{"id":"https://openalex.org/W2125741269","doi":"https://doi.org/10.1109/jssc.2009.2031024","title":"A 2.0 Gb/s Clock-Embedded Interface for Full-HD 10-Bit 120 Hz LCD Drivers With 1/5-Rate Noise-Tolerant Phase and Frequency Recovery","display_name":"A 2.0 Gb/s Clock-Embedded Interface for Full-HD 10-Bit 120 Hz LCD Drivers With 1/5-Rate Noise-Tolerant Phase and Frequency Recovery","publication_year":2009,"publication_date":"2009-12-01","ids":{"openalex":"https://openalex.org/W2125741269","doi":"https://doi.org/10.1109/jssc.2009.2031024","mag":"2125741269"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2009.2031024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2031024","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010680704","display_name":"Koichi Yamaguchi","orcid":"https://orcid.org/0000-0002-8074-379X"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichi Yamaguchi","raw_affiliation_strings":["Device Platforms Research Laboratories, NEC Corporation Limited, Sagamihara, Kanagawa, Japan","Device Platforms Res. Labs., NEC Corp., Sagamihara, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Device Platforms Research Laboratories, NEC Corporation Limited, Sagamihara, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"Device Platforms Res. Labs., NEC Corp., Sagamihara, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051988296","display_name":"Yoshihiko Hori","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshihiko Hori","raw_affiliation_strings":["NEC Electronics Corporation Limited, Kawasaki, Japan","NEC Electron. Corp., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Electronics Corporation Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Electron. Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110035302","display_name":"Keiichi Nakajima","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiichi Nakajima","raw_affiliation_strings":["NEC Electronics Corporation Limited, Kawasaki, Japan","NEC Electron. Corp., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Electronics Corporation Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Electron. Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055776289","display_name":"Kazumasa Suzuki","orcid":"https://orcid.org/0000-0002-9824-7620"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazumasa Suzuki","raw_affiliation_strings":["NEC Electronics Corporation Limited, Kawasaki, Japan","NEC Electron. Corp., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Electronics Corporation Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Electron. Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045168120","display_name":"Masayuki Mizuno","orcid":"https://orcid.org/0000-0002-1924-9856"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Mizuno","raw_affiliation_strings":["NEC Corporation Limited, Sagamihara, Japan","NEC Corporation, Sagamihara, Japan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Corporation Limited, Sagamihara, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Corporation, Sagamihara, Japan#TAB#","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038038857","display_name":"Hiroshi Hayama","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Hayama","raw_affiliation_strings":["NEC Electronics Corporation Limited, Kawasaki, Japan","NEC Electron. Corp., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Electronics Corporation Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Electron. Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7466,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.90604277,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"44","issue":"12","first_page":"3560","last_page":"3567"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8057341575622559},{"id":"https://openalex.org/keywords/clock-recovery","display_name":"Clock recovery","score":0.588038980960846},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.5596261620521545},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5148648023605347},{"id":"https://openalex.org/keywords/clock-rate","display_name":"Clock rate","score":0.5026636123657227},{"id":"https://openalex.org/keywords/data-transmission","display_name":"Data transmission","score":0.500830888748169},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.490308552980423},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4877975285053253},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.46309518814086914},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.44969213008880615},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.42542457580566406},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41051948070526123},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3772820830345154},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30511611700057983},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1956336796283722},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18699690699577332},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14356517791748047},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1346810758113861}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8057341575622559},{"id":"https://openalex.org/C2779835379","wikidata":"https://www.wikidata.org/wiki/Q2348121","display_name":"Clock recovery","level":4,"score":0.588038980960846},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.5596261620521545},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5148648023605347},{"id":"https://openalex.org/C178693496","wikidata":"https://www.wikidata.org/wiki/Q911691","display_name":"Clock rate","level":3,"score":0.5026636123657227},{"id":"https://openalex.org/C557945733","wikidata":"https://www.wikidata.org/wiki/Q389772","display_name":"Data transmission","level":2,"score":0.500830888748169},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.490308552980423},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4877975285053253},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.46309518814086914},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.44969213008880615},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.42542457580566406},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41051948070526123},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3772820830345154},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30511611700057983},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1956336796283722},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18699690699577332},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14356517791748047},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1346810758113861},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2009.2031024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2031024","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W599165874","https://openalex.org/W1963587303","https://openalex.org/W2025381630","https://openalex.org/W2053491589","https://openalex.org/W2059769801","https://openalex.org/W2076935827","https://openalex.org/W2110492360","https://openalex.org/W2112305136","https://openalex.org/W2120571356","https://openalex.org/W2221085202","https://openalex.org/W2303012689","https://openalex.org/W2306738904","https://openalex.org/W2465084154","https://openalex.org/W2543822865","https://openalex.org/W2788843607"],"related_works":["https://openalex.org/W2126197844","https://openalex.org/W2113302467","https://openalex.org/W2181640182","https://openalex.org/W2554461666","https://openalex.org/W1574257586","https://openalex.org/W2111818678","https://openalex.org/W3083817078","https://openalex.org/W2152017260","https://openalex.org/W1976203537","https://openalex.org/W1565428738"],"abstract_inverted_index":{"A":[0,39],"2.0":[1],"Gb/s":[2],"clock-embedded":[3],"interface":[4,66],"for":[5,12,71],"LCD":[6,33],"drivers,":[7],"Advanced-PPmL\u00bf,":[8],"has":[9],"been":[10,69],"developed":[11,41,70],"high-speed":[13],"data":[14,81],"transfer":[15],"and":[16,35,63,80],"reduced":[17],"area":[18],"in":[19,77,95],"transmission":[20],"media.":[21],"Only":[22],"one":[23],"pair":[24],"of":[25,59],"differential":[26],"signals":[27,62],"is":[28,84,99,106],"needed":[29],"to":[30,36],"control":[31,61],"the":[32,78,96],"driver":[34],"display":[37],"images.":[38],"newly":[40],"1/5-rate":[42],"phase":[43,60],"frequency":[44],"detector":[45],"helps":[46],"achieve":[47],"a":[48,54,64,88,103],"25%":[49],"power":[50],"reduction":[51],"compared":[52],"with":[53,87],"half-rate":[55],"architecture.":[56],"Pulse":[57],"filtering":[58],"4B5B-based":[65],"protocol":[67],"have":[68],"noise-tolerant":[72],"clock":[73,79,98],"recovery.":[74],"Power":[75],"consumption":[76],"recovery":[82],"(CDR)":[83],"93":[85],"mW":[86],"3.0":[89],"V":[90],"supply.":[91],"The":[92],"rms":[93],"jitter":[94],"recovered":[97],"11":[100],"ps":[101],"when":[102],"PRBS7":[104],"pattern":[105],"used.":[107]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}