{"id":"https://openalex.org/W4213417770","doi":"https://doi.org/10.1109/jetcas.2022.3154156","title":"Decentralized Suppression Strategy of Common Ground Circulating Current Caused by Grounding Fault in PV Modules in Single-Phase PV Grid-Connected Systems","display_name":"Decentralized Suppression Strategy of Common Ground Circulating Current Caused by Grounding Fault in PV Modules in Single-Phase PV Grid-Connected Systems","publication_year":2022,"publication_date":"2022-02-24","ids":{"openalex":"https://openalex.org/W4213417770","doi":"https://doi.org/10.1109/jetcas.2022.3154156"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2022.3154156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2022.3154156","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034070038","display_name":"Junwei Chai","orcid":"https://orcid.org/0000-0002-7815-7927"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Junwei Chai","raw_affiliation_strings":["Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0002-7815-7927","affiliations":[{"raw_affiliation_string":"Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100626326","display_name":"Minghao Wang","orcid":"https://orcid.org/0000-0002-5783-5653"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Minghao Wang","raw_affiliation_strings":["Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103039190","display_name":"Yufei He","orcid":"https://orcid.org/0000-0001-9964-3388"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufei He","raw_affiliation_strings":["Huawei Technologies Company Ltd, Shenzhen, China"],"raw_orcid":"https://orcid.org/0000-0001-9964-3388","affiliations":[{"raw_affiliation_string":"Huawei Technologies Company Ltd, Shenzhen, China","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042358680","display_name":"Zilin Li","orcid":"https://orcid.org/0000-0002-3816-7151"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zilin Li","raw_affiliation_strings":["Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068791753","display_name":"Zhao Xu","orcid":"https://orcid.org/0000-0003-4480-7394"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Zhao Xu","raw_affiliation_strings":["Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute for Smart Energy and the Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014217739","display_name":"Shouxiang Li","orcid":"https://orcid.org/0000-0002-1003-949X"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shouxiang Li","raw_affiliation_strings":["School of Automation, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1003-949X","affiliations":[{"raw_affiliation_string":"School of Automation, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5034070038"],"corresponding_institution_ids":["https://openalex.org/I14243506"],"apc_list":null,"apc_paid":null,"fwci":0.6466,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65481195,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":"12","issue":"1","first_page":"220","last_page":"231"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ground","display_name":"Ground","score":0.8441152572631836},{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.7134253978729248},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6356214284896851},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6061526536941528},{"id":"https://openalex.org/keywords/interfacing","display_name":"Interfacing","score":0.5837336778640747},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5569881796836853},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.46973973512649536},{"id":"https://openalex.org/keywords/earthing-system","display_name":"Earthing system","score":0.4626411497592926},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46075257658958435},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.44140303134918213},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4373210072517395},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4282619059085846},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4099583327770233},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3368476927280426},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.2176063060760498},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09211269021034241}],"concepts":[{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.8441152572631836},{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.7134253978729248},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6356214284896851},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6061526536941528},{"id":"https://openalex.org/C2776303644","wikidata":"https://www.wikidata.org/wiki/Q1020499","display_name":"Interfacing","level":2,"score":0.5837336778640747},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5569881796836853},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.46973973512649536},{"id":"https://openalex.org/C78779171","wikidata":"https://www.wikidata.org/wiki/Q432571","display_name":"Earthing system","level":3,"score":0.4626411497592926},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46075257658958435},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.44140303134918213},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4373210072517395},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4282619059085846},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4099583327770233},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3368476927280426},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.2176063060760498},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09211269021034241},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2022.3154156","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2022.3154156","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3070544693","display_name":null,"funder_award_id":"62101473","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1556294657","https://openalex.org/W1577093170","https://openalex.org/W1656273302","https://openalex.org/W1675666378","https://openalex.org/W1983465808","https://openalex.org/W2011211626","https://openalex.org/W2045647712","https://openalex.org/W2051741703","https://openalex.org/W2060976371","https://openalex.org/W2089319279","https://openalex.org/W2091330461","https://openalex.org/W2101746473","https://openalex.org/W2105734873","https://openalex.org/W2118966342","https://openalex.org/W2296747478","https://openalex.org/W2344462560","https://openalex.org/W2471159162","https://openalex.org/W2575868404","https://openalex.org/W2737522430","https://openalex.org/W2760233602","https://openalex.org/W2766847425","https://openalex.org/W2806111473","https://openalex.org/W2808627216","https://openalex.org/W2886825931","https://openalex.org/W2922378967","https://openalex.org/W2950619806","https://openalex.org/W2964776276","https://openalex.org/W3003708398","https://openalex.org/W3032986280","https://openalex.org/W3118979736"],"related_works":["https://openalex.org/W2379604501","https://openalex.org/W2132954488","https://openalex.org/W2125566117","https://openalex.org/W3198592614","https://openalex.org/W2147569308","https://openalex.org/W2159780915","https://openalex.org/W2354775716","https://openalex.org/W3119649758","https://openalex.org/W1487415169","https://openalex.org/W2372939808"],"abstract_inverted_index":{"The":[0,20,58,174],"complicated":[1],"series-parallel":[2],"wiring":[3],"and":[4,35,99,125,132,147,169],"aged":[5],"insulation":[6],"of":[7,31,60,77,122,153,171,176],"photovoltaic":[8],"(PV)":[9],"power":[10],"plants":[11],"leave":[12],"the":[13,28,32,55,61,66,74,78,88,96,113,120,123,129,133,136,156,167,172,177,184],"system":[14,37,67],"prone":[15],"to":[16,53,86,94,111],"PV":[17,62,115],"grounding":[18,63,103],"faults.":[19],"resultant":[21],"common":[22,89],"ground":[23,90],"circulating":[24,56,79,91,138],"current":[25],"will":[26],"increase":[27],"operation":[29],"stress":[30],"switching":[33],"devices":[34],"jeopardize":[36],"stability.":[38],"To":[39],"address":[40],"these":[41],"problems,":[42],"a":[43,81,160],"comprehensive":[44],"decentralized":[45,161],"control":[46,82,107,162],"strategy":[47,83,108],"is":[48,69,84,109,151,180],"proposed":[49,157,178],"in":[50,144],"this":[51],"paper":[52],"suppress":[54,87],"currents.":[57],"influence":[59],"fault":[64,104],"on":[65,73],"stability":[68,168],"firstly":[70],"analyzed.":[71],"Based":[72],"equivalent":[75],"form":[76],"currents,":[80],"designed":[85,110],"current.":[92],"Furthermore,":[93],"ensure":[95],"stable":[97],"currents":[98,124,139],"DC-link":[100,126],"voltages":[101],"during":[102],"transients,":[105],"another":[106],"operate":[112],"three-level":[114,134],"interfacing":[116],"converter":[117],"for":[118],"suppressing":[119],"overshoots":[121],"voltages.":[127],"With":[128],"two":[130],"controllers":[131],"converter,":[135],"generated":[137],"can":[140,165],"be":[141],"effectively":[142],"eliminated":[143],"both":[145],"steady":[146],"transient":[148],"states.":[149],"It":[150],"worthy":[152],"mentioning":[154],"that":[155],"methods":[158],"are":[159],"scheme,":[163],"which":[164],"improve":[166],"scalability":[170],"system.":[173],"effectiveness":[175],"solution":[179],"validated":[181],"by":[182],"performing":[183],"real-time":[185],"hardware-in-loop":[186],"tests.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}