{"id":"https://openalex.org/W2035038896","doi":"https://doi.org/10.1109/jetcas.2014.2361072","title":"Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits","display_name":"Evaluation of Stability, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits","publication_year":2014,"publication_date":"2014-10-22","ids":{"openalex":"https://openalex.org/W2035038896","doi":"https://doi.org/10.1109/jetcas.2014.2361072","mag":"2035038896"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2014.2361072","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2014.2361072","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016617610","display_name":"Yin-Nien Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Yin-Nien Chen","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084582698","display_name":"Ming-Long Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Long Fan","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083596674","display_name":"Vita Pi\u2010Ho Hu","orcid":"https://orcid.org/0000-0002-6216-214X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Vita Pi-Ho Hu","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025664346","display_name":"Pin Su","orcid":"https://orcid.org/0000-0002-8213-4103"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Pin Su","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","Department of Electronics Engineering"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109996538","display_name":"Ching-Te Chuang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Te Chuang","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Electronics Engineering and the Institute of Electronics, National Chiao Tung University, Hisnchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5016617610"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":2.7649,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.91274595,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"4","issue":"4","first_page":"389","last_page":"399"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8187148571014404},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.7783772945404053},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5926226377487183},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47759461402893066},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.4765787124633789},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47090888023376465},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4551047086715698},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44188234210014343},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.42715656757354736},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41895461082458496},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3628508150577545},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34679165482521057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30270278453826904}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8187148571014404},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7783772945404053},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5926226377487183},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47759461402893066},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.4765787124633789},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47090888023376465},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4551047086715698},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44188234210014343},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42715656757354736},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41895461082458496},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3628508150577545},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34679165482521057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30270278453826904},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2014.2361072","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2014.2361072","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1753784006","https://openalex.org/W1984274507","https://openalex.org/W1991353080","https://openalex.org/W2009624223","https://openalex.org/W2014494940","https://openalex.org/W2017195664","https://openalex.org/W2026617335","https://openalex.org/W2057559162","https://openalex.org/W2057874658","https://openalex.org/W2058679903","https://openalex.org/W2095913060","https://openalex.org/W2099087448","https://openalex.org/W2105175332","https://openalex.org/W2106339466","https://openalex.org/W2106617546","https://openalex.org/W2132688693","https://openalex.org/W2136393784","https://openalex.org/W2137143041","https://openalex.org/W2140910268","https://openalex.org/W2144289736","https://openalex.org/W2148301792","https://openalex.org/W2153830758","https://openalex.org/W2157743350","https://openalex.org/W2165877808","https://openalex.org/W2168542137","https://openalex.org/W3145730315","https://openalex.org/W4253730527","https://openalex.org/W6664829858","https://openalex.org/W6679915245","https://openalex.org/W6680178178","https://openalex.org/W6680425296"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W1976168335","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"propose":[4],"a":[5],"mixed":[6,131],"TFET-MOSFET":[7,132],"8T":[8,66,71],"SRAM":[9,39,45,97,120],"cell":[10,40,57,67,72,98,133,143],"comprising":[11],"MOSFET":[12,35,65,142],"cross-coupled":[13],"inverters,":[14],"dedicated":[15],"TFET":[16,20,33,70],"read":[17],"stack":[18],"and":[19,34,48,52,60,68,147],"write":[21],"access":[22],"transistors":[23],"for":[24,82,118,137,149],"ultra-low":[25,138],"voltage":[26,139,151],"operation.":[27,152],"Exploiting":[28],"both":[29],"the":[30,37,55,63,88,91,95,100,110,129],"merits":[31],"of":[32,54,90,94],"devices,":[36],"proposed":[38,56,96,130],"provides":[41,144],"significant":[42],"improvement":[43],"in":[44],"stability,":[46],"Vmin":[47],"performance.":[49],"The":[50,125],"stability":[51,101,146],"performance":[53,148],"are":[58,102,122],"evaluated":[59],"compared":[61],"with":[62],"conventional":[64],"pure":[69],"using":[73],"mixed-mode":[74],"TCAD":[75],"simulations":[76],"based":[77],"on":[78,99],"published":[79],"design":[80,93],"rules":[81],"22":[83],"nm":[84],"technology":[85],"node.":[86],"Besides,":[87],"impacts":[89],"device":[92],"also":[103],"investigated.":[104],"Various":[105],"write-assist":[106],"techniques":[107],"to":[108,115],"enhance":[109],"write-ability":[111],"across":[112],"VDD=":[113],"0.2":[114],"0.7":[116],"V":[117],"these":[119],"cells":[121],"comparatively":[123],"assessed.":[124],"results":[126],"indicate":[127],"that":[128],"topology":[134],"is":[135],"viable":[136],"operation":[140],"while":[141],"better":[145],"high":[150]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4}],"updated_date":"2026-03-14T08:43:22.919905","created_date":"2025-10-10T00:00:00"}