{"id":"https://openalex.org/W2151099736","doi":"https://doi.org/10.1109/jssc.2010.2074650","title":"A 16-Bit 100 to 160 MS/s SiGe BiCMOS Pipelined ADC With 100 dBFS SFDR","display_name":"A 16-Bit 100 to 160 MS/s SiGe BiCMOS Pipelined ADC With 100 dBFS SFDR","publication_year":2010,"publication_date":"2010-10-20","ids":{"openalex":"https://openalex.org/W2151099736","doi":"https://doi.org/10.1109/jssc.2010.2074650","mag":"2151099736"},"language":"nl","primary_location":{"id":"doi:10.1109/jssc.2010.2074650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2074650","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013934310","display_name":"Robert Payne","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Robert Payne","raw_affiliation_strings":["High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029803729","display_name":"Marco Corsi","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marco Corsi","raw_affiliation_strings":["High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043922009","display_name":"David G. Smith","orcid":"https://orcid.org/0000-0002-1363-9562"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Smith","raw_affiliation_strings":["High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078476407","display_name":"Tien-Ling Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tien-Ling Hsieh","raw_affiliation_strings":["High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039291751","display_name":"Scott Kaylor","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Scott Kaylor","raw_affiliation_strings":["High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"High Performance Analog Division, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5013934310"],"corresponding_institution_ids":["https://openalex.org/I117023288","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":1.0557,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.78435148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"45","issue":"12","first_page":"2613","last_page":"2622"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9735774397850037},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.7541215419769287},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.6287387013435364},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5883796811103821},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5268194675445557},{"id":"https://openalex.org/keywords/sample-and-hold","display_name":"Sample and hold","score":0.5234976410865784},{"id":"https://openalex.org/keywords/12-bit","display_name":"12-bit","score":0.5008161067962646},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.46784934401512146},{"id":"https://openalex.org/keywords/swing","display_name":"Swing","score":0.41994065046310425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41836225986480713},{"id":"https://openalex.org/keywords/nyquist-frequency","display_name":"Nyquist frequency","score":0.4173257350921631},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.4105331003665924},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.362165629863739},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33094722032546997},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.2806181311607361},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22038817405700684},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1324605643749237},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.12219688296318054},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11072838306427002}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9735774397850037},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.7541215419769287},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.6287387013435364},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5883796811103821},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5268194675445557},{"id":"https://openalex.org/C206565188","wikidata":"https://www.wikidata.org/wiki/Q836482","display_name":"Sample and hold","level":3,"score":0.5234976410865784},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.5008161067962646},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.46784934401512146},{"id":"https://openalex.org/C65655974","wikidata":"https://www.wikidata.org/wiki/Q14867674","display_name":"Swing","level":2,"score":0.41994065046310425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41836225986480713},{"id":"https://openalex.org/C98273374","wikidata":"https://www.wikidata.org/wiki/Q1501757","display_name":"Nyquist frequency","level":3,"score":0.4173257350921631},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.4105331003665924},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.362165629863739},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33094722032546997},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.2806181311607361},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22038817405700684},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1324605643749237},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.12219688296318054},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11072838306427002},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2010.2074650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2010.2074650","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8100000023841858}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"},{"id":"https://openalex.org/F4320309321","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1976374640","https://openalex.org/W2008280740","https://openalex.org/W2115712965","https://openalex.org/W2153314955","https://openalex.org/W2169707891","https://openalex.org/W2538482509","https://openalex.org/W4247016061","https://openalex.org/W6644485202","https://openalex.org/W6828853991"],"related_works":["https://openalex.org/W2348160167","https://openalex.org/W2381982958","https://openalex.org/W2361134113","https://openalex.org/W3082766528","https://openalex.org/W2759515872","https://openalex.org/W4327927710","https://openalex.org/W2542593952","https://openalex.org/W2035972461","https://openalex.org/W2907719525","https://openalex.org/W2016410180"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,9,21,31,49,65,70,88,100,110,124,132],"16-bit":[4],"analog-to-digital":[5],"converter":[6],"designed":[7],"in":[8],"complementary":[10,17],"SiGe":[11],"BiCMOS":[12],"SOI":[13],"process.":[14],"The":[15,153],"high-performance":[16],"BJTs":[18],"lead":[19],"to":[20,24,41,54,90],"switched-current":[22],"approach":[23],"the":[25,78,92,96,118,137,146],"signal":[26,82],"processing.":[27],"Although":[28],"it":[29],"uses":[30],"fairly":[32],"traditional":[33],"four-stage":[34],"pipeline":[35],"architecture,":[36],"several":[37],"techniques":[38],"are":[39],"incorporated":[40],"achieve":[42],"16":[43],"bits":[44],"of":[45,52,77,95,104,114,128],"distortion":[46],"performance":[47],"at":[48],"sample":[50,101],"rate":[51],"up":[53],"160":[55,133],"MHz.":[56],"For":[57,75],"improved":[58],"high":[59],"input":[60],"frequency":[61,103],"linearity":[62],"we":[63,86],"describe":[64,87],"track":[66],"and":[67,84,123,145,161],"hold":[68],"with":[69],"sampling":[71,135],"instant":[72],"modulation":[73],"scheme.":[74],"stability":[76],"current-mode":[79],"DAC":[80],"over":[81],"swing":[83],"temperature":[85],"scheme":[89],"increase":[91],"output":[93],"impedance":[94],"first":[97,119],"sub-DAC.":[98],"At":[99],"clock":[102],"122":[105],"MHz,":[106],"prototype":[107],"silicon":[108],"exhibits":[109],"spurious-free":[111],"dynamic":[112],"range":[113],"100":[115],"dBc":[116,144],"through":[117],"two":[120],"Nyquist":[121],"zones":[122],"signal-to":[125],"noise":[126],"ratio":[127],"77":[129],"dB.":[130,152],"With":[131],"MHz":[134],"clock,":[136],"measured":[138],"SFDR":[139],"is":[140,148],"better":[141,149],"than":[142,150],"90":[143],"SNR":[147],"74.5":[151],"ADC":[154],"dissipates":[155],"1.6":[156],"W":[157],"from":[158],"5":[159],"V":[160,163],"3.3":[162],"supplies.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}