{"id":"https://openalex.org/W4391640576","doi":"https://doi.org/10.1109/jiot.2024.3363837","title":"Gated Transient Fluctuation Dual Attention Unit Network for Long-Term Remaining Useful Life Prediction of Rotating Machinery Using IIoT","display_name":"Gated Transient Fluctuation Dual Attention Unit Network for Long-Term Remaining Useful Life Prediction of Rotating Machinery Using IIoT","publication_year":2024,"publication_date":"2024-02-08","ids":{"openalex":"https://openalex.org/W4391640576","doi":"https://doi.org/10.1109/jiot.2024.3363837"},"language":"en","primary_location":{"id":"doi:10.1109/jiot.2024.3363837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2024.3363837","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021012603","display_name":"Shuaiyong Li","orcid":"https://orcid.org/0000-0002-3914-5173"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuaiyong Li","raw_affiliation_strings":["Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075092261","display_name":"Chao Zhang","orcid":"https://orcid.org/0000-0001-8345-6238"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Zhang","raw_affiliation_strings":["Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100733028","display_name":"Liang Liu","orcid":"https://orcid.org/0000-0002-0112-1264"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Liu","raw_affiliation_strings":["Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023907064","display_name":"Xuyuntao Zhang","orcid":"https://orcid.org/0000-0002-2846-6377"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuyuntao Zhang","raw_affiliation_strings":["Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Industrial Internet of Things and Networked Control, Ministry of Education, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]},{"raw_affiliation_string":"Key Laboratory of Education Ministry for Industrial Internet of Things and Networked Control and the Institute of Industrial Internet, Chongqing University of Posts and Telecommunications, Chongqing, China","institution_ids":["https://openalex.org/I10535382"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5021012603"],"corresponding_institution_ids":["https://openalex.org/I10535382"],"apc_list":null,"apc_paid":null,"fwci":6.8774,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.97367882,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"11","issue":"10","first_page":"18593","last_page":"18604"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8270870447158813},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.6809741258621216},{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.6097292900085449},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5845889449119568},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.4610298275947571},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.44937705993652344},{"id":"https://openalex.org/keywords/transient-state","display_name":"Transient state","score":0.4289221465587616},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41302067041397095},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34329938888549805},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34089285135269165},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33452683687210083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1111154854297638},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09933832287788391}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8270870447158813},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.6809741258621216},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.6097292900085449},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5845889449119568},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.4610298275947571},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.44937705993652344},{"id":"https://openalex.org/C82756550","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient state","level":2,"score":0.4289221465587616},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41302067041397095},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34329938888549805},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34089285135269165},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33452683687210083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1111154854297638},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09933832287788391},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jiot.2024.3363837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2024.3363837","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Zero