{"id":"https://openalex.org/W2062998260","doi":"https://doi.org/10.1109/jssc.2009.2028927","title":"A Hybrid Spur Compensation Technique for Finite-Modulo Fractional-<i>N</i> Phase-Locked Loops","display_name":"A Hybrid Spur Compensation Technique for Finite-Modulo Fractional-<i>N</i> Phase-Locked Loops","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2062998260","doi":"https://doi.org/10.1109/jssc.2009.2028927","mag":"2062998260"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2009.2028927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2028927","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100425409","display_name":"Li Zhang","orcid":"https://orcid.org/0000-0001-5776-4552"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Li Zhang","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","Inst. of Microelectron., Tsinghua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Inst. of Microelectron., Tsinghua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102377706","display_name":"Xueyi Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xueyi Yu","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China","Dept. of Electron. Eng., TsingHua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Dept. of Electron. Eng., TsingHua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111630204","display_name":"Yuanfeng Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanfeng Sun","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","Inst. of Microelectron., Tsinghua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Inst. of Microelectron., Tsinghua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025671584","display_name":"Woogeun Rhee","orcid":"https://orcid.org/0000-0003-2473-4132"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Woogeun Rhee","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","Inst. of Microelectron., Tsinghua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Inst. of Microelectron., Tsinghua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001055333","display_name":"Dawn Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113610","display_name":"Westford Academy","ror":"https://ror.org/01wag9e37","country_code":"US","type":"education","lineage":["https://openalex.org/I4210113610"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dawn Wang","raw_affiliation_strings":["IBM, Westford, MA, USA","[IBM, Westford, MA, USA]"],"affiliations":[{"raw_affiliation_string":"IBM, Westford, MA, USA","institution_ids":["https://openalex.org/I4210113610"]},{"raw_affiliation_string":"[IBM, Westford, MA, USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356864","display_name":"Zhihua Wang","orcid":"https://orcid.org/0000-0001-6567-0759"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihua Wang","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","Inst. of Microelectron., Tsinghua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Inst. of Microelectron., Tsinghua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100428550","display_name":"Hongyi Chen","orcid":"https://orcid.org/0000-0002-6232-5463"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyi Chen","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","Inst. of Microelectron., Tsinghua Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Inst. of Microelectron., Tsinghua Univ., Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100425409"],"corresponding_institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"],"apc_list":null,"apc_paid":null,"fwci":1.59492666,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.85751904,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"44","issue":"11","first_page":"2922","last_page":"2934"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.6971496343612671},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.6800884008407593},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.593345582485199},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5285844802856445},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.5172522664070129},{"id":"https://openalex.org/keywords/spur","display_name":"Spur","score":0.44484102725982666},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36206716299057007},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3514254093170166},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2350696623325348}],"concepts":[{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.6971496343612671},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.6800884008407593},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.593345582485199},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5285844802856445},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.5172522664070129},{"id":"https://openalex.org/C2779821383","wikidata":"https://www.wikidata.org/wiki/Q7581537","display_name":"Spur","level":2,"score":0.44484102725982666},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36206716299057007},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3514254093170166},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2350696623325348},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2009.2028927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2009.2028927","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1565131414","https://openalex.org/W1584617889","https://openalex.org/W1918201491","https://openalex.org/W1929584256","https://openalex.org/W1965174157","https://openalex.org/W1984840439","https://openalex.org/W2010437213","https://openalex.org/W2067936044","https://openalex.org/W2072192908","https://openalex.org/W2112664896","https://openalex.org/W2113497523","https://openalex.org/W2117917559","https://openalex.org/W2140532588","https://openalex.org/W2146298723","https://openalex.org/W2150279044","https://openalex.org/W2153058213","https://openalex.org/W2296506225","https://openalex.org/W2788760024","https://openalex.org/W3217473293","https://openalex.org/W4235071178","https://openalex.org/W6633745648","https://openalex.org/W6640170093","https://openalex.org/W6697087388"],"related_works":["https://openalex.org/W2540832666","https://openalex.org/W4286579627","https://openalex.org/W1851259350","https://openalex.org/W272184114","https://openalex.org/W2117747481","https://openalex.org/W2394282069","https://openalex.org/W2971609434","https://openalex.org/W2141726610","https://openalex.org/W4281672152","https://openalex.org/W2092902455"],"abstract_inverted_index":{"A":[0,12,66],"finite-modulo":[1],"fractional-N":[2,22,69],"PLL":[3,70,113],"utilizing":[4],"a":[5],"low-bit":[6],"high-order":[7,79],"DeltaSigma":[8,15,81],"modulator":[9,16,127],"is":[10,37,71,95,107,122],"presented.":[11],"4-bit":[13],"fourth-order":[14],"not":[17],"only":[18,119],"performs":[19],"non-dithered":[20],"16-modulo":[21],"operation":[23],"but":[24],"also":[25],"offers":[26],"less":[27,91],"spur":[28,35,85,88],"generation":[29],"with":[30],"negligible":[31],"quantization":[32],"noise.":[33],"Further":[34],"reduction":[36],"achieved":[38,96],"by":[39,124],"charge":[40,62],"compensation":[41,64,129],"in":[42,49,73,117],"the":[43,50,56,61,87,98,101,125],"voltage":[44],"domain":[45],"and":[46,83,128],"phase":[47],"interpolation":[48],"time":[51],"domain,":[52],"which":[53,118],"significantly":[54],"relaxes":[55],"dynamic":[57],"range":[58],"requirement":[59],"of":[60,90,100],"pump":[63],"current.":[65],"1.8-2.6":[67],"GHz":[68],"implemented":[72],"0.18":[74],"mum":[75],"CMOS.":[76],"By":[77],"employing":[78],"deterministic":[80],"modulation":[82],"hybrid":[84],"compensation,":[86],"level":[89],"than":[92],"-55":[93],"dBc":[94],"when":[97],"ratio":[99],"bandwidth":[102],"to":[103,109],"minimum":[104],"frequency":[105],"resolution":[106],"set":[108],"1/4.":[110],"The":[111],"prototype":[112],"consumes":[114],"35.3":[115],"mW":[116,121],"2.7":[120],"consumed":[123],"digital":[126],"circuits.":[130]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}