{"id":"https://openalex.org/W2159575622","doi":"https://doi.org/10.1109/jssc.2008.2006311","title":"A Noise-Coupled Time-Interleaved Delta-Sigma ADC With 4.2 MHz Bandwidth, ${-}$98 dB THD, and 79 dB SNDR","display_name":"A Noise-Coupled Time-Interleaved Delta-Sigma ADC With 4.2 MHz Bandwidth, ${-}$98 dB THD, and 79 dB SNDR","publication_year":2008,"publication_date":"2008-12-01","ids":{"openalex":"https://openalex.org/W2159575622","doi":"https://doi.org/10.1109/jssc.2008.2006311","mag":"2159575622"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2008.2006311","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2008.2006311","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085331377","display_name":"Kyehyung Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I1322669654","display_name":"Conexant (United States)","ror":"https://ror.org/05rx1xe20","country_code":"US","type":"company","lineage":["https://openalex.org/I1322669654"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kyehyung Lee","raw_affiliation_strings":["Conexant Systems, Inc., Newport Beach, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Conexant Systems, Inc., Newport Beach, CA, USA","institution_ids":["https://openalex.org/I1322669654"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035114147","display_name":"Jeongseok Chae","orcid":"https://orcid.org/0000-0003-4040-1143"},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeongseok Chae","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070032888","display_name":"Mitsuru Aniya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210102907","display_name":"Asahi Kasei (Japan)","ror":"https://ror.org/018wp0236","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210102907"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuru Aniya","raw_affiliation_strings":["Asahi Kasei EMD Corporation, Atsugi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Asahi Kasei EMD Corporation, Atsugi, Japan","institution_ids":["https://openalex.org/I4210102907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018272165","display_name":"Koichi Hamashita","orcid":null},"institutions":[{"id":"https://openalex.org/I4210102907","display_name":"Asahi Kasei (Japan)","ror":"https://ror.org/018wp0236","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210102907"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichi Hamashita","raw_affiliation_strings":["Asahi Kasei EMD Corporation, Atsugi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Asahi Kasei EMD Corporation, Atsugi, Japan","institution_ids":["https://openalex.org/I4210102907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050364660","display_name":"K. Takasuka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210102907","display_name":"Asahi Kasei (Japan)","ror":"https://ror.org/018wp0236","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210102907"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kaoru Takasuka","raw_affiliation_strings":["Asahi Kasei EMD Corporation, Atsugi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Asahi Kasei EMD Corporation, Atsugi, Japan","institution_ids":["https://openalex.org/I4210102907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047494413","display_name":"Seiji Takeuchi","orcid":"https://orcid.org/0000-0001-9254-7174"},"institutions":[{"id":"https://openalex.org/I4210102907","display_name":"Asahi Kasei (Japan)","ror":"https://ror.org/018wp0236","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210102907"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seiji Takeuchi","raw_affiliation_strings":["Asahi Kasei EMD Corporation, Atsugi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Asahi Kasei EMD Corporation, Atsugi, Japan","institution_ids":["https://openalex.org/I4210102907"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045933551","display_name":"G\u00e1bor C. Temes","orcid":"https://orcid.org/0000-0002-0617-4875"},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gabor C. Temes","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5085331377"],"corresponding_institution_ids":["https://openalex.org/I1322669654"],"apc_list":null,"apc_paid":null,"fwci":6.2453,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.96680313,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"43","issue":"12","first_page":"2601","last_page":"2612"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8016257286071777},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6182241439819336},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6102474927902222},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.5965515971183777},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.5721908211708069},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.5122284293174744},{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.48756879568099976},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.486578106880188},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.469896525144577},{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.46771305799484253},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.460027813911438},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.45993757247924805},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.45398300886154175},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44226643443107605},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37184470891952515},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.3524472713470459},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31463927030563354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2960733473300934},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21717780828475952},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12648844718933105},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.06367754936218262}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8016257286071777},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6182241439819336},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6102474927902222},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.5965515971183777},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.5721908211708069},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.5122284293174744},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.48756879568099976},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.486578106880188},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.469896525144577},{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.46771305799484253},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.460027813911438},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.45993757247924805},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.45398300886154175},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44226643443107605},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37184470891952515},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.3524472713470459},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31463927030563354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2960733473300934},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21717780828475952},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12648844718933105},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.06367754936218262},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2008.2006311","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2008.2006311","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7300000190734863}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W605564925","https://openalex.org/W1038687093","https://openalex.org/W1509148781","https://openalex.org/W1511713390","https://openalex.org/W1513667884","https://openalex.org/W1555441383","https://openalex.org/W1602282536","https://openalex.org/W2023528146","https://openalex.org/W2078694031","https://openalex.org/W2097356796","https://openalex.org/W2097638226","https://openalex.org/W2104040946","https://openalex.org/W2105370842","https://openalex.org/W2113333016","https://openalex.org/W2119119508","https://openalex.org/W2129970709","https://openalex.org/W2140481264","https://openalex.org/W2143690596","https://openalex.org/W2147432114","https://openalex.org/W2148590923","https://openalex.org/W2149576061","https://openalex.org/W2157032197","https://openalex.org/W2166948256","https://openalex.org/W2291681534","https://openalex.org/W2537949331","https://openalex.org/W2988205170","https://openalex.org/W3148484537","https://openalex.org/W3174302516","https://openalex.org/W4232498893","https://openalex.org/W4299973078","https://openalex.org/W6670341082"],"related_works":["https://openalex.org/W2102815341","https://openalex.org/W2163667329","https://openalex.org/W2501348202","https://openalex.org/W2153490364","https://openalex.org/W2535089514","https://openalex.org/W2113057816","https://openalex.org/W2129321120","https://openalex.org/W2136602103","https://openalex.org/W2289098659","https://openalex.org/W2742753354"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,19,28,63,83],"wideband":[4],"high-linearity":[5],"\u00bf\u00bf":[6,23],"ADC.":[7],"It":[8],"uses":[9],"noise":[10,60],"coupling":[11,33],"combined":[12],"with":[13],"time":[14],"interleaving.":[15],"Two":[16],"versions":[17],"of":[18,41,59,79],"two-channel":[20],"time-interleaved":[21],"noise-coupled":[22],"ADC":[24],"were":[25],"realized":[26],"in":[27,51,82],"0.18-\u00bfm":[29],"CMOS":[30],"technology.":[31],"Noise":[32],"between":[34],"the":[35,38,42,57,67],"channels":[36],"increases":[37],"effective":[39],"order":[40],"noise-shaping":[43],"loops,":[44],"provides":[45],"dithering,":[46],"and":[47,76],"prevents":[48],"tone":[49],"generation":[50],"all":[52],"loops.":[53],"Time":[54],"interleaving":[55],"enhances":[56],"effects":[58],"coupling.":[61],"Using":[62],"1.5":[64],"V":[65],"supply,":[66],"device":[68],"achieved":[69],"excellent":[70],"linearity":[71],"(SFDR>100":[72],"dB,":[73],"THD=-98":[74],"dB)":[75],"an":[77],"SNDR":[78],"79":[80],"dB":[81],"4.2":[84],"MHz":[85],"signal":[86],"band.":[87]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-04-28T14:05:53.105641","created_date":"2025-10-10T00:00:00"}