{"id":"https://openalex.org/W4391454487","doi":"https://doi.org/10.1109/jiot.2024.3361036","title":"Ada-FA: A Comprehensive Framework for Adaptive Fault Tolerance and Aging Mitigation in FPGAs","display_name":"Ada-FA: A Comprehensive Framework for Adaptive Fault Tolerance and Aging Mitigation in FPGAs","publication_year":2024,"publication_date":"2024-02-01","ids":{"openalex":"https://openalex.org/W4391454487","doi":"https://doi.org/10.1109/jiot.2024.3361036"},"language":"en","primary_location":{"id":"doi:10.1109/jiot.2024.3361036","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/jiot.2024.3361036","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100455071","display_name":"Zeyu Li","orcid":"https://orcid.org/0000-0002-9214-7135"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyu Li","raw_affiliation_strings":["School of Computer Science and Technology, Xidian University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100322659","display_name":"Yan Wang","orcid":"https://orcid.org/0000-0002-3341-1469"},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Wang","raw_affiliation_strings":["Beijing Institute of Space Mechanics and Electricity, China Academy of Space Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Institute of Space Mechanics and Electricity, China Academy of Space Technology, Beijing, China","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061620697","display_name":"Zhao Huang","orcid":"https://orcid.org/0000-0001-7385-032X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Huang","raw_affiliation_strings":["School of Computer Science and Technology, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-7385-032X","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100395778","display_name":"Junjie Wang","orcid":"https://orcid.org/0000-0001-7183-422X"},"institutions":[{"id":"https://openalex.org/I157771985","display_name":"China National Nuclear Corporation","ror":"https://ror.org/01d5ymp84","country_code":"CN","type":"government","lineage":["https://openalex.org/I157771985"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junjie Wang","raw_affiliation_strings":["Intelligent Building R&D Department, CNNC Xi’an Nuclear Instrument Company Ltd., Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intelligent Building R&D Department, CNNC Xi’an Nuclear Instrument Company Ltd., Xi’an, China","institution_ids":["https://openalex.org/I157771985"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100418247","display_name":"Quan Wang","orcid":"https://orcid.org/0000-0001-6913-8604"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quan Wang","raw_affiliation_strings":["School of Computer Science and Technology, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-6913-8604","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014884811","display_name":"Xiaohong Jiang","orcid":"https://orcid.org/0000-0001-9739-1930"},"institutions":[{"id":"https://openalex.org/I84400586","display_name":"Future University Hakodate","ror":"https://ror.org/05szw2z23","country_code":"JP","type":"education","lineage":["https://openalex.org/I84400586"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaohong Jiang","raw_affiliation_strings":["School of Systems Information Science, Future University Hakodate, Hakodate, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9739-1930","affiliations":[{"raw_affiliation_string":"School of Systems Information Science, Future University Hakodate, Hakodate, Japan","institution_ids":["https://openalex.org/I84400586"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1731,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42423177,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"11","issue":"10","first_page":"17688","last_page":"17699"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7593826055526733},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6890022158622742},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5948183536529541},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.581051230430603},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.5567940473556519},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5099717378616333},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3764798641204834},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.3010188341140747},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2953106760978699},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.13653123378753662},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11347240209579468},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08072870969772339}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7593826055526733},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6890022158622742},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5948183536529541},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.581051230430603},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.5567940473556519},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5099717378616333},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3764798641204834},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.3010188341140747},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2953106760978699},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.13653123378