{"id":"https://openalex.org/W4386108494","doi":"https://doi.org/10.1109/jiot.2023.3307819","title":"A Lifelong Learning Method Based on Event-Triggered Online Frozen-EWC Transformer Encoder for Equipment Digital Twin Dynamic Evolution","display_name":"A Lifelong Learning Method Based on Event-Triggered Online Frozen-EWC Transformer Encoder for Equipment Digital Twin Dynamic Evolution","publication_year":2023,"publication_date":"2023-08-23","ids":{"openalex":"https://openalex.org/W4386108494","doi":"https://doi.org/10.1109/jiot.2023.3307819"},"language":"en","primary_location":{"id":"doi:10.1109/jiot.2023.3307819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2023.3307819","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100615241","display_name":"Kunyu Wang","orcid":"https://orcid.org/0000-0002-8940-3345"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kunyu Wang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100418969","display_name":"Zhang Li","orcid":"https://orcid.org/0000-0003-1989-6102"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Zhang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1989-6102","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103099784","display_name":"Hongbo Cheng","orcid":"https://orcid.org/0009-0005-2397-4988"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongbo Cheng","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0005-2397-4988","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102466054","display_name":"Han Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Lu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100457663","display_name":"Zhen Chen","orcid":"https://orcid.org/0000-0002-0444-8828"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Chen","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0444-8828","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.0487,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.73694672,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"11","issue":"4","first_page":"5708","last_page":"5717"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9678000211715698,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9474999904632568,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6205039024353027},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.49607786536216736},{"id":"https://openalex.org/keywords/lifelong-learning","display_name":"Lifelong learning","score":0.49301406741142273},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47917070984840393},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.43166351318359375},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41501298546791077}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6205039024353027},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.49607786536216736},{"id":"https://openalex.org/C108771440","wikidata":"https://www.wikidata.org/wiki/Q368475","display_name":"Lifelong learning","level":2,"score":0.49301406741142273},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47917070984840393},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.43166351318359375},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41501298546791077},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jiot.2023.3307819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jiot.2023.3307819","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2560647685","https://openalex.org/W2890491818","https://openalex.org/W2912799857","https://openalex.org/W2928090136","https://openalex.org/W2989925413","https://openalex.org/W2995698009","https://openalex.org/W3014048166","https://openalex.org/W3042091195","https://openalex.org/W3126472852","https://openalex.org/W3133770812","https://openalex.org/W3134929141","https://openalex.org/W3163246710","https://openalex.org/W3165299285","https://openalex.org/W3177628906","https://openalex.org/W3184838644","https://openalex.org/W3216107495","https://openalex.org/W4205480933","https://openalex.org/W4240996198","https://openalex.org/W4283318673","https://openalex.org/W4289927973","https://openalex.org/W4297024570","https://openalex.org/W4307990895","https://openalex.org/W4308515702","https://openalex.org/W4310155374","https://openalex.org/W4311634026","https://openalex.org/W6739901393","https://openalex.org/W6752307458","https://openalex.org/W6989525111"],"related_works":["https://openalex.org/W2364105709","https://openalex.org/W2384383462","https://openalex.org/W2380954666","https://openalex.org/W422428167","https://openalex.org/W1981922029","https://openalex.org/W2037025106","https://openalex.org/W2499777278","https://openalex.org/W2391851613","https://openalex.org/W1485190762","https://openalex.org/W4372778609"],"abstract_inverted_index":{"Digital":[0],"twin":[1],"(DT)":[2],"has":[3,166],"become":[4],"a":[5,19,83,105,126,150],"widely":[6],"discussed":[7],"emerging":[8],"topic":[9],"in":[10,104,169],"last":[11],"few":[12],"years,":[13],"which":[14],"is":[15,61,69,82,181],"expected":[16],"to":[17,22,45,52,86,124,183],"bring":[18],"new":[20],"revolution":[21],"the":[23,54,62,73,100,113,129,138,142,173,185,188],"whole":[24],"life":[25],"cycle":[26],"of":[27,57,66,72,78,115,178,187],"complex":[28],"equipment,":[29],"including":[30],"Research":[31],"and":[32,37,68,96,121,132,172],"Development":[33],"design,":[34],"optimization":[35],"control,":[36],"predictive":[38,116],"maintenance.":[39],"Using":[40],"online":[41,97,143,157],"real-time":[42,98],"sensor":[43],"data":[44,95,176],"realize":[46,87],"model":[47,102],"dynamic":[48,89,133,164],"evolution,":[49],"so":[50],"as":[51],"map":[53],"state":[55],"change":[56],"physical":[58],"equipment":[59,162],"faithfully,":[60],"most":[63,74],"significant":[64],"feature":[65],"DT":[67,88,101,163],"also":[70],"one":[71],"important":[75],"key":[76],"technologies":[77],"DT.":[79],"Lifelong":[80],"learning":[81,145,152],"feasible":[84],"way":[85],"evolution.":[90],"By":[91],"using":[92],"offline":[93],"historical":[94],"data,":[99],"built":[103],"data-driven":[106],"modeling":[107],"manner":[108],"can":[109,118],"evolve":[110],"continuously,":[111],"therefore,":[112],"accuracy":[114],"simulation":[117],"be":[119],"guaranteed":[120],"improved.":[122],"Simultaneously,":[123],"make":[125],"balance":[127],"between":[128],"computation":[130],"cost":[131],"evolution":[134,165],"performance,":[135],"we":[136],"introduce":[137],"event-triggered":[139,156],"scheme":[140],"during":[141],"lifelong":[144,151],"process.":[146],"To":[147],"sum":[148],"up,":[149],"method":[153],"based":[154],"on":[155],"Frozen-EWC":[158],"Transformer":[159],"Encoder":[160],"for":[161],"been":[167],"proposed":[168,189],"this":[170],"article":[171],"real":[174],"flight":[175],"set":[177],"quadrotor":[179],"aircraft":[180],"used":[182],"verify":[184],"effectiveness":[186],"method.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}