{"id":"https://openalex.org/W4409325825","doi":"https://doi.org/10.1109/jiot.2025.3559611","title":"Improved Digital Arctangent Demodulation Method With Doppler Signal at Special Sampling Rate for Laser Heterodyne Interferometer","display_name":"Improved Digital Arctangent Demodulation Method With Doppler Signal at Special Sampling Rate for Laser Heterodyne Interferometer","publication_year":2025,"publication_date":"2025-04-10","ids":{"openalex":"https://openalex.org/W4409325825","doi":"https://doi.org/10.1109/jiot.2025.3559611"},"language":"en","primary_location":{"id":"doi:10.1109/jiot.2025.3559611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2025.3559611","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115883453","display_name":"W. Ke","orcid":"https://orcid.org/0000-0001-9603-5280"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Ke","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-9603-5280","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102189105","display_name":"Xiujuan Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiujuan Feng","raw_affiliation_strings":["Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2896-3661","affiliations":[{"raw_affiliation_string":"Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111774060","display_name":"Longbiao He","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longbiao He","raw_affiliation_strings":["Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100697452","display_name":"Ping Yang","orcid":"https://orcid.org/0000-0002-2052-2215"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ping Yang","raw_affiliation_strings":["Division of General Office, National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of General Office, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039949603","display_name":"Feng Niu","orcid":"https://orcid.org/0000-0003-2465-647X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Niu","raw_affiliation_strings":["Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Mechanics and Acoustics Metrology, National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103493192","display_name":"R. Q. Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ronghua Fan","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0001-1598-9179","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101838005","display_name":"Rong Fan","orcid":"https://orcid.org/0000-0002-0233-1271"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rong Fan","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0233-1271","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yin Cao","orcid":"https://orcid.org/0009-0007-6301-525X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yin Cao","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0007-6301-525X","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028555453","display_name":"Lijing Li","orcid":"https://orcid.org/0000-0002-2676-4848"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijing Li","raw_affiliation_strings":["School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2676-4848","affiliations":[{"raw_affiliation_string":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5115883453"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.5999,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66797599,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"12","issue":"13","first_page":"25046","last_page":"25058"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.759904146194458},{"id":"https://openalex.org/keywords/doppler-effect","display_name":"Doppler effect","score":0.5963582992553711},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5864899754524231},{"id":"https://openalex.org/keywords/heterodyne","display_name":"Heterodyne (poetry)","score":0.5793327689170837},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.5638695955276489},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4883436858654022},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46638110280036926},{"id":"https://openalex.org/keywords/heterodyne-detection","display_name":"Heterodyne detection","score":0.45828336477279663},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4436340928077698},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.3888498544692993},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37099307775497437},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3318524658679962},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27998247742652893},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.18970224261283875},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08754116296768188},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.08616757392883301}],"concepts":[{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.759904146194458},{"id":"https://openalex.org/C142757262","wikidata":"https://www.wikidata.org/wiki/Q76436","display_name":"Doppler effect","level":2,"score":0.5963582992553711},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5864899754524231},{"id":"https://openalex.org/C2780497637","wikidata":"https://www.wikidata.org/wiki/Q16938394","display_name":"Heterodyne (poetry)","level":2,"score":0.5793327689170837},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.5638695955276489},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4883436858654022},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46638110280036926},{"id":"https://openalex.org/C204003914","wikidata":"https://www.wikidata.org/wiki/Q760140","display_name":"Heterodyne