{"id":"https://openalex.org/W2126846547","doi":"https://doi.org/10.1109/jssc.2008.2006314","title":"A 108 dB SNR, 1.1 mW Oversampling Audio DAC With A Three-level DEM Technique","display_name":"A 108 dB SNR, 1.1 mW Oversampling Audio DAC With A Three-level DEM Technique","publication_year":2008,"publication_date":"2008-12-01","ids":{"openalex":"https://openalex.org/W2126846547","doi":"https://doi.org/10.1109/jssc.2008.2006314","mag":"2126846547"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2008.2006314","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2008.2006314","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111940153","display_name":"Khiem Nguyen","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Khiem Nguyen","raw_affiliation_strings":["Analog Devices Inc.orporated, Wilmington, MA, USA","Analog Devices, Wilmington, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices Inc.orporated, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"Analog Devices, Wilmington, MA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063095825","display_name":"Abhishek Bandyopadhyay","orcid":"https://orcid.org/0000-0001-7062-4343"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhishek Bandyopadhyay","raw_affiliation_strings":["Analog Devices Inc.orporated, Wilmington, MA, USA","Analog Devices, Wilmington, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices Inc.orporated, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"Analog Devices, Wilmington, MA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083791942","display_name":"Bob Adams","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bob Adams","raw_affiliation_strings":["Analog Devices Inc.orporated, Wilmington, MA, USA","Analog Devices, Wilmington, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices Inc.orporated, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"Analog Devices, Wilmington, MA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111443294","display_name":"Karl Sweetland","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karl Sweetland","raw_affiliation_strings":["Analog Devices Inc.orporated, Wilmington, MA, USA","Analog Devices, Wilmington, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices Inc.orporated, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"Analog Devices, Wilmington, MA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079097034","display_name":"Paul Baginski","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Baginski","raw_affiliation_strings":["Analog Devices Inc.orporated, Wilmington, MA, USA","Analog Devices, Wilmington, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices Inc.orporated, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]},{"raw_affiliation_string":"Analog Devices, Wilmington, MA","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.2515,"has_fulltext":false,"cited_by_count":46,"citation_normalized_percentile":{"value":0.91578645,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"43","issue":"12","first_page":"2592","last_page":"2600"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.9485756158828735},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.7334926724433899},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7008770108222961},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5051749348640442},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49460646510124207},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4896314740180969},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4833950102329254},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.46886780858039856},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4003522992134094},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3720249533653259},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3636387288570404},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.304412305355072},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16832679510116577},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09792035818099976}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.9485756158828735},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.7334926724433899},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7008770108222961},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5051749348640442},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49460646510124207},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4896314740180969},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4833950102329254},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.46886780858039856},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4003522992134094},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3720249533653259},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3636387288570404},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.304412305355072},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16832679510116577},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09792035818099976},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2008.2006314","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2008.2006314","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.699999988079071}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309321","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1493491578","https://openalex.org/W1497374369","https://openalex.org/W1507783347","https://openalex.org/W1521325516","https://openalex.org/W1531446014","https://openalex.org/W1594101521","https://openalex.org/W1998284495","https://openalex.org/W2001449089","https://openalex.org/W2035810198","https://openalex.org/W2043596240","https://openalex.org/W2100427892","https://openalex.org/W2101367341","https://openalex.org/W2142367698","https://openalex.org/W3143511946","https://openalex.org/W3151229195"],"related_works":["https://openalex.org/W2766503024","https://openalex.org/W4206637278","https://openalex.org/W4386005305","https://openalex.org/W3082051559","https://openalex.org/W2781247653","https://openalex.org/W4386214543","https://openalex.org/W2542642610","https://openalex.org/W1511153161","https://openalex.org/W2143648845","https://openalex.org/W2995582362"],"abstract_inverted_index":{"A":[0],"low":[1],"power":[2],"audio":[3],"oversampling":[4],"SigmaDelta":[5],"digital-to-analog":[6],"converter":[7,42],"(DAC)":[8],"with":[9],"a":[10,46,70],"three-level":[11],"(+1,":[12],"0,-1)":[13],"dynamic-element-matching":[14],"(DEM)":[15],"technique":[16],"and":[17,36],"an":[18],"inter-symbol":[19],"interference-free":[20],"(ISI)":[21],"output":[22],"stage":[23],"is":[24,43],"presented.":[25,40],"Solutions":[26],"for":[27],"design":[28],"challenges":[29],"such":[30],"as":[31],"ISI,":[32],"clock":[33],"jitter":[34],"sensitivity,":[35],"out-of-band":[37],"noise":[38],"are":[39],"The":[41],"fabricated":[44],"in":[45],"0.18":[47],"mum":[48],"CMOS":[49],"process,":[50],"occupies":[51],"0.55":[52],"mm":[53],"<sup":[54],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[55],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[56],",":[57],"achieves":[58],"108":[59],"dB":[60,64],"dynamic":[61],"range,":[62],"-98":[63],"THD":[65],"+":[66],"N":[67],"while":[68],"consumes":[69],"total":[71],"of":[72],"1.1":[73],"mW":[74],"per":[75],"channel":[76],"at":[77],"1.8":[78],"V":[79],"supply.":[80]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}