{"id":"https://openalex.org/W2071730288","doi":"https://doi.org/10.1109/jsac.1984.1146144","title":"Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems","display_name":"Reliability of Semiconductor Lasers and Detectors for Undersea Transmission Systems","publication_year":1984,"publication_date":"1984-11-01","ids":{"openalex":"https://openalex.org/W2071730288","doi":"https://doi.org/10.1109/jsac.1984.1146144","mag":"2071730288"},"language":"en","primary_location":{"id":"doi:10.1109/jsac.1984.1146144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsac.1984.1146144","pdf_url":null,"source":{"id":"https://openalex.org/S90422530","display_name":"IEEE Journal on Selected Areas in Communications","issn_l":"0733-8716","issn":["0733-8716","1558-0008"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Selected Areas in Communications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112287522","display_name":"Y. Nakano","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Y. Nakano","raw_affiliation_strings":["Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069986370","display_name":"H. Sudo","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Sudo","raw_affiliation_strings":["Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053334285","display_name":"G. Iwane","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"G. Iwane","raw_affiliation_strings":["Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070582874","display_name":"T. Matsumoto","orcid":"https://orcid.org/0009-0002-5973-2364"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Matsumoto","raw_affiliation_strings":["Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002643665","display_name":"T. Ikegami","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ikegami","raw_affiliation_strings":["Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Atsugi Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Atsugi, Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5112287522"],"corresponding_institution_ids":["https://openalex.org/I2251713219"],"apc_list":null,"apc_paid":null,"fwci":1.8335,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.8453071,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":"6","first_page":"985","last_page":"991"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8077031373977661},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6294397115707397},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.539141058921814},{"id":"https://openalex.org/keywords/semiconductor-laser-theory","display_name":"Semiconductor laser theory","score":0.5051229596138},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.5051124691963196},{"id":"https://openalex.org/keywords/semiconductor-detector","display_name":"Semiconductor detector","score":0.4664226174354553},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4574235677719116},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3810268044471741},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.3134686350822449},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27494072914123535},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16059601306915283},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15340495109558105}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8077031373977661},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6294397115707397},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.539141058921814},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.5051229596138},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5051124691963196},{"id":"https://openalex.org/C148704626","wikidata":"https://www.wikidata.org/wiki/Q257415","display_name":"Semiconductor detector","level":3,"score":0.4664226174354553},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4574235677719116},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3810268044471741},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.3134686350822449},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27494072914123535},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16059601306915283},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15340495109558105},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jsac.1984.1146144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jsac.1984.1146144","pdf_url":null,"source":{"id":"https://openalex.org/S90422530","display_name":"IEEE Journal on Selected Areas in Communications","issn_l":"0733-8716","issn":["0733-8716","1558-0008"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Selected Areas in Communications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/14","display_name":"Life below water"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1965392628","https://openalex.org/W1975075662","https://openalex.org/W1983151317","https://openalex.org/W2000507282","https://openalex.org/W2001442810","https://openalex.org/W2027539593","https://openalex.org/W2038763635","https://openalex.org/W2044617988","https://openalex.org/W2050732649","https://openalex.org/W2082267342","https://openalex.org/W2100147481","https://openalex.org/W2117979351","https://openalex.org/W2153659293","https://openalex.org/W2167159570","https://openalex.org/W2280478759"],"related_works":["https://openalex.org/W2366906938","https://openalex.org/W2349391998","https://openalex.org/W4205655149","https://openalex.org/W2000775715","https://openalex.org/W2068181668","https://openalex.org/W2297568236","https://openalex.org/W2534480362","https://openalex.org/W2004680861","https://openalex.org/W1984225143","https://openalex.org/W4245702891"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"the":[3,7,20,38,43],"strategy":[4],"for":[5,10,15,37,49],"establishing":[6],"reliability":[8,39,51],"assurance":[9,52],"LD's":[11,44],"and":[12,33,45],"APD's":[13],"available":[14],"undersea":[16],"transmission":[17],"systems.":[18],"On":[19],"basis":[21],"of":[22,40],"aging":[23],"data":[24],"during":[25],"more":[26],"than":[27],"10":[28],"<sup":[29],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[30],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">4</sup>":[31],"h":[32],"a":[34],"statistical":[35],"analysis":[36],"semiconductor":[41],"devices,":[42],"Ge-APD's":[46],"lifetest":[47],"plans":[48],"high":[50],"are":[53],"proposed.":[54]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}