hunger","id":"https://metadata.un.org/sdg/2"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":56,"referenced_works":["https://openalex.org/W1598796236","https://openalex.org/W2033800551","https://openalex.org/W2064675550","https://openalex.org/W2100495367","https://openalex.org/W2157331557","https://openalex.org/W2773549135","https://openalex.org/W2799972844","https://openalex.org/W2808622270","https://openalex.org/W2898904979","https://openalex.org/W2908875359","https://openalex.org/W2913669538","https://openalex.org/W2943909972","https://openalex.org/W2954731415","https://openalex.org/W2994902374","https://openalex.org/W2999342951","https://openalex.org/W3009075394","https://openalex.org/W3015379812","https://openalex.org/W3033580259","https://openalex.org/W3037511795","https://openalex.org/W3037944824","https://openalex.org/W3040694753","https://openalex.org/W3041440607","https://openalex.org/W3093750252","https://openalex.org/W3123983671","https://openalex.org/W3126272279","https://openalex.org/W3127672745","https://openalex.org/W3160845249","https://openalex.org/W3177318507","https://openalex.org/W3187042253","https://openalex.org/W3187050706","https://openalex.org/W3201605183","https://openalex.org/W3212890323","https://openalex.org/W3212919100","https://openalex.org/W4225494949","https://openalex.org/W4226069359","https://openalex.org/W4290945834","https://openalex.org/W4301184897","https://openalex.org/W4310416691","https://openalex.org/W4313059808","https://openalex.org/W4319998033","https://openalex.org/W4366310723","https://openalex.org/W4385245566","https://openalex.org/W4385763767","https://openalex.org/W4387561305","https://openalex.org/W4388469859","https://openalex.org/W6635679246","https://openalex.org/W6736412012","https://openalex.org/W6739879593","https://openalex.org/W6755997574","https://openalex.org/W6764679822","https://openalex.org/W6784835917","https://openalex.org/W6797155008","https://openalex.org/W6810637551","https://openalex.org/W6846825190","https://openalex.org/W6857279128","https://openalex.org/W6889955440"],"related_works":["https://openalex.org/W2000593273","https://openalex.org/W2159465694","https://openalex.org/W2327192857","https://openalex.org/W2086142747","https://openalex.org/W2900617074","https://openalex.org/W2094488024","https://openalex.org/W2106512568","https://openalex.org/W2030822348","https://openalex.org/W1992335390","https://openalex.org/W2115441171"],"abstract_inverted_index":{"The":[0,95,114,132,160,184],"Industrial":[1],"Internet":[2],"of":[3,11,22,27,40,85,149,205],"Things":[4],"(IIOT)":[5],"has":[6,187],"greatly":[7],"facilitated":[8],"the":[9,20,24,52,57,129,146,150,157,180],"development":[10],"prognostics":[12],"health":[13,58],"management":[14],"(PHM)":[15],"for":[16,37,207],"rotating":[17,41],"machinery.":[18,42],"In":[19],"era":[21],"IIOT,":[23],"long-term":[25,65,92,189],"prediction":[26,47,66,93,190,200],"remaining":[28],"useful":[29],"life":[30],"(RUL)":[31],"can":[32,90,126,154,177],"provide":[33],"a":[34,69],"reliable":[35],"basis":[36],"maintenance":[38],"decisions":[39],"However,":[43],"most":[44],"existing":[45,194],"RUL":[46,206],"methods":[48,196],"neglect":[49],"to":[50,63,81,120,138,166,193],"learn":[51],"transient":[53,72,86,104,115,122,142],"fluctuation":[54,73,87,105,116,123,143],"information":[55,144,171],"in":[56],"indicator":[59],"(HI),":[60],"which":[61,89,125,153,176],"leads":[62],"low":[64],"accuracy.":[67,94],"Therefore,":[68],"new":[70],"gated":[71],"dual":[74],"attention":[75,108,112,134,162],"unit":[76],"(GTFDAU)":[77],"network":[78,97],"is":[79,118,136,164],"designed":[80],"achieve":[82],"sufficient":[83],"learning":[84],"information,":[88,124,175],"improve":[91],"GTFDAU":[96],"mainly":[98],"comprises":[99],"three":[100],"novel":[101],"gate":[102,109,117,135,163],"structures:":[103],"gate,":[106],"historical":[107,130,133,158,170],"and":[110,145,172,210],"current":[111,161,173,181],"gate.":[113],"used":[119,137,165],"capture":[121],"deeply":[127],"mine":[128],"information.":[131,159],"adaptively":[139,167],"focus":[140,168],"on":[141,169],"hidden":[147,182],"state":[148],"last":[151],"moment,":[152],"effectively":[155],"reshape":[156],"input":[174],"comprehensively":[178],"update":[179],"state.":[183],"proposed":[185],"method":[186],"superior":[188],"capability":[191],"compared":[192],"state-of-the-art":[195],"without":[197],"compromising":[198],"short-term":[199],"performance":[201],"through":[202],"experimental":[203],"verification":[204],"rolling":[208],"bearings":[209],"fatigue":[211],"gears.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":8}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}
