{"id":"https://openalex.org/W2128188386","doi":"https://doi.org/10.1109/jssc.2009.2028944","title":"Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors","display_name":"Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2128188386","doi":"https://doi.org/10.1109/jssc.2009.2028944","mag":"2128188386"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2009.2028944","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2028944","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017861176","display_name":"Takashi Sat\u014d","orcid":"https://orcid.org/0000-0002-1577-8259"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]},{"id":"https://openalex.org/I39012071","display_name":"Kyoto College of Graduate Studies for Informatics","ror":"https://ror.org/05mzj8a56","country_code":"JP","type":"education","lineage":["https://openalex.org/I39012071"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Sato","raw_affiliation_strings":["Graduate School of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242","https://openalex.org/I39012071"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089655208","display_name":"Hiroyuki Ueyama","orcid":"https://orcid.org/0000-0001-5041-9377"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Ueyama","raw_affiliation_strings":["Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan","Sony Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Sony Corporation, Tokyo, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110726649","display_name":"Noriaki Nakayama","orcid":null},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriaki Nakayama","raw_affiliation_strings":["Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049015548","display_name":"Kazuya Masu","orcid":"https://orcid.org/0000-0002-7121-8440"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuya Masu","raw_affiliation_strings":["Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Integrated Research Institute, Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9802,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.76295056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"44","issue":"11","first_page":"2977","last_page":"2986"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.8752850294113159},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6656920313835144},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.6126976013183594},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6091573238372803},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5334774255752563},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4957822263240814},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4906719923019409},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44480758905410767},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4366312026977539},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.43544360995292664},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4167799651622772},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3995112180709839},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3897179961204529},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35024863481521606},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22862422466278076},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.061250001192092896}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.8752850294113159},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6656920313835144},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.6126976013183594},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6091573238372803},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5334774255752563},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4957822263240814},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4906719923019409},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44480758905410767},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4366312026977539},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.43544360995292664},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4167799651622772},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3995112180709839},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3897179961204529},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35024863481521606},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22862422466278076},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.061250001192092896},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2009.2028944","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2028944","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1607434217","https://openalex.org/W1661368752","https://openalex.org/W1967171495","https://openalex.org/W1986751201","https://openalex.org/W2019617711","https://openalex.org/W2042809000","https://openalex.org/W2076469371","https://openalex.org/W2090734667","https://openalex.org/W2104010258","https://openalex.org/W2116677528","https://openalex.org/W2120533357","https://openalex.org/W2125892790","https://openalex.org/W2129017435","https://openalex.org/W2131862714","https://openalex.org/W2139189220","https://openalex.org/W2140823559","https://openalex.org/W2152154820","https://openalex.org/W2152884157","https://openalex.org/W2153391946","https://openalex.org/W2158016726","https://openalex.org/W2158705165","https://openalex.org/W2168517613","https://openalex.org/W2170173908","https://openalex.org/W2171063844","https://openalex.org/W2563321024","https://openalex.org/W3147249158","https://openalex.org/W6646955768","https://openalex.org/W6673325452","https://openalex.org/W6683521617"],"related_works":["https://openalex.org/W2009852498","https://openalex.org/W1991521745","https://openalex.org/W3004587385","https://openalex.org/W4220771873","https://openalex.org/W2109147260","https://openalex.org/W2786811717","https://openalex.org/W2924345281","https://openalex.org/W2069364674","https://openalex.org/W2062767191","https://openalex.org/W2117738807"],"abstract_inverted_index":{"A":[0],"MOS":[1,120],"transistor-array":[2],"structure":[3,82,104],"for":[4],"accurate":[5,136],"subthreshold":[6,139],"current":[7,29,35,55,69,141],"characterization":[8],"is":[9],"presented.":[10],"Two":[11],"architectural":[12],"improvements":[13],"called":[14,22],"LCS":[15,64],"and":[16,18,59,83,115],"PES,":[17,47],"measured":[19],"data":[20],"treatment":[21],"MCC":[23],"are":[24],"utilized.":[25],"The":[26,46,66,79,102],"LCS,":[27],"leakage":[28,34,44,140],"cut-off":[30],"switch,":[31],"reduces":[32,52],"unwanted":[33],"of":[36,62,93,119,129,138,144],"the":[37,42,53,63,84,91],"non-target":[38],"devices":[39,134],"which":[40],"masks":[41],"target":[43],"current.":[45,78],"potential":[48],"equalizing":[49],"supply,":[50],"further":[51],"masking":[54,68,77],"by":[56,74],"setting":[57],"source":[58],"drain":[60],"terminals":[61],"equal.":[65],"MCC,":[67],"cancellation,":[70],"improves":[71],"measurement":[72,137],"accuracy":[73],"subtracting":[75],"remaining":[76],"proposed":[80],"circuit":[81],"procedure":[85],"virtually":[86],"eliminate":[87],"usual":[88],"constraint":[89],"on":[90],"number":[92],"transistors":[94,121],"that":[95],"can":[96],"be":[97,123],"present":[98],"in":[99,109],"an":[100],"array.":[101],"array":[103,126],"also":[105],"offers":[106],"greater":[107],"flexibility":[108],"choosing":[110],"a":[111,145],"row-column":[112],"aspect":[113],"ratio":[114],"allows":[116],"different":[117],"types":[118],"to":[122],"interweaved.":[124],"Experimental":[125],"design":[127],"consisting":[128],"1023":[130],"low":[131],"threshold":[132],"voltage":[133],"demonstrated":[135],"with":[142],"precision":[143],"few":[146],"picoamperes.":[147]},"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}