{"id":"https://openalex.org/W2148071590","doi":"https://doi.org/10.1109/jetcas.2011.2135630","title":"Robust System Design to Overcome CMOS Reliability Challenges","display_name":"Robust System Design to Overcome CMOS Reliability Challenges","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2148071590","doi":"https://doi.org/10.1109/jetcas.2011.2135630","mag":"2148071590"},"language":"en","primary_location":{"id":"doi:10.1109/jetcas.2011.2135630","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2011.2135630","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I4210107838","display_name":"Robust Chip (United States)","ror":"https://ror.org/01rp86637","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107838"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I4210107838"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006493684","display_name":"Kevin Brelsford","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107838","display_name":"Robust Chip (United States)","ror":"https://ror.org/01rp86637","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107838"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin Brelsford","raw_affiliation_strings":["Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","Synopsys, Inc., Marlborough, MA, USA"],"affiliations":[{"raw_affiliation_string":"Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I4210107838"]},{"raw_affiliation_string":"Synopsys, Inc., Marlborough, MA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055211028","display_name":"Young Moon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107838","display_name":"Robust Chip (United States)","ror":"https://ror.org/01rp86637","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107838"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Young Moon Kim","raw_affiliation_strings":["Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I4210107838"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026289974","display_name":"Hsiao-Heng Kelin Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107838","display_name":"Robust Chip (United States)","ror":"https://ror.org/01rp86637","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107838"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsiao-Heng Kelin Lee","raw_affiliation_strings":["Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I4210107838"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101989053","display_name":"Yanjing Li","orcid":"https://orcid.org/0000-0003-0124-0463"},"institutions":[{"id":"https://openalex.org/I4210107838","display_name":"Robust Chip (United States)","ror":"https://ror.org/01rp86637","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107838"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanjing Li","raw_affiliation_strings":["Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Robust Systems Group, Department of Electrical Engineering and Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I4210107838"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5036312663"],"corresponding_institution_ids":["https://openalex.org/I4210107838"],"apc_list":null,"apc_paid":null,"fwci":7.154,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.97379609,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"1","issue":"1","first_page":"30","last_page":"41"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7040101289749146},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6894947290420532},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.5998606085777283},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5618597865104675},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5548916459083557},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5209338068962097},{"id":"https://openalex.org/keywords/systems-design","display_name":"Systems design","score":0.4621599018573761},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.4505040943622589},{"id":"https://openalex.org/keywords/electronic-systems","display_name":"Electronic systems","score":0.41157686710357666},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38234907388687134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26523876190185547},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2303554117679596},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.09941846132278442}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7040101289749146},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6894947290420532},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.5998606085777283},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5618597865104675},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5548916459083557},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5209338068962097},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.4621599018573761},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.4505040943622589},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.41157686710357666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38234907388687134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26523876190185547},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2303554117679596},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.09941846132278442},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jetcas.2011.2135630","is_oa":false,"landing_page_url":"https://doi.org/10.1109/jetcas.2011.2135630","pdf_url":null,"source":{"id":"https://openalex.org/S142323794","display_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","issn_l":"2156-3357","issn":["2156-3357","2156-3365"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal on Emerging and Selected Topics in Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/14","display_name":"Life below