753662},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11347240209579468},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08072870969772339}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jiot.2024.3361036","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/jiot.2024.3361036","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1166193582","display_name":"\u5d4c\u5165\u5f0f\u5f02\u6784\u8ba1\u7b97\u96c6\u7fa4\u9ad8\u53ef\u9760\u9ad8\u6027\u80fd\u7ba1\u7406\u8c03\u5ea6\u7814\u7a76","funder_award_id":"61972302","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2768774533","display_name":null,"funder_award_id":"XJS220306","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G3995516769","display_name":null,"funder_award_id":"SL2022A04J00404","funder_id":"https://openalex.org/F4320335480","funder_display_name":"Guangzhou Municipal Science and Technology Project"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335480","display_name":"Guangzhou Municipal Science and Technology Project","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1980425622","https://openalex.org/W1980981621","https://openalex.org/W2005671831","https://openalex.org/W2006584048","https://openalex.org/W2061205755","https://openalex.org/W2078871390","https://openalex.org/W2114327382","https://openalex.org/W2226437767","https://openalex.org/W2528572485","https://openalex.org/W2531844514","https://openalex.org/W2593605297","https://openalex.org/W2605219475","https://openalex.org/W2735521732","https://openalex.org/W2738431585","https://openalex.org/W2769484095","https://openalex.org/W2784190072","https://openalex.org/W2790851819","https://openalex.org/W2798136743","https://openalex.org/W2898329321","https://openalex.org/W2900576211","https://openalex.org/W2903626866","https://openalex.org/W2904527441","https://openalex.org/W2921944720","https://openalex.org/W2944118418","https://openalex.org/W3022655021","https://openalex.org/W3036526928","https://openalex.org/W4205909333","https://openalex.org/W4213098625","https://openalex.org/W4245104754","https://openalex.org/W6747951530","https://openalex.org/W6749639907"],"related_works":["https://openalex.org/W2053233382","https://openalex.org/W2034080945","https://openalex.org/W2337334590","https://openalex.org/W2006898677","https://openalex.org/W167642385","https://openalex.org/W912168359","https://openalex.org/W2541443397","https://openalex.org/W2060246408","https://openalex.org/W2162366020","https://openalex.org/W2345792680"],"abstract_inverted_index":{"Commercial":[0],"SRAM-based":[1],"field-programmable":[2],"gate":[3],"arrays":[4],"(FPGAs)":[5],"are":[6,54],"extremely":[7],"susceptible":[8],"to":[9,41,129,152,163,177,207],"failures":[10],"caused":[11,62],"by":[12,63,202],"external":[13],"ionizing":[14],"radiation":[15,47],"or":[16],"prolonged":[17],"internal":[18],"overloading":[19],"in":[20,94],"harsh":[21],"applications,":[22],"such":[23],"as":[24],"single":[25],"event":[26],"effects":[27,45,66],"(SEEs)":[28],"and":[29,56,91,110,149,221],"aging":[30,65,92,150,230],"failure.":[31],"Existing":[32],"methods":[33],"utilize":[34],"the":[35,44,64,115,131,138,154,160,168,180,191,196,227],"triple":[36],"modular":[37],"redundancy":[38],"(TMR)":[39],"architecture":[40,176],"shield":[42],"against":[43],"of":[46,67,70,183,195,209],"on":[48,204],"FPGA":[49,71,184],"systems.":[50,185],"However,":[51],"these":[52,79],"solutions":[53],"resource-costly":[55],"practically":[57],"unnecessary.":[58],"Additionally,":[59],"hard":[60],"faults":[61],"long-term":[68],"usage":[69,193],"systems":[72],"is":[73,99,127,200],"not":[74],"effectively":[75],"alleviated.":[76],"To":[77],"address":[78],"issues,":[80],"we":[81,136,171],"present":[82],"a":[83,100,118,173,218],"comprehensive":[84],"framework":[85,103,199],"for":[86],"ensuring":[87],"adaptive":[88],"fault":[89,125,147],"tolerance":[90,126,148],"mitigation":[93,231],"FPGAs,":[95],"i.e.,":[96],"Ada-FA.":[97],"Ada-FA":[98,198],"cross-layer-aware":[101],"reliability":[102,220],"that":[104,190,208],"includes":[105],"two":[106],"phases:":[107],"1)":[108],"offline":[109,116,229],"2)":[111],"online.":[112],"(1)":[113],"In":[114,167],"phase,":[117,170],"task":[119,222],"criticality":[120],"evaluation":[121],"strategy":[122],"supporting":[123],"fine-grained":[124],"proposed":[128,197],"reduce":[130],"hardware":[132],"resource":[133,192],"overhead.":[134],"Specifically,":[135],"improve":[137],"integer":[139],"linear":[140],"programming":[141],"(ILP)":[142],"formula,":[143],"which":[144],"considers":[145],"both":[146],"mitigation,":[151],"obtain":[153],"optimal":[155],"reliability-aware":[156],"layout,":[157],"thus":[158],"maximizing":[159],"mean":[161],"time":[162],"failure":[164],"(MTTF).":[165],"(2)":[166],"online":[169],"propose":[172],"runtime":[174],"management":[175],"further":[178],"ensure":[179],"reliable":[181],"operation":[182],"The":[186],"experimental":[187],"results":[188],"show":[189],"(RU)":[194],"reduced":[201],"15.8%":[203],"average":[205],"compared":[206],"existing":[210],"fault-tolerant":[211],"layout/scheduling":[212],"methods.":[213,232],"Moreover,":[214],"our":[215],"method":[216],"provides":[217],"higher":[219],"accomplishment":[223],"rate":[224],"(TAR)":[225],"than":[226],"state-of-the-art":[228]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}