detection","level":3,"score":0.45828336477279663},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4436340928077698},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.3888498544692993},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37099307775497437},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3318524658679962},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27998247742652893},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.18970224261283875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08754116296768188},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.08616757392883301},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jiot.2025.3559611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2025.3559611","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1631360302","display_name":null,"funder_award_id":"52075513","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1596975731","https://openalex.org/W1988910606","https://openalex.org/W2012926680","https://openalex.org/W2117453234","https://openalex.org/W2121898104","https://openalex.org/W3093936992","https://openalex.org/W3120654895","https://openalex.org/W3121030020","https://openalex.org/W3147919432","https://openalex.org/W3162704841","https://openalex.org/W3183742665","https://openalex.org/W3208928778","https://openalex.org/W3216308399","https://openalex.org/W4205653363","https://openalex.org/W4205915265","https://openalex.org/W4206986632","https://openalex.org/W4210918333","https://openalex.org/W4225555931","https://openalex.org/W4226086745","https://openalex.org/W4229069834","https://openalex.org/W4281670795","https://openalex.org/W4286265133","https://openalex.org/W4293660256","https://openalex.org/W4297032820","https://openalex.org/W4312203939","https://openalex.org/W4312315410","https://openalex.org/W4317039594","https://openalex.org/W4317496080","https://openalex.org/W4320516659","https://openalex.org/W4324116485","https://openalex.org/W4367663272","https://openalex.org/W4376113333","https://openalex.org/W4380792714","https://openalex.org/W4381804210","https://openalex.org/W4385574893","https://openalex.org/W4385819734","https://openalex.org/W4396595935","https://openalex.org/W4398770767","https://openalex.org/W4400062117","https://openalex.org/W4400525823"],"related_works":["https://openalex.org/W2765711456","https://openalex.org/W4320929577","https://openalex.org/W1964388845","https://openalex.org/W2070629787","https://openalex.org/W2364953721","https://openalex.org/W1998735284","https://openalex.org/W2378288134","https://openalex.org/W2916288881","https://openalex.org/W2070375477","https://openalex.org/W2368598848"],"abstract_inverted_index":{"The":[0,41,221],"importance":[1],"of":[2,8,20,36,45,97,118,126,164,179,197],"vibration":[3,37,138,185,199,246],"monitoring":[4,247],"in":[5,13,17,33,214,241],"the":[6,18,34,46,53,64,67,72,75,90,95,98,102,116,127,132,137,146,150,155,161,165,175,180,184,194,198],"Internet":[7],"Things":[9],"(IoT)":[10],"is":[11,49,81,84],"reflected":[12],"many":[14],"aspects,":[15],"especially":[16],"fields":[19],"industry,":[21],"infrastructure,":[22],"health":[23],"monitoring,":[24],"etc.":[25],"Laser":[26],"heterodyne":[27,238],"interferometer":[28],"has":[29],"been":[30],"widely":[31],"used":[32],"measurement":[35,58],"displacement":[38,139],"and":[39,55,71,160,177,193,244],"velocity.":[40],"phase":[42,148],"demodulation":[43,79,158,225,234],"method":[44,80,135,159,182,226],"Doppler":[47,99,103,129,167,216,232],"signal":[48,92,100,104,233],"crucial":[50],"to":[51,87,173,190,204],"realizing":[52],"real-time":[54],"high":[56],"precision":[57],"with":[59,154,183,218],"wide":[60],"bandwidth.":[61],"To":[62],"reduce":[63],"requirements":[65],"for":[66,230,236],"data":[68],"acquisition":[69],"system":[70],"resource":[73],"consumption,":[74],"improved":[76,222],"digital":[77,91,223],"arctangent":[78,151,157,224],"proposed,":[82],"which":[83],"more":[85],"suitable":[86],"run":[88],"on":[89],"processor.":[93],"Utilizing":[94],"symmetry":[96],"spectrum,":[101],"can":[105,142],"be":[106,143],"acquired":[107],"by":[108,123],"special":[109],"Nyquist":[110],"or":[111,140],"bandpass":[112],"sampling":[113],"rates.":[114],"Then":[115],"pair":[117],"orthogonal":[119],"signals":[120,217],"are":[121,171],"generated":[122],"specific":[124],"delays":[125],"digitized":[128],"signals.":[130],"With":[131],"sine":[133],"approximation":[134],"(SAM),":[136],"velocity":[141,200],"obtained":[144],"from":[145,187,201],"unwrapped":[147],"after":[149],"calculation.":[152],"Compared":[153],"classical":[156],"commercial":[162],"decoder":[163],"laser":[166,237],"vibrometer":[168],"(LDV),":[169],"experiments":[170,209],"designed":[172],"demonstrate":[174],"feasibility":[176],"performance":[178],"proposed":[181],"frequency":[186],"500":[188],"Hz":[189],"1":[191],"MHz":[192],"peak":[195],"amplitude":[196],"31.63":[202],"lm/s":[203],"3.16":[205],"m/s.":[206],"Additionally,":[207],"simulation":[208],"further":[210],"explore":[211],"its":[212],"applicability":[213],"demodulating":[215],"asymmetric":[219],"spectrum.":[220],"offers":[227],"significant":[228],"potential":[229],"developing":[231],"systems":[235],"interferometers,":[239],"particularly":[240],"real-time,":[242],"efficient,":[243],"high-precision":[245],"applications.":[248]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-15T08:27:34.491423","created_date":"2025-10-10T00:00:00"}