{"id":"https://openalex.org/W1990823448","doi":"https://doi.org/10.1109/jssc.2010.2085970","title":"A 512kb 8T SRAM Macro Operating Down to 0.57\u2009V With an AC-Coupled Sense Amplifier and Embedded Data-Retention-Voltage Sensor in 45\u2009nm SOI CMOS","display_name":"A 512kb 8T SRAM Macro Operating Down to 0.57\u2009V With an AC-Coupled Sense Amplifier and Embedded Data-Retention-Voltage Sensor in 45\u2009nm SOI CMOS","publication_year":2010,"publication_date":"2010-12-10","ids":{"openalex":"https://openalex.org/W1990823448","doi":"https://doi.org/10.1109/jssc.2010.2085970","mag":"1990823448"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2010.2085970","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2085970","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029605412","display_name":"Masood Qazi","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Masood Qazi","raw_affiliation_strings":["Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA, USA","Microsyst. Technol. Lab., Massachusetts Inst. of Technol, Cambridge, MA, USA"],"affiliations":[{"raw_affiliation_string":"Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Microsyst. Technol. Lab., Massachusetts Inst. of Technol, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044532211","display_name":"Kevin Stawiasz","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin Stawiasz","raw_affiliation_strings":["Thomas J. Watson Research Laboratory, IBM, Yorktown Heights, NY, USA","Thomas J. Watson Res. Lab., IBM, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"Thomas J. Watson Research Laboratory, IBM, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"Thomas J. Watson Res. Lab., IBM, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109942953","display_name":"Leland Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leland Chang","raw_affiliation_strings":["Thomas J. Watson Research Laboratory, IBM, Yorktown Heights, NY, USA","Thomas J. Watson Res. Lab., IBM, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"Thomas J. Watson Research Laboratory, IBM, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"Thomas J. Watson Res. Lab., IBM, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084128470","display_name":"Anantha P. Chandrakasan","orcid":"https://orcid.org/0000-0002-5977-2748"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anantha P. Chandrakasan","raw_affiliation_strings":["Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA, USA","Microsyst. Technol. Lab., Massachusetts Inst. of Technol, Cambridge, MA, USA"],"affiliations":[{"raw_affiliation_string":"Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Microsyst. Technol. Lab., Massachusetts Inst. of Technol, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029605412"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":6.7603,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.96965661,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"46","issue":"1","first_page":"85","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.5552852153778076},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5487462282180786},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4360661506652832},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35471615195274353},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34460368752479553},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2433406412601471},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22442859411239624},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.17449721693992615}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.5552852153778076},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5487462282180786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4360661506652832},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35471615195274353},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34460368752479553},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2433406412601471},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22442859411239624},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.17449721693992615}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/jssc.2010.2085970","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2085970","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},{"id":"pmh:oai:dspace.mit.edu:1721.1/62194","is_oa":false,"landing_page_url":"http://hdl.handle.net/1721.1/62194","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE","raw_type":"http://purl.org/eprint/type/ConferencePaper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1527183359","https://openalex.org/W1536055436","https://openalex.org/W1966250416","https://openalex.org/W1989206638","https://openalex.org/W2001044025","https://openalex.org/W2033246483","https://openalex.org/W2063821159","https://openalex.org/W2067392247","https://openalex.org/W2083124406","https://openalex.org/W2095488885","https://openalex.org/W2096046678","https://openalex.org/W2096917901","https://openalex.org/W2098897333","https://openalex.org/W2099569060","https://openalex.org/W2101575856","https://openalex.org/W2101813923","https://openalex.org/W2103793078","https://openalex.org/W2105175332","https://openalex.org/W2109458212","https://openalex.org/W2119312496","https://openalex.org/W2120353978","https://openalex.org/W2126898248","https://openalex.org/W2127262354","https://openalex.org/W2148694647","https://openalex.org/W2164951898","https://openalex.org/W2788911864","https://openalex.org/W2789228616","https://openalex.org/W3139804307","https://openalex.org/W3149402879","https://openalex.org/W3151457670","https://openalex.org/W4247991081","https://openalex.org/W6675080249"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W3014521742","https://openalex.org/W2963177394","https://openalex.org/W2024638892","https://openalex.org/W763418848","https://openalex.org/W1595229445","https://openalex.org/W1965815883","https://openalex.org/W149041114","https://openalex.org/W4313359513"],"abstract_inverted_index":{"An":[0,73],"8T":[1],"SRAM":[2],"fabricated":[3],"in":[4],"45":[5],"<formula":[6,21,30,41,50],"formulatype=\"inline\"":[7,22,31,42,51],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[8,23,32,43,52],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex":[9,24,33,44,53],"Notation=\"TeX\">$\\,$</tex>":[10,45,54],"</formula>":[11,46,55],"nm":[12],"SOI":[13],"CMOS":[14],"exhibits":[15],"voltage":[16,64,90,101],"scalable":[17],"operation":[18,65],"from":[19,39],"1.2":[20],"Notation=\"TeX\">$\\,$</tex></formula>":[25,34],"V":[26,35],"down":[27],"to":[28,48,95],"0.57":[29],"with":[36,68,80],"access":[37],"times":[38],"400":[40],"ps":[47],"3.4":[49],"ns.":[56],"Timing":[57],"variation":[58],"and":[59],"the":[60,97,104,107],"challenge":[61],"of":[62,106],"low":[63],"are":[66],"addressed":[67],"an":[69],"AC-coupled":[70],"sense":[71],"amplifier.":[72],"area":[74],"efficient":[75],"data":[76,88],"path":[77],"is":[78],"achieved":[79],"a":[81,87],"regenerative":[82],"global":[83],"bitline":[84],"scheme.":[85],"Finally,":[86],"retention":[89],"sensor":[91],"has":[92],"been":[93],"developed":[94],"predict":[96],"mismatch-limited":[98],"minimum":[99],"standby":[100],"without":[102],"corrupting":[103],"contents":[105],"memory.":[108]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":10},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}