{"id":"https://openalex.org/W4296079404","doi":"https://doi.org/10.1109/jetcas.2022.3207687","title":"Stuck-at-Fault Immunity Enhancement of Memristor-Based Edge AI Systems","display_name":"Stuck-at-Fault Immunity Enhancement of Memristor-Based Edge AI Systems","publication_year":2022,"publication_date":"2022-09-16","ids":{"openalex":"https://openalex.org/W4296079404","doi":"https://doi.org/10.1109/jetcas.2022.3207687"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2022.3207687","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2022.3207687","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026285037","display_name":"Md. Oli-Uz-Zaman","orcid":"https://orcid.org/0000-0002-9290-7763"},"institutions":[{"id":"https://openalex.org/I83809506","display_name":"University of South Alabama","ror":"https://ror.org/01s7b5y08","country_code":"US","type":"education","lineage":["https://openalex.org/I83809506"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Md. Oli-Uz-Zaman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA","institution_ids":["https://openalex.org/I83809506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015086447","display_name":"Saleh Ahmad Khan","orcid":"https://orcid.org/0000-0002-6314-1631"},"institutions":[{"id":"https://openalex.org/I83809506","display_name":"University of South Alabama","ror":"https://ror.org/01s7b5y08","country_code":"US","type":"education","lineage":["https://openalex.org/I83809506"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saleh Ahmad Khan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA","institution_ids":["https://openalex.org/I83809506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041194022","display_name":"William Oswald","orcid":"https://orcid.org/0000-0003-1309-3114"},"institutions":[{"id":"https://openalex.org/I83809506","display_name":"University of South Alabama","ror":"https://ror.org/01s7b5y08","country_code":"US","type":"education","lineage":["https://openalex.org/I83809506"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William Oswald","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA"],"raw_orcid":"https://orcid.org/0000-0003-1309-3114","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA","institution_ids":["https://openalex.org/I83809506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077779106","display_name":"Zhiheng Liao","orcid":"https://orcid.org/0000-0002-8225-5044"},"institutions":[{"id":"https://openalex.org/I57328836","display_name":"North Dakota State University","ror":"https://ror.org/05h1bnb22","country_code":"US","type":"education","lineage":["https://openalex.org/I57328836"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhiheng Liao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, North Dakota State University, Fargo, ND, USA"],"raw_orcid":"https://orcid.org/0000-0002-8225-5044","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, North Dakota State University, Fargo, ND, USA","institution_ids":["https://openalex.org/I57328836"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043189989","display_name":"Jinhui Wang","orcid":"https://orcid.org/0000-0003-4731-8481"},"institutions":[{"id":"https://openalex.org/I83809506","display_name":"University of South Alabama","ror":"https://ror.org/01s7b5y08","country_code":"US","type":"education","lineage":["https://openalex.org/I83809506"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jinhui Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA"],"raw_orcid":"https://orcid.org/0000-0003-4731-8481","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of South Alabama, Mobile, AL, USA","institution_ids":["https://openalex.org/I83809506"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6786,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.83695669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"12","issue":"4","first_page":"922","last_page":"933"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.80991530418396},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.6451456546783447},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5066760182380676},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5064877271652222},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5014946460723877},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.49940943717956543},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48125240206718445},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4566977322101593},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45357784628868103},{"id":"https://openalex.org/keywords/von-neumann-architecture","display_name":"Von Neumann architecture","score":0.44576892256736755},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41137874126434326},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40245336294174194},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36726629734039307},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2416115403175354},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.190296471118927},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1330912709236145}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.80991530418396},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.6451456546783447},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5066760182380676},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5064877271652222},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5014946460723877},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.49940943717956543},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48125240206718445},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4566977322101593},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45357784628868103},{"id":"https://openalex.org/C80469333","wikidata":"https://www.wikidata.org/wiki/Q189088","display_name":"Von