936893463135},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1917577087879181},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15713495016098022},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.1170218288898468}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2010.2091351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2091351","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:cris.unibo.it:11585/97457","is_oa":false,"landing_page_url":"http://hdl.handle.net/11585/97457","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W35513896","https://openalex.org/W1524885163","https://openalex.org/W1538352461","https://openalex.org/W1971966678","https://openalex.org/W1974002530","https://openalex.org/W2012182877","https://openalex.org/W2023264348","https://openalex.org/W2070333630","https://openalex.org/W2076133809","https://openalex.org/W2084828879","https://openalex.org/W2086481541","https://openalex.org/W2107304970","https://openalex.org/W2120427739","https://openalex.org/W2121527752","https://openalex.org/W2122714290","https://openalex.org/W2140823559","https://openalex.org/W2159163292","https://openalex.org/W2168063067","https://openalex.org/W2175000298","https://openalex.org/W2295688064","https://openalex.org/W6601426120","https://openalex.org/W6631343719","https://openalex.org/W6643909149","https://openalex.org/W6683759257"],"related_works":["https://openalex.org/W2338700700","https://openalex.org/W2359317704","https://openalex.org/W2090686886","https://openalex.org/W2345126914","https://openalex.org/W2001725794","https://openalex.org/W4299512078","https://openalex.org/W3117896574","https://openalex.org/W2258803289","https://openalex.org/W808690387","https://openalex.org/W2963680404"],"abstract_inverted_index":{"An":[0],"architecture":[1],"to":[2,40,67,93,183,190],"compensate":[3,41],"the":[4,24,27,32,43,105,171,187],"voltage":[5,44],"attenuation":[6],"introduced":[7],"by":[8],"3-D":[9,59,83],"capacitive":[10,63],"coupling":[11,64],"is":[12,16,85,108],"proposed.":[13],"The":[14,97],"scheme":[15],"based":[17,61],"on":[18,47,62],"a":[19,37,50,91,156],"calibration":[20,106],"channel":[21,102,107],"which":[22],"sets":[23],"gain":[25,29,166],"of":[26,31,99,104,159,170],"variable":[28],"amplifiers":[30],"signal":[33,101,177],"channels":[34],"in":[35,186],"such":[36],"way":[38],"as":[39,71,73],"for":[42,176],"attenuation.":[45],"Based":[46],"this":[48],"architecture,":[49],"prototype":[51],"has":[52],"been":[53],"designed":[54],"aimed":[55],"at":[56,87],"demonstrating":[57],"that":[58],"technology":[60,79],"allows":[65],"one":[66],"transmit":[68],"analog":[69],"signals":[70],"well":[72],"digital":[74],"ones.":[75],"CMOS":[76],"90":[77,109],"nm":[78],"was":[80,174],"used":[81],"and":[82,103,131,162],"assembly":[84],"done":[86],"die":[88],"level":[89],"using":[90],"face":[92,94],"stacking":[95],"procedure.":[96],"area":[98],"each":[100],"<formula":[110,119,126,133,141,148],"formulatype=\"inline\"":[111,120,127,134,142,149],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[112,121,128,135,143,150],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[113,122,136,144],"<tex":[114,123,137,145],"Notation=\"TeX\">$\\,":[115],"\\times":[116],"\\,$</tex></formula>":[117,139],"30":[118],"Notation=\"TeX\">$\\mu$</tex></formula>":[124,146],"m":[125,147],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex":[129,151],"Notation=\"TeX\">$^{2}$</tex></formula>":[130,152],"138":[132],"Notation=\"TeX\">$\\,\\times":[138],"191":[140],",":[153],"respectively,":[154],"with":[155],"power":[157],"consumption":[158],"1":[160,184],"mW":[161],"3.6":[163],"mW.":[164],"A":[165],"error":[167],"within":[168],"10%":[169],"nominal":[172],"value":[173],"measured":[175],"amplitudes":[178],"varying":[179],"from":[180],"200":[181],"mV":[182],"V":[185],"100":[188],"kHz":[189],"20":[191],"MHz":[192],"range.":[193]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}