{"id":"https://openalex.org/W2131875788","doi":"https://doi.org/10.1109/jssc.2002.1015686","title":"Novel cell-AGC technique for burst-mode CMOS preamplifier with wide dynamic range and high sensitivity for ATM-PON system","display_name":"Novel cell-AGC technique for burst-mode CMOS preamplifier with wide dynamic range and high sensitivity for ATM-PON system","publication_year":2002,"publication_date":"2002-07-01","ids":{"openalex":"https://openalex.org/W2131875788","doi":"https://doi.org/10.1109/jssc.2002.1015686","mag":"2131875788"},"language":"en","primary_location":{"id":"doi:10.1109/jssc.2002.1015686","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2002.1015686","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065927710","display_name":"Shinji Yamashita","orcid":"https://orcid.org/0000-0001-7140-6452"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"S. Yamashita","raw_affiliation_strings":["Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","FUJITSU LABORATORIES LTD.,Kanagawa,Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD.,Kanagawa,Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000298843","display_name":"Satoshi Ide","orcid":"https://orcid.org/0000-0001-8254-3700"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Ide","raw_affiliation_strings":["Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","FUJITSU LABORATORIES LTD.,Kanagawa,Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD.,Kanagawa,Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084606471","display_name":"K. Mori","orcid":"https://orcid.org/0000-0002-8521-0028"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Mori","raw_affiliation_strings":["Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","FUJITSU LABORATORIES LTD.,Kanagawa,Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD.,Kanagawa,Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109996973","display_name":"A. Hayakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Hayakawa","raw_affiliation_strings":["Fujitsu VLSI Limited, Kasugai, Aichi, Japan","[Fujitsu VLSI Limited, Kasugai, Aichi, Japan]"],"affiliations":[{"raw_affiliation_string":"Fujitsu VLSI Limited, Kasugai, Aichi, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"[Fujitsu VLSI Limited, Kasugai, Aichi, Japan]","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064535049","display_name":"Natsuki Ueno","orcid":"https://orcid.org/0000-0002-5906-563X"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Ueno","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Kanagawa, Japan","Fujitsu Laboratories Limited, Kawasaki, Kanagawa, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Kanagawa, Japan#TAB#","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071495044","display_name":"Kazuhiro Tanaka","orcid":"https://orcid.org/0000-0003-3533-2390"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Tanaka","raw_affiliation_strings":["Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","[Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan]"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"[Fujitsu Laboratories Limited, Atsugi, Kanagawa, Japan]","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5065927710"],"corresponding_institution_ids":["https://openalex.org/I2252096349"],"apc_list":null,"apc_paid":null,"fwci":3.7338,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.93719784,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"37","issue":"7","first_page":"881","last_page":"886"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/preamplifier","display_name":"Preamplifier","score":0.9384313821792603},{"id":"https://openalex.org/keywords/transimpedance-amplifier","display_name":"Transimpedance amplifier","score":0.8545054197311401},{"id":"https://openalex.org/keywords/burst-mode","display_name":"Burst mode (computing)","score":0.7990332841873169},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7242014408111572},{"id":"https://openalex.org/keywords/automatic-gain-control","display_name":"Automatic gain control","score":0.6541352272033691},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.6310054063796997},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5850633978843689},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5285576581954956},{"id":"https://openalex.org/keywords/wide-dynamic-range","display_name":"Wide dynamic range","score":0.5071897506713867},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4172891080379486},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33512216806411743},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23411273956298828},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.2191089689731598}],"concepts":[{"id":"https://openalex.org/C14245642","wikidata":"https://www.wikidata.org/wiki/Q399804","display_name":"Preamplifier","level":4,"score":0.9384313821792603},{"id":"https://openalex.org/C92631468","wikidata":"https://www.wikidata.org/wiki/Q215437","display_name":"Transimpedance amplifier","level":5,"score":0.8545054197311401},{"id":"https://openalex.org/C2779760598","wikidata":"https://www.wikidata.org/wiki/Q1017053","display_name":"Burst mode (computing)","level":2,"score":0.7990332841873169},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7242014408111572},{"id":"https://openalex.org/C177502760","wikidata":"https://www.wikidata.org/wiki/Q782524","display_name":"Automatic gain control","level":4,"score":0.6541352272033691},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6310054063796997},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5850633978843689},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5285576581954956},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.5071897506713867},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4172891080379486},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33512216806411743},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23411273956298828},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.2191089689731598}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jssc.2002.1015686","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jssc.2002.1015686","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2016015569","https://openalex.org/W2051081352","https://openalex.org/W2158033402","https://openalex.org/W2158212371","https://openalex.org/W2168879383"],"related_works":["https://openalex.org/W2563810016","https://openalex.org/W2364957113","https://openalex.org/W2003540266","https://openalex.org/W1639945270","https://openalex.org/W2322121849","https://openalex.org/W3149124782","https://openalex.org/W1916872782","https://openalex.org/W2516123313","https://openalex.org/W2131875788","https://openalex.org/W2059104063"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2,13,67],"novel":[3],"cell-AGC":[4,18],"technique":[5],"for":[6],"an":[7,45,109],"ATM-cell-based":[8],"burst":[9,31,76],"optical":[10],"receiver":[11],"on":[12,60],"156-Mb/s":[14],"subscriber":[15],"system.":[16],"The":[17],"controls":[19],"transimpedance":[20],"gain":[21],"according":[22],"to":[23,39,80,91],"the":[24,71,86,105,117],"burst-cell":[25],"power":[26,73],"and":[27,55,85,112,123],"enables":[28],"reception":[29],"of":[30,57,108],"signals":[32],"with":[33],"low":[34],"extinction":[35],"ratio.":[36],"In":[37],"addition,":[38],"realize":[40],"high":[41],"sensitivity,":[42],"we":[43],"developed":[44],"amplifier":[46],"that":[47,99],"is":[48],"stable":[49],"under":[50],"changes":[51],"in":[52,66,116],"ambient":[53],"conditions":[54],"deviations":[56],"transistor":[58],"characteristics":[59],"IC.":[61],"By":[62],"adopting":[63],"these":[64],"techniques":[65],"CMOS":[68],"preamplifier":[69],"IC,":[70],"detectable":[72],"difference":[74],"between":[75],"cells":[77],"was":[78,89],"enlarged":[79],"more":[81,121],"than":[82,93],"30":[83],"dB,":[84],"minimum":[87],"sensitivity":[88],"improved":[90],"less":[92],"-39.3":[94],"dBm.":[95],"These":[96],"performances":[97],"show":[98],"our":[100],"new":[101],"IC":[102,115],"fully":[103],"satisfies":[104],"high-sensitivity":[106],"specification":[107],"ATM-PON":[110],"system,":[111],"incorporating":[113],"this":[114],"system":[118],"makes":[119],"it":[120],"flexible":[122],"economical.":[124]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}