water","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":102,"referenced_works":["https://openalex.org/W1527363716","https://openalex.org/W1559719544","https://openalex.org/W1579215414","https://openalex.org/W1911029421","https://openalex.org/W1974635992","https://openalex.org/W1980282924","https://openalex.org/W1981514768","https://openalex.org/W2004749420","https://openalex.org/W2009919741","https://openalex.org/W2016301038","https://openalex.org/W2020584063","https://openalex.org/W2024436253","https://openalex.org/W2029293703","https://openalex.org/W2050431855","https://openalex.org/W2060193918","https://openalex.org/W2066462613","https://openalex.org/W2066698193","https://openalex.org/W2066929795","https://openalex.org/W2077426659","https://openalex.org/W2081714388","https://openalex.org/W2083270183","https://openalex.org/W2083613288","https://openalex.org/W2090692734","https://openalex.org/W2095730858","https://openalex.org/W2095767129","https://openalex.org/W2098012844","https://openalex.org/W2098171066","https://openalex.org/W2098771792","https://openalex.org/W2099569658","https://openalex.org/W2100669545","https://openalex.org/W2100827158","https://openalex.org/W2101406500","https://openalex.org/W2104114347","https://openalex.org/W2104677471","https://openalex.org/W2105619224","https://openalex.org/W2106672998","https://openalex.org/W2107743196","https://openalex.org/W2115465752","https://openalex.org/W2115908547","https://openalex.org/W2115908980","https://openalex.org/W2116059696","https://openalex.org/W2117835845","https://openalex.org/W2121540974","https://openalex.org/W2121618685","https://openalex.org/W2122819799","https://openalex.org/W2123001791","https://openalex.org/W2124438715","https://openalex.org/W2125169487","https://openalex.org/W2126125576","https://openalex.org/W2126302041","https://openalex.org/W2130189691","https://openalex.org/W2133218998","https://openalex.org/W2134225871","https://openalex.org/W2134778828","https://openalex.org/W2135089235","https://openalex.org/W2135335377","https://openalex.org/W2135719553","https://openalex.org/W2138085193","https://openalex.org/W2139777941","https://openalex.org/W2140288260","https://openalex.org/W2141068710","https://openalex.org/W2141565132","https://openalex.org/W2143821614","https://openalex.org/W2145913625","https://openalex.org/W2146410479","https://openalex.org/W2147198689","https://openalex.org/W2149866574","https://openalex.org/W2150117262","https://openalex.org/W2153336129","https://openalex.org/W2153554709","https://openalex.org/W2156667996","https://openalex.org/W2158302200","https://openalex.org/W2160088500","https://openalex.org/W2161033118","https://openalex.org/W2161790194","https://openalex.org/W2162465831","https://openalex.org/W2163137406","https://openalex.org/W2164321145","https://openalex.org/W2164529645","https://openalex.org/W2166448630","https://openalex.org/W2167002145","https://openalex.org/W2169061104","https://openalex.org/W2170333286","https://openalex.org/W2171156763","https://openalex.org/W3141932699","https://openalex.org/W3144162164","https://openalex.org/W3145424647","https://openalex.org/W3145844624","https://openalex.org/W3147784729","https://openalex.org/W3149410719","https://openalex.org/W4234365927","https://openalex.org/W4236432903","https://openalex.org/W4240029073","https://openalex.org/W4244606885","https://openalex.org/W4248229502","https://openalex.org/W4253998042","https://openalex.org/W4255276665","https://openalex.org/W6634495486","https://openalex.org/W6640006728","https://openalex.org/W6654571853","https://openalex.org/W6671100463","https://openalex.org/W6676135933"],"related_works":["https://openalex.org/W975040225","https://openalex.org/W2041615232","https://openalex.org/W2045155990","https://openalex.org/W4313163053","https://openalex.org/W2149032943","https://openalex.org/W2154081718","https://openalex.org/W2167002145","https://openalex.org/W1906576859","https://openalex.org/W1642424871","https://openalex.org/W1609591816"],"abstract_inverted_index":{"Today's":[0],"mainstream":[1],"electronic":[2],"systems":[3,70],"typically":[4],"assume":[5],"that":[6,68,84],"transistors":[7],"and":[8,19,76,97,115,120],"interconnects":[9],"operate":[10],"correctly":[11,72],"over":[12],"their":[13],"useful":[14],"lifetime.":[15],"With":[16],"enormous":[17],"complexity":[18,75],"significantly":[20],"increased":[21],"vulnerability":[22],"to":[23,26,66],"failures":[24,100],"compared":[25],"the":[27,52,58],"past,":[28,53],"future":[29,69],"system":[30,59,62,92,104],"designs":[31],"cannot":[32],"rely":[33],"on":[34],"such":[35],"assumptions.":[36],"For":[37],"coming":[38],"generations":[39],"of":[40,45,99],"silicon":[41],"technologies,":[42],"several":[43],"causes":[44],"hardware":[46,102],"reliability":[47],"failures,":[48],"largely":[49],"benign":[50],"in":[51,90,101],"are":[54],"becoming":[55],"significant":[56],"at":[57],"level.":[60],"Robust":[61],"design":[63,93],"is":[64,131],"essential":[65],"ensure":[67],"perform":[71],"despite":[73],"rising":[74],"increasing":[77],"disturbances.":[78],"This":[79],"paper":[80],"describes":[81],"three":[82],"techniques":[83],"can":[85],"enable":[86],"a":[87],"sea":[88],"change":[89],"robust":[91],"through":[94],"cost-effective":[95],"tolerance":[96],"prediction":[98],"during":[103],"operation:":[105],"1)":[106],"efficient":[107],"soft":[108],"error":[109],"resilience;":[110],"2)":[111],"circuit":[112],"failure":[113],"prediction;":[114],"3)":[116],"effective":[117],"on-line":[118],"self-test":[119],"diagnostics.":[121],"The":[122],"need":[123],"for":[124],"global":[125],"optimization":[126],"across":[127],"multiple":[128],"abstraction":[129],"layers":[130],"also":[132],"demonstrated.":[133]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":10},{"year":2014,"cited_by_count":9},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}