{"id":"https://openalex.org/W2110801976","doi":"https://doi.org/10.1109/jssc.2002.1015693","title":"0.13-\u03bcm 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testability","display_name":"0.13-\u03bcm 32-Mb/64-Mb embedded DRAM core with high efficient redundancy and enhanced testability","publication_year":2002,"publication_date":"2002-07-01","ids":{"openalex":"https://openalex.org/W2110801976","doi":"https://doi.org/10.1109/jssc.2002.1015693","mag":"2110801976"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2002.1015693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2002.1015693","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072761940","display_name":"H. Kikukawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"H. Kikukawa","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068029780","display_name":"S. Tomishima","orcid":"https://orcid.org/0000-0001-8742-8576"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Tomishima","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033268192","display_name":"T. Tsuji","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Tsuji","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090303530","display_name":"Takeshi Kawasaki","orcid":"https://orcid.org/0000-0001-8036-8435"},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Kawasaki","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110248364","display_name":"S. Sakamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Sakamoto","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023771615","display_name":"Masahito Ishikawa","orcid":"https://orcid.org/0000-0001-6390-1031"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Ishikawa","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060115267","display_name":"W. Abe","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"W. Abe","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019285198","display_name":"H. Tanizaki","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Tanizaki","raw_affiliation_strings":["Mitsubishi Electric Engineering Company, Ltd., Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Engineering Company, Ltd., Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064565558","display_name":"Hironari Kato","orcid":"https://orcid.org/0000-0003-1120-292X"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Kato","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002791884","display_name":"T. Uchikoba","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Uchikoba","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017962522","display_name":"T. Inokuchi","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Inokuchi","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063538418","display_name":"M. Senoh","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Senoh","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003665780","display_name":"Yoshifumi Fukushima","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Fukushima","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000901717","display_name":"M. Nirro","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Nirro","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046392123","display_name":"Masayuki Maruta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Maruta","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068739781","display_name":"A. Shibayama","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Shibayama","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037500908","display_name":"T. Ooishi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ooishi","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043035798","display_name":"Kunimasa Takahashi","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Takahashi","raw_affiliation_strings":["Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Advanced LSI Technology Development Center, Semiconductor Company, Matsushita Electric Industrial Company Ltd., Kyoto, Japan","institution_ids":["https://openalex.org/I1283155146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046126929","display_name":"Hideto Hidaka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Hidaka","raw_affiliation_strings":["Mitsubishi Electric Corporation, Itami, Hyogo, Japan"],"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation, Itami, Hyogo, Japan","institution_ids":["https://openalex.org/I4210133125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":19,"corresponding_author_ids":["https://openalex.org/A5072761940"],"corresponding_institution_ids":["https://openalex.org/I1283155146"],"apc_list":null,"apc_paid":null,"fwci":0.3394,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59604677,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":"7","first_page":"932","last_page":"940"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9613277316093445},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8049290180206299},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6166263222694397},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5936281681060791},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5353150367736816},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.45171597599983215},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.4325656592845917},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4200665354728699},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3977115750312805},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2571259140968323},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2084505558013916},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.19936689734458923}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9613277316093445},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8049290180206299},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6166263222694397},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5936281681060791},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5353150367736816},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.45171597599983215},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.4325656592845917},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4200665354728699},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3977115750312805},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2571259140968323},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2084505558013916},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.19936689734458923},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2002.1015693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2002.1015693","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.800000011920929,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1501001773","https://openalex.org/W1514086256","https://openalex.org/W2110801976","https://openalex.org/W2112758124","https://openalex.org/W2116837434","https://openalex.org/W2146707697","https://openalex.org/W2171386830","https://openalex.org/W2175767912","https://openalex.org/W2181084877","https://openalex.org/W2606962214","https://openalex.org/W2788029759"],"related_works":["https://openalex.org/W1530056031","https://openalex.org/W2074922484","https://openalex.org/W3004383742","https://openalex.org/W4382618663","https://openalex.org/W2063061014","https://openalex.org/W4225327811","https://openalex.org/W1902394829","https://openalex.org/W1983178358","https://openalex.org/W2269247540","https://openalex.org/W2105633922"],"abstract_inverted_index":{"This":[0,60],"paper":[1],"describes":[2],"the":[3,6,39,55,89,92,98],"32-Mb":[4,40],"and":[5,33,42,49],"64-Mb":[7,56],"embedded":[8,24,93],"DRAM":[9,25,94,99],"core":[10,43,61,100],"with":[11],"high":[12],"efficient":[13],"redundancy,":[14],"which":[15],"is":[16],"fabricated":[17],"using":[18],"0.13-/spl":[19],"mu/m":[20],"triple-well":[21],"4-level":[22],"Cu":[23],"technology.":[26],"Core":[27],"size":[28,44],"of":[29,36,45,52,91],"18.9":[30],"mm/sup":[31,47],"2/":[32,48],"cell":[34,50],"efficiency":[35,51],"51.3%":[37],"for":[38,54],"capacity,":[41],"33.4":[46],"58.1%":[53],"capacity":[57],"are":[58],"realized.":[59],"can":[62],"achieve":[63],"230-MHz":[64],"burst":[65],"access":[66],"at":[67],"1.0-V":[68],"power-supply":[69],"condition":[70],"by":[71],"adopting":[72],"a":[73,103],"new":[74],"data":[75],"bus":[76],"architecture:":[77],"merged":[78],"shift":[79],"column":[80],"redundancy.":[81],"We":[82],"implemented":[83],"four":[84],"test":[85,101,105],"functions":[86],"to":[87],"improve":[88],"testability":[90],"core.":[95],"It":[96],"realizes":[97],"in":[102],"logic":[104],"environment.":[106]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}