Neumann architecture","level":2,"score":0.44576892256736755},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41137874126434326},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40245336294174194},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36726629734039307},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2416115403175354},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.190296471118927},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1330912709236145},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2022.3207687","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2022.3207687","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G3226969022","display_name":"RET Site: Research Experiences for Teachers in Biologically-inspired Computing Systems","funder_award_id":"1953544","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G5278510802","display_name":"RII Track 2 FEC: Building Research Infrastructure and Workforce in Edge Artificial Intelligence","funder_award_id":"2218046","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7972108214","display_name":"IRES Track I: USA-China: International Research Experience for Native American Students in IoT Enabled Environmental Monitoring Technologies","funder_award_id":"1855646","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1516501267","https://openalex.org/W1971319818","https://openalex.org/W1973505720","https://openalex.org/W1985868795","https://openalex.org/W2008901850","https://openalex.org/W2013055927","https://openalex.org/W2016922062","https://openalex.org/W2021797032","https://openalex.org/W2022208730","https://openalex.org/W2051108935","https://openalex.org/W2059323493","https://openalex.org/W2087748124","https://openalex.org/W2136288682","https://openalex.org/W2149380925","https://openalex.org/W2254450385","https://openalex.org/W2397312330","https://openalex.org/W2399958287","https://openalex.org/W2612375349","https://openalex.org/W2625840880","https://openalex.org/W2626719825","https://openalex.org/W2768104155","https://openalex.org/W2778935320","https://openalex.org/W2800050615","https://openalex.org/W2810068957","https://openalex.org/W2896457183","https://openalex.org/W2946522000","https://openalex.org/W2946641467","https://openalex.org/W2951714391","https://openalex.org/W2953901595","https://openalex.org/W2955898745","https://openalex.org/W2978384356","https://openalex.org/W3016762888","https://openalex.org/W3085008348","https://openalex.org/W3112740243","https://openalex.org/W3161056092","https://openalex.org/W3162727751","https://openalex.org/W3183260061","https://openalex.org/W4211142635","https://openalex.org/W4211174192","https://openalex.org/W4236709213","https://openalex.org/W4241095305","https://openalex.org/W6663424547","https://openalex.org/W6755207826"],"related_works":["https://openalex.org/W4229452466","https://openalex.org/W2966276069","https://openalex.org/W2304829496","https://openalex.org/W2595172197","https://openalex.org/W2358307108","https://openalex.org/W3031124155","https://openalex.org/W2463286374","https://openalex.org/W2052332160","https://openalex.org/W2204001882","https://openalex.org/W3098316772"],"abstract_inverted_index":{"Deep":[0],"Neural":[1],"Networks":[2],"(DNNs)":[3],"are":[4],"widely":[5],"used":[6],"in":[7,84,107,157,191],"edge":[8,69,192],"AI.":[9],"But":[10],"the":[11,17,22,40,44,52,67,89,92,98,103,109,137,144,152,170,185,189,195],"complex":[12],"perception":[13],"and":[14,20,48,62,134,146,165,169],"decision-making":[15],"demands":[16],"overlarge":[18],"computation":[19,37],"makes":[21,66],"DNN":[23,36,190],"architecture":[24,47],"very":[25],"sophisticated.":[26],"Memristors":[27],"have":[28],"multilevel":[29],"resistance":[30],"property":[31],"that":[32,102],"enables":[33],"faster":[34],"in-memory":[35],"to":[38,113,124],"remove":[39],"bottleneck":[41],"caused":[42],"by":[43],"von":[45],"Neumann":[46],"CMOS":[49],"technology.":[50],"However,":[51],"Stuck-at-Fault":[53],"(SAF)":[54],"defect":[55],"of":[56,159,188],"memristor":[57],"generated":[58],"from":[59,122],"immature":[60],"fabrication":[61],"heavy":[63],"device":[64],"utilization":[65],"memristor-based":[68],"AI":[70,193],"commercially":[71],"unavailable.":[72],"To":[73],"mitigate":[74],"this":[75,85],"problem,":[76],"an":[77],"Adaptive":[78],"Mapping":[79],"Method":[80],"(AMM)":[81],"is":[82,105],"proposed":[83],"paper.":[86],"Based":[87],"on":[88,184],"analysis":[90],"for":[91],"VGG8":[93],"model":[94],"with":[95,194],"CIFAR10":[96],"dataset,":[97],"experiment":[99],"results":[100],"show":[101],"AMM":[104,138,150],"efficient":[106],"restoring":[108],"inference":[110,186],"accuracy":[111,117,153,187],"up":[112],"90%":[114],"(the":[115],"original":[116],"without":[118],"SAF)":[119],"under":[120],"SAFs":[121],"0.1%":[123],"50%,":[125],"where":[126],"Stuck-at-One":[127],"(SA1):":[128],"Stuck-at-Zero":[129],"(SA0)":[130],"=":[131,163,167],"5:1,":[132],"1:5,":[133],"1:1.":[135],"Additionally,":[136],"has":[139,181],"a":[140],"significant":[141],"immunity":[142],"against":[143],"nonlinearity":[145,161],"conductance":[147,172],"drift.":[148],"The":[149],"improves":[151],"more":[154],"than":[155],"50%":[156],"presence":[158],"high":[160],"LTP":[162],"4":[164],"LTD":[166],"\u22124":[168],"standard":[171],"drift":[173],"(10":[174],"years":[175],"at":[176],"85":[177],"degree":[178],"centigrade)":[179],"nearly":[180],"no":[182],"influence":[183],"AMM.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}