{"id":"https://openalex.org/W2626626325","doi":"https://doi.org/10.1109/jproc.2017.2704638","title":"Aerospace Needs, Microelectronics, and the Quest for Reliability: 1962\u20131975 [Scanning Our Past]","display_name":"Aerospace Needs, Microelectronics, and the Quest for Reliability: 1962\u20131975 [Scanning Our Past]","publication_year":2017,"publication_date":"2017-06-16","ids":{"openalex":"https://openalex.org/W2626626325","doi":"https://doi.org/10.1109/jproc.2017.2704638","mag":"2626626325"},"language":"en","primary_location":{"id":"doi:10.1109/jproc.2017.2704638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jproc.2017.2704638","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020520234","display_name":"Paul E. Ceruzzi","orcid":"https://orcid.org/0000-0002-3308-6651"},"institutions":[{"id":"https://openalex.org/I103187081","display_name":"Smithsonian Institution","ror":"https://ror.org/01pp8nd67","country_code":"US","type":"funder","lineage":["https://openalex.org/I103187081"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Paul E. Ceruzzi","raw_affiliation_strings":["Smithsonian Institution, Washington, DC, US"],"raw_orcid":"https://orcid.org/0000-0002-3308-6651","affiliations":[{"raw_affiliation_string":"Smithsonian Institution, Washington, DC, US","institution_ids":["https://openalex.org/I103187081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5020520234"],"corresponding_institution_ids":["https://openalex.org/I103187081"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06038526,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"105","issue":"7","first_page":"1456","last_page":"1465"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.8233000040054321,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.8233000040054321,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12000","display_name":"Systems Engineering Methodologies and Applications","score":0.8145999908447266,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.8048999905586243,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/apollo","display_name":"Apollo","score":0.8053028583526611},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.7667090892791748},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.7622673511505127},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7162922620773315},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5620086193084717},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.47235071659088135},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.39083659648895264},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3059036433696747},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2779184877872467},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.23944693803787231},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.12389156222343445},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09574925899505615}],"concepts":[{"id":"https://openalex.org/C2779821442","wikidata":"https://www.wikidata.org/wiki/Q41633","display_name":"Apollo","level":2,"score":0.8053028583526611},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.7667090892791748},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.7622673511505127},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7162922620773315},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5620086193084717},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47235071659088135},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.39083659648895264},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3059036433696747},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2779184877872467},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.23944693803787231},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.12389156222343445},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09574925899505615},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C90856448","wikidata":"https://www.wikidata.org/wiki/Q431","display_name":"Zoology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jproc.2017.2704638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jproc.2017.2704638","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W237508748","https://openalex.org/W641396730","https://openalex.org/W643803686","https://openalex.org/W646178315","https://openalex.org/W2009957807","https://openalex.org/W2019610419","https://openalex.org/W2047589999","https://openalex.org/W2115452265","https://openalex.org/W2123620919","https://openalex.org/W2132923038","https://openalex.org/W2533642266","https://openalex.org/W2994067477","https://openalex.org/W4249064488","https://openalex.org/W4300880126","https://openalex.org/W6771349076"],"related_works":["https://openalex.org/W2054178368","https://openalex.org/W2001637022","https://openalex.org/W2749643947","https://openalex.org/W2921637885","https://openalex.org/W4244081656","https://openalex.org/W2981806746","https://openalex.org/W2148601393","https://openalex.org/W2937293962","https://openalex.org/W2935892485","https://openalex.org/W1974379742"],"abstract_inverted_index":{"This":[0],"month's":[1],"article":[2],"emphasizes":[3],"the":[4,11,17,26],"role":[5],"played":[6],"by":[7,21],"reliability":[8],"in":[9,25],"establishing":[10],"technology":[12],"of,":[13],"and":[14],"market":[15],"for,":[16],"silicon":[18],"integrated":[19],"circuit":[20],"citing":[22],"key":[23],"developments":[24],"Apollo":[27],"program.":[28]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}