{"id":"https://openalex.org/W2003243790","doi":"https://doi.org/10.1109/jetcas.2014.2374291","title":"Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM","display_name":"Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM","publication_year":2014,"publication_date":"2014-12-03","ids":{"openalex":"https://openalex.org/W2003243790","doi":"https://doi.org/10.1109/jetcas.2014.2374291","mag":"2003243790"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2014.2374291","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2014.2374291","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100381646","display_name":"Wang Kang","orcid":"https://orcid.org/0000-0002-3169-6034"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN","FR"],"is_corresponding":false,"raw_author_name":"Wang Kang","raw_affiliation_strings":["CNRS, Univ. Paris-Sud, Orsay, France","School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Univ. Paris-Sud, Orsay, France","institution_ids":["https://openalex.org/I102197404","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101925068","display_name":"Liuyang Zhang","orcid":"https://orcid.org/0000-0002-0160-0636"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liuyang Zhang","raw_affiliation_strings":["Beihang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["IEF, Univ. Paris-Sud, Orsay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IEF, Univ. Paris-Sud, Orsay, France","institution_ids":["https://openalex.org/I102197404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102978184","display_name":"Jacques\u2010Olivier Klein","orcid":"https://orcid.org/0000-0002-6923-5276"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jacques-Olivier Klein","raw_affiliation_strings":["IEF, Univ. Paris-Sud, Orsay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IEF, Univ. Paris-Sud, Orsay, France","institution_ids":["https://openalex.org/I102197404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018693228","display_name":"Youguang Zhang","orcid":"https://orcid.org/0009-0008-0928-4210"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youguang Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037048702","display_name":"D. Ravelosona","orcid":"https://orcid.org/0000-0002-4072-1457"},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Dafine Ravelosona","raw_affiliation_strings":["IEF, Univ. Paris-Sud, Orsay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IEF, Univ. Paris-Sud, Orsay, France","institution_ids":["https://openalex.org/I102197404"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103518479","display_name":"Claude Chappert","orcid":null},"institutions":[{"id":"https://openalex.org/I102197404","display_name":"Universit\u00e9 Paris-Sud","ror":"https://ror.org/028rypz17","country_code":"FR","type":"education","lineage":["https://openalex.org/I102197404"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Claude Chappert","raw_affiliation_strings":["IEF, Univ. Paris-Sud, Orsay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IEF, Univ. Paris-Sud, Orsay, France","institution_ids":["https://openalex.org/I102197404"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.814,"has_fulltext":false,"cited_by_count":67,"citation_normalized_percentile":{"value":0.97264594,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"5","issue":"1","first_page":"28","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6958087682723999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6452240347862244},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.6337414979934692},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5447240471839905},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5174263715744019},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.498201847076416},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44181177020072937},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.41046780347824097},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3943861126899719},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3520975708961487},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3406062126159668},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3350973129272461},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.24230912327766418},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24092435836791992},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.21351665258407593}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6958087682723999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6452240347862244},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.6337414979934692},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5447240471839905},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5174263715744019},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.498201847076416},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44181177020072937},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.41046780347824097},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3943861126899719},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3520975708961487},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3406062126159668},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3350973129272461},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.24230912327766418},