{"id":"https://openalex.org/W2057154950","doi":"https://doi.org/10.1109/jsac.1986.1146446","title":"Guest Editorial: Quality and Reliability Management","display_name":"Guest Editorial: Quality and Reliability Management","publication_year":1986,"publication_date":"1986-10-01","ids":{"openalex":"https://openalex.org/W2057154950","doi":"https://doi.org/10.1109/jsac.1986.1146446","mag":"2057154950"},"language":"en","primary_location":{"id":"doi:10.1109/jsac.1986.1146446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsac.1986.1146446","pdf_url":null,"source":{"id":"https://openalex.org/S90422530","display_name":"IEEE Journal on Selected Areas in Communications","issn_l":"0733-8716","issn":["0733-8716","1558-0008"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Selected Areas in Communications","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079648546","display_name":"Henry A. Malec","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122731","display_name":"Digital Wave (United States)","ror":"https://ror.org/02t3fqk56","country_code":"US","type":"company","lineage":["https://openalex.org/I4210122731"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H. Malec","raw_affiliation_strings":["Digital Equipment Corp., Littleton, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital Equipment Corp., Littleton, MA, USA","institution_ids":["https://openalex.org/I4210122731"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5079648546"],"corresponding_institution_ids":["https://openalex.org/I4210122731"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":"7","first_page":"1001","last_page":"1001"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.3294000029563904,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.3294000029563904,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.30090001225471497,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.27570000290870667,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8434431552886963},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6193001866340637},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.513184130191803},{"id":"https://openalex.org/keywords/quality-management","display_name":"Quality management","score":0.4765901267528534},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44184139370918274},{"id":"https://openalex.org/keywords/management-system","display_name":"Management system","score":0.1820373833179474}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8434431552886963},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6193001866340637},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.513184130191803},{"id":"https://openalex.org/C71405471","wikidata":"https://www.wikidata.org/wiki/Q757012","display_name":"Quality management","level":3,"score":0.4765901267528534},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44184139370918274},{"id":"https://openalex.org/C198783460","wikidata":"https://www.wikidata.org/wiki/Q629173","display_name":"Management system","level":2,"score":0.1820373833179474},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsac.1986.1146446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsac.1986.1146446","pdf_url":null,"source":{"id":"https://openalex.org/S90422530","display_name":"IEEE Journal on Selected Areas in Communications","issn_l":"0733-8716","issn":["0733-8716","1558-0008"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Selected Areas in Communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}