{"id":"https://openalex.org/W7160632576","doi":"https://doi.org/10.1109/jetcas.2026.3691668","title":"Time-Based 8TD SRAM CIM Macro With Low PVT Sensitivity for Edge Devices","display_name":"Time-Based 8TD SRAM CIM Macro With Low PVT Sensitivity for Edge Devices","publication_year":2026,"publication_date":"2026-05-08","ids":{"openalex":"https://openalex.org/W7160632576","doi":"https://doi.org/10.1109/jetcas.2026.3691668"},"language":null,"primary_location":{"id":"doi:10.1109/jetcas.2026.3691668","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jetcas.2026.3691668","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/jetcas.2026.3691668","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108945784","display_name":"Andrea Fasolino","orcid":"https://orcid.org/0009-0009-3175-3084"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Fasolino","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0009-0009-3175-3084","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135639829","display_name":"Pio Esposito","orcid":null},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pio Esposito","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0009-0004-0112-3093","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029809556","display_name":"Rosalba Liguori","orcid":"https://orcid.org/0000-0002-0093-1169"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Rosalba Liguori","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0000-0002-0093-1169","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026535044","display_name":"Luigi Di Benedetto","orcid":"https://orcid.org/0000-0001-5588-0621"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luigi Di Benedetto","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0000-0001-5588-0621","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044628138","display_name":"Alfredo Rubino","orcid":"https://orcid.org/0000-0002-5690-9040"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alfredo Rubino","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0000-0002-5690-9040","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030070417","display_name":"Gian Domenico Licciardo","orcid":"https://orcid.org/0000-0002-1913-4928"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gian Domenico Licciardo","raw_affiliation_strings":["Department of Industrial Engineering, University of Salerno, Salerno, Italy"],"raw_orcid":"https://orcid.org/0000-0002-1913-4928","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Salerno, Salerno, Italy","institution_ids":["https://openalex.org/I131729948"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I131729948"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":{"value":2645,"currency":"USD","value_usd":2645},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.37430414,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":"2","first_page":"252","last_page":"261"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.635699987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.635699987411499,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.0674000009894371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.05950000137090683,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6450999975204468},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.6437000036239624},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.633400022983551},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5264000296592712},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.32850000262260437},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.30489999055862427}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6450999975204468},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.6437000036239624},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.633400022983551},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5455999970436096},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5264000296592712},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.478300005197525},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44999998807907104},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3555000126361847},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35359999537467957},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.32850000262260437},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.30489999055862427},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.30410000681877136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2921999990940094},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2847000062465668},{"id":"https://openalex.org/C2776584680","wikidata":"https://www.wikidata.org/wiki/Q191042","display_name":"Surface-mount technology","level":3,"score":0.25110000371932983},{"id":"https://openalex.org/C204223013","wikidata":"https://www.wikidata.org/wiki/Q133036","display_name":"Lithography","level":2,"score":0.2500999867916107}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2026.3691668","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jetcas.2026.3691668","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jetcas.2026.3691668","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jetcas.2026.3691668","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6847793459892273}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W2026302983","https://openalex.org/W2104340505","https://openalex.org/W2194775991","https://openalex.org/W2318036221","https://openalex.org/W2507806982","https://openalex.org/W2921013323","https://openalex.org/W2948901988","https://openalex.org/W2981124343","https://openalex.org/W3000296772","https://openalex.org/W3047171309","https://openalex.org/W3116922653","https://openalex.org/W3163634037","https://openalex.org/W3170773788","https://openalex.org/W3184152611","https://openalex.org/W4226402784","https://openalex.org/W4246161403","https://openalex.org/W4312621775","https://openalex.org/W4385267171","https://openalex.org/W4387917941","https://openalex.org/W4388283422","https://openalex.org/W4389799305","https://openalex.org/W4390119970","https://openalex.org/W4390120228","https://openalex.org/W4391407189","https://openalex.org/W4392939458","https://openalex.org/W4399880783","https://openalex.org/W4403721254","https://openalex.org/W4403918353","https://openalex.org/W4408236259","https://openalex.org/W4411446303","https://openalex.org/W4411724833","https://openalex.org/W4412375039","https://openalex.org/W4412444811","https://openalex.org/W4414008085"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2026-05-09T00:00:00"}