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24092435836791992},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.21351665258407593},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2014.2374291","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2014.2374291","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1436435912","display_name":null,"funder_award_id":"(61071072)","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1964240769","https://openalex.org/W1964504828","https://openalex.org/W1969011731","https://openalex.org/W1969200114","https://openalex.org/W1970440339","https://openalex.org/W1974831841","https://openalex.org/W1978532023","https://openalex.org/W1985478976","https://openalex.org/W1985887979","https://openalex.org/W1986389751","https://openalex.org/W1991720749","https://openalex.org/W1991813033","https://openalex.org/W2006291936","https://openalex.org/W2023789407","https://openalex.org/W2025173691","https://openalex.org/W2025473704","https://openalex.org/W2028436610","https://openalex.org/W2045197688","https://openalex.org/W2069012355","https://openalex.org/W2073967864","https://openalex.org/W2080256638","https://openalex.org/W2082960646","https://openalex.org/W2096470311","https://openalex.org/W2102617527","https://openalex.org/W2105401464","https://openalex.org/W2109272991","https://openalex.org/W2117314013","https://openalex.org/W2119482888","https://openalex.org/W2124479423","https://openalex.org/W2138384063","https://openalex.org/W2138404515","https://openalex.org/W2139254411","https://openalex.org/W2155640457","https://openalex.org/W2164674249","https://openalex.org/W2167903456","https://openalex.org/W2171590793","https://openalex.org/W2188761345","https://openalex.org/W2257375065","https://openalex.org/W2327150258","https://openalex.org/W2775904244","https://openalex.org/W2942537621","https://openalex.org/W3150611138","https://openalex.org/W4239889878","https://openalex.org/W4285719527","https://openalex.org/W6669038600","https://openalex.org/W6677993950","https://openalex.org/W6687026183","https://openalex.org/W6692395235","https://openalex.org/W6747385854"],"related_works":["https://openalex.org/W4306316843","https://openalex.org/W2285867394","https://openalex.org/W101888041","https://openalex.org/W2133871381","https://openalex.org/W2354144074","https://openalex.org/W2523294487","https://openalex.org/W4287963496","https://openalex.org/W2897533804","https://openalex.org/W1606303980","https://openalex.org/W2523317485"],"abstract_inverted_index":{"The":[0],"emerging":[1],"spin":[2],"transfer":[3],"torque":[4],"magnetic":[5],"random":[6],"access":[7],"memory":[8,36],"(STT-MRAM)":[9],"promises":[10],"many":[11],"attractive":[12],"features,":[13],"such":[14,81,129],"as":[15,82],"nonvolatile,":[16],"high":[17],"speed":[18],"and":[19,35,48,60,69,90,117,125,168,185,222,235],"low":[20],"power":[21],"etc,":[22],"which":[23],"enable":[24],"it":[25],"to":[26,56,64,120,172,217],"be":[27,96],"a":[28,106],"promising":[29],"candidate":[30],"for":[31,99],"the":[32,40,45,57,65,70,115,123,141,148,166,174,181,186,192,219,223],"next-generation":[33],"logic":[34],"circuits.":[37],"However":[38],"with":[39,140,191,207],"continuous":[41],"scaling":[42],"technology":[43],"process,":[44],"chip":[46],"yield":[47],"reliability":[49],"of":[50,74,232],"STT-MRAM":[51],"face":[52],"severe":[53],"challenges":[54],"due":[55],"increasing":[58],"permanent":[59,124,131,152,197],"transient":[61,126,136,187],"faults.":[62,127],"Due":[63],"intrinsic":[66],"fault":[67,77,91],"features":[68],"targeted":[71],"application":[72],"requirements":[73],"STT-MRAM,":[75],"traditional":[76],"tolerant":[78],"design":[79],"solutions,":[80],"error":[83],"correction":[84],"code":[85],"(ECC),":[86],"redundancy":[87],"repair":[88,233],"(RR),":[89],"masking":[92],"(FM)":[93],"techniques,":[94],"cannot":[95],"employed":[97],"straightforwardly":[98],"STT-MRAM.":[100],"In":[101,177],"this":[102,178],"paper,":[103],"we":[104,162],"propose":[105,163],"synergistic":[107],"technique":[108],"framework,":[109],"named":[110],"sECC,":[111,194],"that":[112,150],"integrates":[113],"both":[114],"ECC":[116],"FM":[118],"techniques":[119,221],"address":[121],"simultaneously":[122],"With":[128],"approach,":[130],"faults":[132,137,153,160,188],"are":[133,138,154,183,189,205],"masked":[134,184],"while":[135,195],"corrected":[139,190],"same":[142],"codeword.":[143],"Moreover":[144],"taking":[145],"into":[146],"consideration":[147],"fact":[149],"most":[151],"sparse":[155],"[about":[156],"60%-70%":[157],"single":[158],"isolated":[159],"(SIFs)],":[161],"further":[164],"integrating":[165],"RR":[167],"sECC":[169],"(named":[170],"iRRsECC)":[171],"optimize":[173],"system":[175],"performance.":[176],"scenario,":[179],"all":[180],"SIFs":[182],"proposed":[193,220],"other":[196],"faulty":[198,201],"types":[199],"(e.g.,":[200],"rows":[202,209],"or":[203,210],"columns)":[204],"repaired":[206],"redundant":[208],"columns.":[211],"A":[212],"simulation":[213],"tool":[214],"is":[215],"developed":[216],"evaluate":[218],"evaluation":[224],"results":[225],"show":[226],"their":[227],"good":[228],"performance":[229],"in":[230],"terms":[231],"rate":[234],"hardware":[236],"overhead.":[237]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":12},{"year":2015,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}