{"id":"https://openalex.org/W1963990684","doi":"https://doi.org/10.1109/jproc.2012.2190577","title":"Direct Matrix Solution of Linear Complexity for Surface Integral-Equation-Based Impedance Extraction of Complicated 3-D Structures","display_name":"Direct Matrix Solution of Linear Complexity for Surface Integral-Equation-Based Impedance Extraction of Complicated 3-D Structures","publication_year":2012,"publication_date":"2012-06-01","ids":{"openalex":"https://openalex.org/W1963990684","doi":"https://doi.org/10.1109/jproc.2012.2190577","mag":"1963990684"},"language":"en","primary_location":{"id":"doi:10.1109/jproc.2012.2190577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jproc.2012.2190577","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086914051","display_name":"Wenwen Chai","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wenwen Chai","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","Sch. of Electr. & Comput. engineering, Purdue Univ., West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. engineering, Purdue Univ., West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032902075","display_name":"Dan Jiao","orcid":"https://orcid.org/0000-0002-4080-2716"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dan Jiao","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","Sch. of Electr. & Comput. engineering, Purdue Univ., West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. engineering, Purdue Univ., West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.7176,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.67170453,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"101","issue":"2","first_page":"372","last_page":"388"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.6543226838111877},{"id":"https://openalex.org/keywords/impedance-parameters","display_name":"Impedance parameters","score":0.6096206307411194},{"id":"https://openalex.org/keywords/inverse","display_name":"Inverse","score":0.5669661164283752},{"id":"https://openalex.org/keywords/integral-equation","display_name":"Integral equation","score":0.4776643216609955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4336582124233246},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37652015686035156},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3751928210258484},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.31060534715652466},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.2942643165588379},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1491626799106598},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13164401054382324},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12117695808410645},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09864681959152222}],"concepts":[{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.6543226838111877},{"id":"https://openalex.org/C113805353","wikidata":"https://www.wikidata.org/wiki/Q13424600","display_name":"Impedance parameters","level":3,"score":0.6096206307411194},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.5669661164283752},{"id":"https://openalex.org/C27016315","wikidata":"https://www.wikidata.org/wiki/Q580101","display_name":"Integral equation","level":2,"score":0.4776643216609955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4336582124233246},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37652015686035156},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3751928210258484},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.31060534715652466},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.2942643165588379},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1491626799106598},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13164401054382324},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12117695808410645},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09864681959152222},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jproc.2012.2190577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jproc.2012.2190577","pdf_url":null,"source":{"id":"https://openalex.org/S68686220","display_name":"Proceedings of the IEEE","issn_l":"0018-9219","issn":["0018-9219","1558-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1508675023","https://openalex.org/W1569304948","https://openalex.org/W1971994226","https://openalex.org/W1992615353","https://openalex.org/W2012371030","https://openalex.org/W2018419001","https://openalex.org/W2031528426","https://openalex.org/W2031697389","https://openalex.org/W2040187556","https://openalex.org/W2054380687","https://openalex.org/W2069045162","https://openalex.org/W2079279323","https://openalex.org/W2093686670","https://openalex.org/W2097957337","https://openalex.org/W2109733316","https://openalex.org/W2113904141","https://openalex.org/W2117049708","https://openalex.org/W2117630477","https://openalex.org/W2118986414","https://openalex.org/W2122845573","https://openalex.org/W2125439985","https://openalex.org/W2139928294","https://openalex.org/W2140005220","https://openalex.org/W2142998566","https://openalex.org/W2155558099","https://openalex.org/W2157089032","https://openalex.org/W2159860184","https://openalex.org/W2159994240","https://openalex.org/W2161045964","https://openalex.org/W2163074157","https://openalex.org/W2163219666","https://openalex.org/W2165443011","https://openalex.org/W2167861232","https://openalex.org/W3149603432","https://openalex.org/W4238190864","https://openalex.org/W4307272465","https://openalex.org/W6643049731"],"related_works":["https://openalex.org/W2031561209","https://openalex.org/W4317939968","https://openalex.org/W2103176649","https://openalex.org/W2909522479","https://openalex.org/W4390144857","https://openalex.org/W2093875897","https://openalex.org/W1658745266","https://openalex.org/W2104755141","https://openalex.org/W2981923629","https://openalex.org/W3204413683"],"abstract_inverted_index":{"We":[0],"develop":[1],"a":[2,23,30,88,96,105,125],"linear-complexity":[3],"direct":[4,27,58],"matrix":[5,34,41,49,90,106],"solution":[6,107],"for":[7,77,108],"the":[8,48,93],"surface":[9],"integral":[10],"equation":[11],"(IE)-based":[12],"impedance":[13,54],"extraction":[14,94],"of":[15,29,36,83,87,95],"arbitrarily":[16],"shaped":[17],"3-D":[18,98],"nonideal":[19],"conductors":[20],"embedded":[21],"in":[22,115],"dielectric":[24],"material.":[25],"A":[26],"inverse":[28,86],"highly":[31],"irregular":[32],"system":[33],"composed":[35],"both":[37,78],"dense":[38],"and":[39,73,80,121],"sparse":[40],"blocks":[42],"is":[43,104],"obtained":[44,114],"inO(N)":[45],"complexity":[46],"withNbeing":[47],"size.":[50],"It":[51],"outperforms":[52],"state-of-the-art":[53],"solvers,":[55,62],"be":[56],"they":[57],"solvers":[59],"or":[60],"iterative":[61],"with":[63],"fast":[64],"central":[65],"processing":[66],"unit":[67],"(CPU)":[68],"time,":[69],"modest":[70],"memory":[71,120],"consumption,":[72],"without":[74],"sacrificing":[75],"accuracy,":[76],"small":[79],"large":[81],"number":[82],"unknowns.":[84],"The":[85],"2.68-million-unknown":[89],"arising":[91],"from":[92],"large-scale":[97],"interconnect":[99],"having":[100],"128":[101],"buses,":[102],"which":[103],"2.68":[109],"million":[110],"right-hand":[111],"sides,":[112],"was":[113],"less":[116],"than":[117],"1.5":[118],"GB":[119],"1.3":[122],"h":[123],"on":[124],"single":[126],"CPU":[127],"running":[128],"at":[129],"3":[130],"GHz.":[131]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}